Warren 1952
Warren 1952
Patterns
B. E. Warren and B. L. Averbach
Activation Energy of Recovery in ColdWorked Tungsten Derived from Measurement of XRay Line
Broadening
J. Appl. Phys. 35, 3419 (1964); 10.1063/1.1713235
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JOURNAL OF APPLIED PHYSICS VOLUME 23, NUMBER 4 APRIL, 1952
,° 1 ~~9~i
1
Letters to the Editor 4
0. 1
.8L---~----~----~--~----~.
o 20 40 60 80 100
The Separation of Cold-Work Distortion and
Particle Size Broadening in X-Ray Patterns* FIG. 2. Plot of An P vs L for single crystal of Cu -2 percent Si rolled to
B. E. WARREN Al'oD B. L. AVER BACH 50 percent reduction. The slope gives an average particle dimension
Massachusetts Institute of Technology, Cambridge, Massachusetts r.=1000A.
(Received January 28, 1952)
OR a cubic crystal it is always possible to choose orthogonal independent of l. For small I, and small values of n where Z" is
F axes so as to make any reflection have the indices (001), It
has been shown,! that for either distortion broadening or particle
also small, (cos2 ...lZ,,) can be approximated by an exponential.
A nD(l) = (cos2 ...lZn)AV->exp[ - 2rl2(Z,,2)Avl
size broadening, the shape of the diffraction peak can be repre-
Writing (2) in logarithmic form
sented by a Fourier series.
+00 (3)
P2e=K ~n An(l) cos2 ...nh 3 , (1) For several orders of a particular set of planes, a plot of InAn(l) vs [2
gives a curve which is a straight line for the small values of l. The
where 113= 2a, sinOjA intercept on the axis of ordinates gives InAnP, and the slope gives
-2 ...2(Zn2)Av from which the mean square strain can be computed.
for distortion A .D(l) = (cos2 ...IZ,,)Av,
This method of separating the two effects is completely general in
1 00
that it does not involve any assumption about the shape of the
for particle size AnP=-N ~ (i-Inllni.
i-I·IH peaks. For orders of the general plane (hkl) of a cubic crystal, it is
convenient to express AnD(l) as exp[ -2rl02(6.£2)/a2], where
If both types of broadening are present, the measured coefficien t
l02=h'+k 2 +[2, L=na. and 6.L=a zZ".
is the product of the coefficients for each effecU
Figure 1 is a plot oflnA .(lo) vs 102 for the first five orders of (111),
(2) measured on a single crystal of Cu-2 percent Si which has been
rolled on the 110 plane in the 112 direction to 50 percent reduction.
If measurements are made for several orders of (OOl), the two The fact that the curves do not extrapolate to InA'I(lo)=O.O,
effects can be separated, since the distortion coefficient A nD(I) indicates that a small part of the broadening is due to particle size.
depends upon the order, \"hile the particle size coefficient A n P is The values of A "P obtained from the intercepts are plotted against
L= na3 in Fig. 2. The negative slope of this line is the reciprocal of
the average particle dimension perpendicular to the reflecting
60 80 100 planes. The value obtained, £= 1000A, indicates that in the
deforming of the crystal by rolling, the major part of the broaden-
ing is due to distortion, and the broadening by particle size is
small but not small enough to neglect.
*
Research sponsored by the AEC under Contracts AT(30-I)-S58 and
AT(30-1) 1002.
lB. E. Warren and B. L. Averbach, J. App!. Phys. 21, 595 (1950).
, This fact has been pointed out independently by A. J. C. Wilson and
50 E. W. Hart.
•I
E IP = a;;
aF,. 82)Fi,
, 1J.1owH.= ( -'Yi'+ az' Another situation might arise when the loops were lying on the
floor of the ocean. Both media can then be highly dissipative.
The author appreciates the permission granted by Dr. A. A.
. a'F. Brant of Newmont Exploration Limited to publish this note.
1J.1owH p=--, and HIP=Ep=E.=O. (3)
dPdZ
* Research Engineer.
The subscript i here takes the value 1 or 2 to pertain to the upper A. Sommerfeld, Ann. Physik 81, 113,5 (1926),
1
• S. A. Schelkunoff, Electromagnetic Waves (D. Van Nostrand Company,
or lower region, respectively. Inc .. New York, 1943), p. 128.
The integral involved in the expressions for E\ and p, will be • R. M. Foster, Bell System Tech. J. 10, No.3, 408 (1931).
evaluated for the case when z=O. The common vector potential is
now designated by P,
p=lOAiJ.Low.r:Vo(XP)d,,". (4)
2". 0 Ul+U, A Study of Oxide-Coated Cathode by X-Ray
On multiplying the numerator and denominator by (Ul-U,) the Diffraction Method
expression for F becomes
F= iJ.LowlOA
2".
[.r: Xutfo(,,"p)dX2
0 ('Yl'-'Y2 )
.r: xu,Jo(XP)dX].
0 ('Yl'-'Y.')
(5)
Elso VAMAKA
The Electrical Communication Laboratory, Tokyo, Japan
(Received October 29, 1951)
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