PROTECTION RELAY TEST REPORT

Client: Qenos Olefins Site: Sub CPL

Project Name: 11kV COGEN 1 Feeder Date: 2023-02-22

Order / SAP No.:

Test Object - Device Settings

Substation/Bay:
Substation: CPL Substation address:
Bay: Cubicle 13 Bay address:

Device:
Name/description: MiCOM P541 Current Differential Manufacturer: Schneider Electric
Relay
Device type: Micom P541 Device address:
Serial/model number: 3958191 / P541318B2M0308J
Additional info 1: Drawings:
Additional info 2:
 Test Equipment Details
Type Manufacturer Model Serial No. Calibration Due Date
Secondary Injection Omicron CMC 356 GK713N 2023-03-04

Serviced By Approved Remarks

COMPANY HVP Pty Ltd Mobil
NAME Patrick Smith
DATE 2023-02-22
SIGNATURE

Comments
Protection relay operation verified
All relay indications, alarms and console signals verified
Function trip check done

Acrobat
Document

Hardware Configuration

Test Equipment
Type Serial Number
CMC356 GK713N

Hardware Check
Performed At Result Details
22/02/2023 9:58:08 Passed
AM

Group:Metering Check

Wiring and Metering Check - CT Ratio:

Test Module
Name: OMICRON QuickCMC Version: 4.31
Test Start: 22-Feb-2023 10:23:05 Test End: 22-Feb-2023 10:29:29
User Name: Manager:
Company:

Test Results

Title: Metering Check

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Direct I L1 1.000 A 0.00 ° 50.000 Hz
 I L2 2.000 A -120.00 ° 50.000 Hz
I L3 3.000 A 120.00 ° 50.000 Hz

Generator Settings
I L1 1.000A 0.00° +90°
I L2 2.000A -120.00°
I L3 3.000A 120.00° I L3

I L1
180° 0°
I L2

4.0 A -90°

Binary Inputs
Name Slope Time
CB Trip 1->0 n/a
Overload 1->0 n/a

Comment
Current Injected
IA: 1A (Secondary) = 320A (Primary)
IB: 2A (Secondary) = 640A (Primary)
IC: 3A (Secondary) = 960A (Primary)

CT Ratio: 1600/5

Current Measurements on Relay

Name Value
IA Magnitude 320.1 A
IA Angle local 0 deg
IB Magnitude 638.0 A
IB Angle local -120.8 deg
IC Magnitude 960.2 A
IC Angle local 118.5 deg

Measured Ratio: 1598.61/5

Summary
1 tests passed, 0 tests failed, 0 tests not assessed 100.00% passed
Test passed

Group end:Metering Check

Group:OC and EF Protection

L1 Pickup:

Test Settings

General
No. of ramp states: 1
Total steps per test: 401
Total time per test: 40.100 s
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1 / Magnitude
Ramp States
Ramp Ramp 1
I L1 3.600 A
0.00 °
50.000 Hz
Force abs. Phases No
Sig 1 From 3.600 A
Sig 1 To 5.400 A
Sig 1 Delta 4.500 mA
Sig 1 d/dt 45.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 100.0 ms
Ramp Steps 401
Ramp Time 40.100s
Trigger Bin
Trigger Logic OR
CB Trip 1
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 10:22:18 Test End: 22-Feb-2023 10:22:41
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L1 4.500 A 4.500 A 450.0 mA 450.0 mA 0.00 A + 22.20
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

L2 Pickup:

Test Settings
General
No. of ramp states: 1
Total steps per test: 401
Total time per test: 40.100
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L2 / Magnitude
Ramp States
Ramp Ramp 1
I L2 3.600 A
-120.00 °
50.000 Hz
Force abs. Phases No
Sig 1 From 3.600 A
Sig 1 To 5.400 A
Sig 1 Delta 4.500 mA
Sig 1 d/dt 45.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 100.0 ms
Ramp Steps 401
Ramp Time 40.100s
Trigger Bin
Trigger Logic OR
CB Trip 1
CBF Trip X
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 10:30:36 Test End: 22-Feb-2023 10:30:58
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L2 4.500 A 4.496 A 450.0 mA 450.0 mA -4.500 mA + 34.60
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

L3 Pickup:

Test Settings

General
No. of ramp states: 1
Total steps per test: 401
Total time per test: 40.100
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L3 / Magnitude
Ramp States
Ramp Ramp 1
I L3 3.600 A
120.00 °
50.000 Hz
Force abs. Phases No
Sig 1 From 3.600 A
Sig 1 To 5.400 A
Sig 1 Delta 4.500 mA
Sig 1 d/dt 45.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 100.0 ms
Ramp Steps 401
Ramp Time 40.100s
Trigger Bin
Trigger Logic OR
CB Trip 1
CBF Trip X
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 10:31:17 Test End: 22-Feb-2023 10:31:39
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L3 4.500 A 4.496 A 450.0 mA 450.0 mA -4.500 mA + 96.20
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Overcurrent Time Test:

Test Object - Overcurrent Parameters
General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No

Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes 51 Phase OC IEC Normal Inverse 0.90 Iref 0.48 0.95 Non Directional
No 51N Earth Fault IEC Very Inverse 0.28 Iref 0.63 0.95 Non Directional

Comment
Trip Indicators verified
 Phase Indicators verified

Test Module
Name: OMICRON Overcurrent Version: 4.31
Test Start: 22-Feb-2023 10:56:51 Test End: 22-Feb-2023 10:59:35
User Name: Manager:
Company:

Test Settings:

Fault Model:
Time reference: Fault inception
Load current: 0.00 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: Yes
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-L2 51 Phase OC 1.500 6.750 A n/a 8.167 s 6.884 s 9.754 s
L1-L2 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.212 s 5.383 s
L1-L2 51 Phase OC 4.000 18.00 A n/a 2.365 s 2.166 s 2.576 s
L1-L2 51 Phase OC 5.000 22.50 A n/a 2.033 s 1.871 s 2.202 s
L1-L2 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.683 s 1.968 s
L2-L3 51 Phase OC 1.500 6.750 A n/a 8.167 s 6.884 s 9.754 s
L2-L3 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.212 s 5.383 s
L2-L3 51 Phase OC 4.000 18.00 A n/a 2.365 s 2.166 s 2.576 s
L2-L3 51 Phase OC 5.000 22.50 A n/a 2.033 s 1.871 s 2.202 s
L2-L3 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.683 s 1.968 s
L3-L1 51 Phase OC 1.500 6.750 A n/a 8.167 s 6.884 s 9.754 s
L3-L1 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.212 s 5.383 s
L3-L1 51 Phase OC 4.000 18.00 A n/a 2.365 s 2.166 s 2.576 s
L3-L1 51 Phase OC 5.000 22.50 A n/a 2.033 s 1.871 s 2.202 s
L3-L1 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.683 s 1.968 s
L1-L2-L3 51 Phase OC 1.500 6.750 A n/a 8.167 s 6.884 s 9.754 s
L1-L2-L3 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.212 s 5.383 s
L1-L2-L3 51 Phase OC 5.000 22.50 A n/a 2.033 s 1.871 s 2.202 s
L1-L2-L3 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.683 s 1.968 s

Binary Outputs:
Name State
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0

Binary Inputs:
Trigger Logic: Or
Name Trigger State
CB Trip 1
CBF Trip X
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-L2 51 Phase OC 1.500 6.750 A n/a 8.167 s 8.136 s -0.3863 % No Passed
L1-L2 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.764 s 0.004500 No Passed
%
L1-L2 51 Phase OC 4.000 18.00 A n/a 2.365 s 2.379 s 0.5925 % No Passed
L1-L2 51 Phase OC 5.000 22.50 A n/a 2.033 s 2.049 s 0.7985 % No Passed
L1-L2 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.833 s 0.5505 % No Passed
L2-L3 51 Phase OC 1.500 6.750 A n/a 8.167 s 8.123 s -0.5443 % No Passed
L2-L3 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.761 s -0.05220 % No Passed
L2-L3 51 Phase OC 4.000 18.00 A n/a 2.365 s 2.383 s 0.7278 % No Passed
L2-L3 51 Phase OC 5.000 22.50 A n/a 2.033 s 2.046 s 0.6510 % No Passed
L2-L3 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.838 s 0.8577 % No Passed
L3-L1 51 Phase OC 1.500 6.750 A n/a 8.167 s 8.131 s -0.4427 % No Passed
L3-L1 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.759 s -0.09210 % No Passed
L3-L1 51 Phase OC 4.000 18.00 A n/a 2.365 s 2.372 s 0.2712 % No Passed
L3-L1 51 Phase OC 5.000 22.50 A n/a 2.033 s 2.046 s 0.6608 % No Passed
L3-L1 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.837 s 0.7864 % No Passed
L1-L2-L3 51 Phase OC 1.500 6.750 A n/a 8.167 s 8.129 s -0.4708 % No Passed
L1-L2-L3 51 Phase OC 2.000 9.000 A n/a 4.764 s 4.763 s -0.01440 % No Passed
L1-L2-L3 51 Phase OC 5.000 22.50 A n/a 2.033 s 2.042 s 0.4640 % No Passed
L1-L2-L3 51 Phase OC 6.000 27.00 A n/a 1.823 s 1.829 s 0.3255 % No Passed

Test State:
19 out of 19 points tested.
19 points passed.
0 points failed.

Test passed

EF Pickup:

Test Settings

General
No. of ramp states: 1
Total steps per test: 401
Total time per test: 40.100
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1 / Magnitude

Ramp States
Ramp Ramp 1
I L1 1.120 A
0.00 °
50.000 Hz
Force abs. Phases No
Sig 1 From 1.120 A
Sig 1 To 1.680 A
Sig 1 Delta 1.400 mA
Sig 1 d/dt 14.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 100.0 ms
Ramp Steps 401
Ramp Time 40.100s
Trigger Bin
Trigger Logic OR
CB Trip 1
CBF Trip X
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 11:34:45 Test End: 22-Feb-2023 11:35:06
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L1 1.400 A 1.380 A 140.0 mA 140.0 mA -19.60 mA + 61.90
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Earth Fault Time Test:

Test Object - Overcurrent Parameters

General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No

Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes 51 Phase OC IEC Normal Inverse 0.90 Iref 0.48 0.95 Non Directional
Yes 51N Earth Fault IEC Very Inverse 0.28 Iref 0.63 0.95 Non Directional

Comment
Trip Indicators verified

Earth Fault Indicators verified

Test Module
Name: OMICRON Overcurrent Version: 4.31
Test Start: 22-Feb-2023 11:36:55 Test End: 22-Feb-2023 11:39:15
User Name: Manager:
Company:

Test Settings:
Fault Model:
Time reference: Fault inception
Load current: 0.00 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: Yes
Thermal reset method: Manual
Thermal reset message: Please reset the Thermal Memory of the device under
test before continuing.

Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-E 51N Earth Fault 1.500 2.100 A n/a 16.88 s 11.81 s 27.56 s
L2-E 51N Earth Fault 1.500 2.100 A n/a 16.88 s 11.81 s 27.56 s
L3-E 51N Earth Fault 1.500 2.100 A n/a 16.88 s 11.81 s 27.56 s
L1-E 51N Earth Fault 2.000 2.800 A n/a 8.438 s 6.801 s 10.79 s
L2-E 51N Earth Fault 2.000 2.800 A n/a 8.438 s 6.801 s 10.79 s
L3-E 51N Earth Fault 2.000 2.800 A n/a 8.438 s 6.801 s 10.79 s
L1-E 51N Earth Fault 4.000 5.600 A n/a 2.813 s 2.497 s 3.153 s
L2-E 51N Earth Fault 4.000 5.600 A n/a 2.813 s 2.497 s 3.153 s
L3-E 51N Earth Fault 4.000 5.600 A n/a 2.813 s 2.497 s 3.153 s
L1-E 51N Earth Fault 6.000 8.400 A n/a 1.688 s 1.508 s 1.879 s
L2-E 51N Earth Fault 6.000 8.400 A n/a 1.688 s 1.508 s 1.879 s
L3-E 51N Earth Fault 6.000 8.400 A n/a 1.688 s 1.508 s 1.879 s

Binary Outputs:
Name State
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
CB Trip 1
CBF Trip X

Shot Test Results:

Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-E 51N Earth Fault 1.500 2.100 A n/a 16.88 s 16.73 s -0.8474 % No Passed
L2-E 51N Earth Fault 1.500 2.100 A n/a 16.88 s 16.80 s -0.4350 % No Passed
L3-E 51N Earth Fault 1.500 2.100 A n/a 16.88 s 16.90 s 0.1736 % No Passed
L1-E 51N Earth Fault 2.000 2.800 A n/a 8.438 s 8.428 s -0.1185 % No Passed
L2-E 51N Earth Fault 2.000 2.800 A n/a 8.438 s 8.466 s 0.3378 % No Passed
L3-E 51N Earth Fault 2.000 2.800 A n/a 8.438 s 8.461 s 0.2750 % No Passed
L1-E 51N Earth Fault 4.000 5.600 A n/a 2.813 s 2.826 s 0.4729 % No Passed
L2-E 51N Earth Fault 4.000 5.600 A n/a 2.813 s 2.827 s 0.5298 % No Passed
L3-E 51N Earth Fault 4.000 5.600 A n/a 2.813 s 2.826 s 0.4836 % No Passed
L1-E 51N Earth Fault 6.000 8.400 A n/a 1.688 s 1.694 s 0.3970 % No Passed
L2-E 51N Earth Fault 6.000 8.400 A n/a 1.688 s 1.696 s 0.5215 % No Passed
L3-E 51N Earth Fault 6.000 8.400 A n/a 1.688 s 1.707 s 1.162 % No Passed
Test State:
12 out of 12 points tested.
12 points passed.
0 points failed.

Test passed

Group end:OC and EF Protection

Group:Phase Diff Protection

Test Instruction
Instruction Text:
Under Easergy Studio, write test 2 to relay

This enables diff prot logic

In the relay, under configuration, enable diff prot and save

(see first test instruction for access)

User Input:

Test State: Continue

Red Phase Diff Pickup Test:

Test Settings

General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 20.200
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1 / Magnitude

Ramp States
Ramp Ramp 1
I L1 1.000 A
0.00 °
50.000 Hz
I L2 0.00 A
-120.00 °
50.000 Hz
I L3 0.00 A
120.00 °
50.000 Hz
Force abs. Phases Yes
Sig 1 From 1.000 A
Sig 1 To 1.500 A
Sig 1 Delta 5.000 mA
Sig 1 d/dt 25.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 200.0 ms
Ramp Steps 101
Ramp Time 20.200s
Trigger Bin
Trigger Logic OR
CB Trip 1
CBF Trip X
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 11:43:40 Test End: 22-Feb-2023 11:43:49
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L1 1.200 A 1.185 A 100.0 mA 100.0 mA -15.00 mA + 136.7
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

White Phase Diff Pickup Test:

Test Settings
General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 20.200
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L2 / Magnitude

Ramp States
Ramp Ramp 1
I L1 0.00 A
0.00 °
50.000 Hz
I L2 1.000 A
-120.00 °
50.000 Hz
I L3 0.00 A
120.00 °
50.000 Hz
Force abs. Phases Yes
Sig 1 From 1.000 A
Sig 1 To 1.500 A
Sig 1 Delta 5.000 mA
Sig 1 d/dt 25.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 200.0 ms
Ramp Steps 101
Ramp Time 20.200s
Trigger Bin
Trigger Logic OR
CB Trip 1
CBF Trip X
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 11:43:55 Test End: 22-Feb-2023 11:44:05
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L2 1.200 A 1.185 A 100.0 mA 100.0 mA -15.00 mA + 81.80
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Blue Phase Diff Pickup Test:

Test Settings

General
No. of ramp states: 1
Total steps per test: 101
Total time per test: 20.200
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L3 / Magnitude

Ramp States
Ramp Ramp 1
I L1 0.00 A
0.00 °
50.000 Hz
I L2 0.00 A
-120.00 °
50.000 Hz
I L3 1.000 A
120.00 °
50.000 Hz
Force abs. Phases Yes
Sig 1 From 1.000 A
Sig 1 To 1.500 A
Sig 1 Delta 5.000 mA
Sig 1 d/dt 25.00 mA/s
Bin. Out 1 0
Bin. Out 2 0
Bin. Out 3 0
Bin. Out 4 0
dt per Step 200.0 ms
Ramp Steps 101
Ramp Time 20.200s
Trigger Bin
Trigger Logic OR
CB Trip 1
CBF Trip X
Step back No
Delay Time 0.00 s

Test Module
Name: OMICRON Ramping Version: 4.31
Test Start: 22-Feb-2023 11:43:18 Test End: 22-Feb-2023 11:43:27
User Name: Manager:
Company:

Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 CB Trip I L3 1.200 A 1.180 A 100.0 mA 100.0 mA -20.00 mA + 150.8
0->1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Red Phase Diff Time Test:

Test Settings
State R Ph Diff
Trip
I L1 1.500 A
0.00 °
50.000 Hz
I L2 0.00 A
-120.00 °
50.000 Hz
I L3 0.00 A
120.00 °
50.000 Hz

Test Module
Name: OMICRON State Sequencer Version: 4.31
Test Start: 22-Feb-2023 11:44:10 Test End: 22-Feb-2023 11:44:12
User Name: Manager:
Company:
Test Results

Time Assessment
Ignore
Name Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Time Test R Ph Diff CB Trip 50.00 ms 10.00 ms 10.00 ms 45.70 ms -4.300 ms +
Trip 0>1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

White Phase Diff Time Test:

Test Settings
State W Ph Diff
Trip
I L1 0.00 A
0.00 °
50.000 Hz
I L2 1.500 A
-120.00 °
50.000 Hz
I L3 0.00 A
120.00 °
50.000 Hz

Test Module
Name: OMICRON State Sequencer Version: 4.31
Test Start: 22-Feb-2023 11:44:18 Test End: 22-Feb-2023 11:44:19
User Name: Manager:
Company:

Test Results

Time Assessment
Ignore
Name Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Time Test W Ph Diff CB Trip 50.00 ms 10.00 ms 10.00 ms 43.10 ms -6.900 ms +
Trip 0>1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Blue Phase Diff Time Test:

Test Settings
State B Ph Diff
Trip
I L1 0.00 A
0.00 °
50.000 Hz
I L2 0.00 A
-120.00 °
50.000 Hz
I L3 1.500 A
120.00 °
50.000 Hz

Test Module
Name: OMICRON State Sequencer Version: 4.31
Test Start: 22-Feb-2023 11:44:25 Test End: 22-Feb-2023 11:44:26
User Name: Manager:
Company:

Test Results

Time Assessment
Ignore
Name Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Time Test B Ph Diff CB Trip 50.00 ms 10.00 ms 10.00 ms 50.70 ms 700.0 μs +
Trip 0>1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Group end:Phase Diff Protection

Group:CBF Protection

CBF Time Test:

Test Settings
State CBF Trip
I L1 5.000 A
0.00 °
50.000 Hz
I L2 0.00 A
-120.00 °
50.000 Hz
I L3 0.00 A
120.00 °
50.000 Hz

Test Module
Name: OMICRON State Sequencer Version: 4.31
Test Start: 22-Feb-2023 11:46:33 Test End: 22-Feb-2023 11:46:35
User Name: Manager:
Company:

Test Results
Time Assessment
Ignore
Name Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
CBF Trip CBF Trip CB Trip CBF Trip 200.0 ms 10.00 ms 10.00 ms 205.4 ms 5.400 ms +
Time 0>1 0>1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed

Group end:CBF Protection

Group:Trip Chesks
EF Trip

Trip Check:

Test Settings
State W Ph Diff
Trip
I L1 1.500 A
0.00 °
50.000 Hz
I L2 1.500 A
-120.00 °
50.000 Hz
I L3 1.500 A
120.00 °
50.000 Hz

Test Module
Name: OMICRON State Sequencer Version: 4.31
Test Start: 22-Feb-2023 14:35:59 Test End:
User Name: Manager:
Company:

Test Results

Time Assessment
Ignore
Name Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
Time Test W Ph Diff CB Trip 50.00 ms 10.00 ms 10.00 ms x
Trip 0>1
Assess: + .. Passed x .. Failed o .. Not assessed

Test State:
Test passed (manually assessed)

Group end:Trip Chesks