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PRODUCT DESCRIPTION

FADOS7F1 Fault Detector & Oscilloscope 7 Functions in 1 have been especially

developed to determine and troubleshooting faults at all type electronic circuit boards by Prot
Ar-Ge Industrial Project Design R&D Ltd. Co. FADOS7F1 is basically computer-based VI tester
Voltage-Current (Signature Analysis) equipment. It connects to PC via USB port and works 5V
by taking power from USB port. Signature Analysis is a power-off test method that is used to
troubleshoot circuit boards. FADOS7F1 works by applying a current-limited sine wave through a
serial resistor point of touched on circuit and Voltage-Current (Signature) graph is displayed on
the computer screen. In addition to this feature, computer software by analyzing signature
graph to displays Equivalent Circuit Diagram and Values of Electronic Components and these
features used for convenience to user in giving information for finding faulty easily.

By using Feature of Dual Channel VI test; signature of known good circuit boards and faulty or
suspect boards comparable with touch of same points at the same time and using this method,
faulty points out of tolerance can be quickly detected. All signature graphs are composed at 2,5
mV sensitivity and by taking 720 different measurement of signature. For this reason,
FADOS7F1 is very sensitive.

By the help of Memory Feature; it is possible to save the features (values and signature) of
good circuit board to memory for reference and then, to compare easily with faulty or suspects
circuit boards sensitively. By using feature of recording reference values, signatures to memory
and comparing data from memory, it can test easily circuit boards. It is possible to record data
with circuit board’s picture. As a result; while comparing data from memory, it is possible to see
data on the picture which saved before.

In order to lower the loss of time during test procedure, it sounds different at compatible and
incompatible points. By this way, users make the comparison quickly without any need to look
at screen or circuit boards steadily and the sound feature can save you time when compared
circuit boards. Users can compare the circuit boards with 3 different steps at the same time.
(Selected Current-Voltage-Frequency steps)

In addition to the basic features, FADOS7F1 VI Tester can also be used Dual-Channel
Oscilloscope, Square-Wave Generator and Analogue Voltage Output. By using Square-Wave
Signal Output, signal is applied to circuit boards; then, it is possible to see the other channel
and output signals at oscilloscope screen.
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Technicians, engineers and hobbyists have found VI graph to be an effective and efficient
method for troubleshooting printed circuit boards. The signature comparison method is easy to
use and allows for immediate feedback that will assist you in locating faulty component. As you
gain some experience with VI graph you will realize that FADOS7F1 is an indispensable
troubleshooting tool. Usage is very easy and users will find the faults just by looking at graphs
without comparison.

When test Printed Circuit Assembly (PCA) with FADOS7F1, do not apply power to PCA. PCA and
the devices must be made high-voltage capacitor discharges. There is no risk of further damage
to the PCA while testing and troubleshooting.

FADOS7F1 is easy to carry since it’s small. It can be carried in a laptop briefcase. Including
many more features, it is like a Swiss knife of users dealing with electronics.

Usage Areas

ECU Automotive electronic circuit boards, servo-step motor drivers, circuit boards of medical
devices, military electronic circuit boards, computer and monitor circuit boards, television-audio-
radio circuit boards, circuit boards of textile machines, mobile phone electronic circuit boards
etc. (all type electronic circuit boards.)

Electronic Components Test: Resistors, Capacitors, Inductors, Diodes (General purpose,

Zener, High Voltage etc.) Transistors (NPN, PNP, JFET, MOSFET etc.), SCRs, TRIACs,
Optocouplers, Integrated Circuits (Digital, Analog) etc.

Unique Features

Equivalent circuit diagram and measuring values of all components features are unique in the
World. As an example; if resistor connected parallel to capacitor, it shows circuit diagram and
value of them at the same time.

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SECURITY

1- FADOS7F1 is produced by using lead-free solder and designed in accordance CE

regulations; users must use the following usage rules.

2- Chassis must be isolated and grounded. Connect the chassis ground connection point of
the probe is the same as your computer, careful to avoid the potential difference.

3- Feature of oscilloscope, if probe key is set to 1X, it measures ±5 Voltage, probe

key is set to 10X, it measures ±50 Voltage. Do not use above these limits of
voltage.

4- It tests electronic circuit boards without giving to energy. Before test, electronic circuit
board and the devices must be made high-voltage capacitor discharges.

5- The users of this equipment must have knowledge and experience to repair of electronic
circuit boards. Thus, during using FADOS7F1, do not make this mistakes such as touch
chassis to high-voltage, non-isolated ground, test high-voltage capacitor discharges.
Without enough knowledge and experience in this subject, keep away high voltages such
as mains voltage which can damage the system and themselves.

6- Giving high-voltage from probes, series resistors which contained in the device damaged
and makes the circuit an open circuit. In this case, the computer port which is connected
device via USB port damaged but observed in other parts of the computer is not
damaged.

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FADOS7F1 PERFORMANS AND MEASURUMENT TOLERANCE

1- FADOS7F1 is designed multi-function as Voltage- Current (VI) Signature Analysis Tester

and Oscilloscope. The main of the feature device is VI Tester; in addition to this feature,
computer software by analyzing voltage-current graph to displays equivalent circuit
diagram and values of electronic components in specific tolerances. The equivalent
circuit diagram and values are for informational purposes. As the device is not suitable
for direct measurement.

2- Equivalent circuit diagram is drawing by software using mathematical functions and

formulas; but rarely has the possibility of making mistake. This probability is more
increased with applied externally electromagnetic fields of generated interference. The
EMC Testing; 3V/M and the range of 80MHz-1GHz is approximately capacitor %1,
resistor %3, diodes %1. Some fast diodes make oscillation in some frequencies, so that
can be perceived as ‘active point’ by the device. VI Graph the rate of change: <1%.

3- Components Value Measurement Tolerance:

 Resistor: %2
 Capacitor: %3
 Diode Transmit Voltage: 0,1V
 If Resistor and Capacitor are connected Parallel: Resistor:%4, Capacitor: %5
 If Resistor and Diodes are connected Serial: %4
 If Diode and Resistor are connected Parallel: %3
 If 2 Diodes and a Resistor are connected Parallel: %10

Note 1: These tolerances valid, if resistor curve makes angle between 10 and 80 degree to
horizontal axis. If resistor curve close to horizontal line, select ‘Low Current’ Step and; if resistor
curve close to vertical line, select ‘Middle or High Current’ Step for reducing mistake rate.

Note 2: These tolerance valid, if capacitor ellipse of width/length ratio is greater than 1/4. This
ratio is less than 1/4 and ellipse’s width - length is thin and long. In such a case; change
current step or/and frequency step for selecting step appropriate to components.

4- Oscilloscope voltage measurement tolerance: %0,5.

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PRODUCT OVERVIEW and CONTENT

 1 FADOS7F1 Product
 1 Software CD and User Manual (Pdf)
 2 Oscilloscope Probes
 1 Com Probe (Crocodile)
 1 USB Cable
 1 Handbag

Picture 1: FADOS7F1 Sets

FADOS7F1 TECHNICAL SPECIFICATIONS

A- FAULT DETECTION SPECIFICATIONS:

Test Voltages : ±1V, ±2V, ±6, ±12V, ±18V
Test Resistance : Current Level: Low 47 KΩ, Medium 2,6 KΩ, High 385 Ω
Test Frequencies : Very Low Frequency :2 Hz
Low2 Frequency : 3.4 Hz
Low1 Frequency : 10.3 Hz
Test Frequency : 27.3 Hz
High Frequency : 780 Hz
Number of Channels : 2 (Channel 1 and Channel 2)
Scan Mode : Manual or Automatic. Automatic selection steps of
voltage, current, frequency.
Other Feature : 1: Equivalent circuit diagram.
2: Resistor, capacitors, diodes etc measurement.
3: Recording data and comparing with recorded data.
4: 3 graphs at different adjustments can be screened
simultaneously.

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B- PC OSCILLOSCOPE FEATURES:
Sampling Rate : 400 K/S
Input Voltage : Probe 1X: ±9 V Probe 10X: ±90 V
Channel / ADC : 2 Channel / 12 Bit
Sensitivity : 2.5 mV
Image Rate : 0.02 mS/div….100 mS/div
Instant Memory : 64 Kbyte
C- DIGITAL AND ANALOG OUTPUT:
Output : Channel 2
Output Voltage : -9V….+9V (Adjustable)
Frequency (Digital) : From 0.2KHz to 25KHz

Connections : Probes can be connected each socket. Yellow ring

probe is always Channel 1; Blue ring probe is always Channel 2. Crocodile probe is
always COM. USB cable for using communications between PC and FADOS7F1.
Dimensions : 105mm L x 54mm W x 24mm H
Weight : 450 gram with all accessories
Table 1: FADOS7F1 Technical Features

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 CONTENTS
Page
PRODUCT DESCRIPTION ....................................................................... …….2
USAGE AREAS ...................................................................................................... 3
ELECTRONIC COMPONENTS TEST ............................................................................... 3
UNIQUE FEATURES ................................................................................................ 3
SECURITY .......................................................................................................4
FADOS7F1 PERFORMANS AND MEASURUMENT TOLERANCE ........................5
PRODUCT OVERVIEW AND CONTENT ...........................................................6
FADOS7F1 TECHNICAL SPECIFICATIONS .....................................................6
FADOS7F1 FAULT DETECTOR & OSCILLOSCOPE ...........................................9
INSTALLATION - DRIVER INSTALLATION ......................................................................11
CONNECT PROBES ................................................................................................11
GENERAL USAGE INFORMATION .................................................................12
VI TEST – PROGRAM FEATURES OF FAULT DETECTON PART ......................13
PASSIVE COMPONENTS R, L, C (RESISTOR, INDUCTOR, CAPACITOR)
V/I GRAPH ...................................................................................................15
RESISTOR VI GRAPH .............................................................................................15
CAPACITOR AND INDUCTOR VI GRAPH ......................................................................16
CAPACITOR QUALITY TEST AND RC CIRCUIT ..............................................................17
SEMI CUNDOCTORS V/I GRAPH ..................................................................18
DIODE, ZENER DIODE VI GRAPH..............................................................................18
TRANSISTOR – TRIAC – THYRISTOR – FET – IGBT VI GRAPH ..........................................19
INTEGRATED CIRCUITS (ICs - SMD INTEGRATES) V/I GRAPH ..................21
ELECTRONIC CIRCUIT BOARD REGISTRATION MEMORY AND COMPARISION
FROM MEMORY ............................................................................................22
RECORDING DATA WITH IMAGE ...............................................................................23
COMPARISION TESTING COMPONENTS OF CIRCUIT BOARDS...................24
3G – 3 DIFFERENT GRAPHS DISPLAY..........................................................29
OSCILLOSCOPE – PROGRAM FEATURES ......................................................30
RECOMMENDATIONS ...................................................................................31
WARRANTY AND CONDITIONS....................................................................32

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FADOS7F1 FAULT DETECTOR & OSCILLOSCOPE

Picture 2: FADOS7F1

FADOS7F1 includes 7 important functions:

1. Double – Channel Fault Detection (Analog Signature Analysis - VI Graph)

Comparing good and faulty or suspect circuit boards without giving power to boards.

2. Equivalent Circuit Diagram

Composing R, C, or Diode Circuit Diagram according to the point touched.

3. Measuring Value of Resistors, Capacitors, and Diodes

Feature of measuring the value of touched point.

4. Fault Detection by Comparison from Memory

By recording data of good circuit boards to memory, comparing faulty or suspects

boards from memory.

5. Double – Channel Digital Oscilloscope

As occasion may require, device can be used as oscilloscope.

6. Square Wave Signal Output

Ch.1 is used as oscilloscope and Ch.2 is used as signal generator.

7. Analogue Voltage Output

Ch.1 is used as oscilloscope and Ch.2 gives analog voltage output.

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 Picture 3: FADOS7F1 Fault Detector – VI Tester Screen

Picture 4: FADOS7F1 Oscilloscope – Analog Output Screen

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INSTALLATION

1- Connect FADOS7F1 to PC via USB. Install drivers in CD.

2- Click FADOS7F1 SETUP.exe and install program.

3- Run FADOS7F1.exe

DRIVER INSTALLATION

1- Connect FADOS7F1 to PC via USB. Windows XP 'New Hardware Found' with warning
direct you to install the driver. Insert the CD into the CD rom and install the driver.

2- Windows Vista and Windows 7 open Device Manager.

 On the desktop right-click on my computer and click Properties of open the

Control Panel and double-click the System icon.

 In the System Properties window click the Hardware tab.

 In the Hardware tab click the Device Manager Button.

Or

 Click Start

 Click Settings

 Click Control Panel

 In the Control Panel double-click the Systems icon.

 In the System Properties window click the Hardware tab.

 In the Hardware tab click the Device Manager Button.

3- Find “Prot Ar-Ge FADOS7F1 Fault Detector” inside Universal Serial Bus Controllers and
click right then, select “update software driver”.

4- Select (Search for the best driver location) and click browse, find FADOS7F1 Driver’s
folder.
5- Click OK and install driver.

Note: Each product has different calibration settings, so that please do not lost program CD.

CONNECT PROBES: Probes can be connected each socket. Yellow ring probe is always
Channel 1; Blue ring probe is always Channel 2. Crocodile probe is always COM. USB cable for
using communications between PC and FADOS7F1.

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GENERAL USAGE INFORMATION

1. Product Oscilloscope – Analog Output screen pop-up and if you click Fault Detector – VI
Tester button, input screen Fault Detect.

2. Open circuit’s graph is in the middle and horizontal position at Test-Fault Detect screen.
Current – Voltage Graph (VI) makes angle according to the value of resistance, capacitor
is like circle and ellipse, short circuit is vertical position.

3. Middle current step if resistance values are high and VI graph is horizontal axis, you can
see more clearly high resistance value at low current step. If VI graph is more closer to
vertical axis, it means resistance value is low and values can be read more clearly at high
current step.

4. Usually, test capacitor at high frequency mode. If capacitor value is low, test at low
current step and if capacitor value is high, test high current step. If capacitor value is like
slim ellipse at high current step and vertical axis, you can see value of capacitor by
reducing frequency of the frequency step.

5. Good (solid) integrated pin (without pin of supply and ground) is usually like double
reverse diode. Resistor or capacitor effects even as graph, observed double reverse
diode. Some integrated output can be observed one diode. But, if you see pin of
integrated like resistor, it means integrated is faulty.

6. Capacity test especially determines quality of electrolytic capacitor. If this curve is

horizontal, capacitor is quality. Low quality capacitor curve according to horizontal makes
an angle. If angle is more, capacitor is faulty. Due to current this test may be misleading,
while testing a capacitor at circuit. Therefore considering this situation to test. For
capacitor quality, the best measurement in this product is done by looking at the
Capacity Resistance curve.

7. At fault detection important thing is graph display and interpret. First, try to find fault
with compare. In a short time you will learn difference between good and faulty or
suspect circuit board. The equivalent circuit and values are auxiliary elements. If you
always look equivalent circuit and values, it can take more times to detect fault. This
product interprets VI graph. The computer program composes equivalent circuit diagram
and shows values of components by interpreting graph.

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VI TEST – PROGRAM FEATURES OF FAULT DETECTON PART

While testing with V/I graph, do not apply power to board. Generally, probe chassis is
connected to board chassis and a signal is applied to touch point by the device. V/I graph of
this signal is seen at the screen. Signals scans from negative voltage to positive voltage and
when open circuit, it appears horizontally in the middle of the screen.

All control buttons are placed to the left of the panel used in fault detection.

Picture 5: Fault Detector – VI Tester Screen

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Channel: Used to select channel.
Auto: When Auto is selected, according to feature of touched point, the most
appropriate values of voltage, frequency, and current steps are determined.

Voltage Step: FADOS 7F1 has various voltage steps ±1V, ±2V, ±5V, ±10V.
simultaneously.

Frequency Step: FADOS 7F1 has various frequency steps Very Low Freq., Low 2
Freq., Low 1 Freq., Test Freq., and High Freq.

Current Step: FADOS 7F1 has various current steps Low Current, Middle Current,
High Current.

Comparison: If this option is selected, good (solid) and faulty or suspect circuit
boards are compared by touching probes to the same points of both circuit board.
Capacitor Test: Capacitor test determines quality of electrolytic capacitor.
TTT FET IGBT: If this option is selected, determines TTT, FET, IGBT etc. Type of
semi – conductors.

Recording: Opens file form and records; or opens recorded file.

Grf: For 3 different steps, 3 different graphs are generated and fast passage is
possible at any time.
1G, 2G, 3G: 1, 2 or 3 graphs at different adjustments can be screened.
simultaneously.
Recording: Opens file form and records; or opens recorded file.
Circuit: Indicates name or code of point to be tested. Folder name in the system.
Point: Name or code of test point. Recorded as file name in the system.
: Goes to previous test point.
: Goes to next test point.
Test Point: Serial number of test point.
Auto Test: If tolerance of test point is lower than or equal to tolerance mentioned
below, it goes to next test point automatically.

Reference: Channel1 indicates good (solid) circuit;

Channel2 indicates faulty circuit or circuit to be tested.
When saved at memory, Reference=Channel1 is saved.
Values of circuits composed of resistance, capacitor, and
diode are displayed.

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PASSIVE COMPONENTS R, L, C (RESISTOR, INDUCTOR, CAPACITOR) V/I GRAPH

Resistor VI Graph

Resistor signatures appear with a specific angle to horizon; and resistor symbol and value are
seen at the bottom of the graph. While resistors at high values appear with angle close to
horizontal axis, resistors at low values are seen at screen with an angle close to vertical axis.
Picture 6, 7 and 8 display resistors typical signals and values for the equivalent circuit.

High resistor generates a line close to horizontal line. So that, for testing high resistance selects
low current step. Low resistor generates a line close to vertical line. So that, for testing low
resistance selects high current step.

Picture 6: Resistors VI Graphs, The Equivalent Circuit Diagram and Value Measurement
(Channel 1 Red - Channel 2 Blue)

Picture 7: Resistors VI Graphs Picture 8: Short Circuit (Channel 1) and

Resistor VI Graph (Channel 2)
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Capacitor and Inductor VI Graph

Due to their energy storage characteristics, reactive components produce a phase shift between
voltage and current flow. This is displayed as a circular or elliptical signature. Capacitor symbol
and value are seen at the bottom. Picture 9 displays capacitor typical signals and values for the
equivalent circuit. High capacitor generates vertical ellipse. For testing high capacitor select high
current and low frequency. Low capacitor generates horizontal ellipse. For testing low capacitor
(lower than 10 nF) select low current and high frequency.

The Picture 11 below shows the signature of a ferrite transformer primary winding with the test
voltage range set Low and test frequency set High. This demonstrates the effect of a significant
value of resistance causing the inductive ellipse to be tilted.

Picture 9: Capacitor VI Graph, The Equivalent Circuit diagram and Value Measurement

Picture 10: Capacitor VI Graph Picture 11: Inductor VI Graph

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Capacitor Quality Test and RC Circuit

When “Capacitor Test” is selected, an additional curve displaying the quality of capacitor
appears. If this curve is at horizontal axis or close to it, quality is high; and quality is low as
much as the angle degree is high. High quality capacitor generates a horizontal line.

Picture 12: High Quality Capacitor Picture 13: Low Quality Capacitor

Picture 14: Capacitor and RC Circuit

If capacitor and resistor are parallel, elliptical shape makes an angle to horizon.
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SEMI CONDUCTORS VI GRAPH

Diode – Zener Diode VI Graph

Diodes start to transmit current after high transmission voltage. For this reason, diodes are
seen horizontally at one part of the graph, and are seen vertically at the other part. If cathode
of diode is connected to chassis, a curve appears at horizontal axis at negative voltage and
before transmits voltage; and the curve appears at vertical axis at transmit voltage. If anode of
diode is at chassis, a curve appears to down at negative voltage.

A Zener diode exhibits the same signature as a conventional diode for voltages below the Zener
voltage. When the reverse bias exceeds the Zener voltage, a low resistance signature is
displayed.

If diode and resistor are serial on circuit, after transmission, graph makes an angle to horizon.

Picture 15: Diode and Serial Diode - Resistor VI Graph, The Equivalent Circuit Diagram

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 Picture 16: Zener Diode VI Graph, The Equivalent Circuit Diagram

Transistor – Triac – Thyristor – FET - IGBT VI Graph

Active components such as transistor, triac and FET can be tested by transmitting them while
both of two channels are used. A transistor contains two semiconductor junctions connected.
Transistors also must have emitter chassis. First, touch collector with a probe (Channel 1 probe
or Channel 2 probe). Collector must be at non-transmission position. Then, touch other probe
(Channel 1 probe or Channel 2 probe) base in order to provide transistor to start transmitting.
Transistor characteristics should be seen as at the screen.

Triac, Thyristor, Fet and IGBT can be tested in the same way.

If Thyristor,Triac, Transistor, FET, IGBT selection (T.T.T FET IGBT button) is applied, type of
component can be determined.
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Picture 17: Transistor VI Graph

Picture 18: FET VI Graph

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INTEGRATED CIRCUITS (ICs – SMD INTEGRATES)

Integrated circuits can be tested all the pins with the help of probes. Circuits made up of many
components encapsulated within a single package. The component count within an IC may vary
from as few as half a dozen devices on a "chip" to many thousands of components in, for
instance, a modern microprocessor. Because of the need to package so many components into
an extremely small space, components within an IC are often microscopically small.

As a result, modern ICs contain components and connections which are susceptible to damage
from electrical stress and static discharge at levels far lower than those which would damage
normal components.

For this reason, many ICs incorporate protection diodes on their signal input and output pins.

When testing integrates signals display similar to the double-inverse diode, zener diode and
diodes. It can be capacitors or resistors are connected to these. If pin of integrated has double
reverse diode, it means this pin can be solid.
We can use the same technique to locate faults in ICs which are large and very complex, such
as memory chips and microprocessors. The pin arrangement of such complex ICs means that it
is especially appropriate to use comparison techniques to test these devices.

As we look at these devices we will find that, despite the large number of pins, there are only a
few distinct graph patterns on a digital IC.

Note: You will frequently notice differences in the signatures between similar ICs from different
vendors or which have been manufactured using different technologies.

Compare the graph on a suspect pin with graphs from other pins on the same device before
regarding the device as faulty.

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 Picture 19: Good (Solid) Integrated Pins – Compare 2 Integrated Pins

ELECTRONIC CIRCUIT BOARDS REGISTRATION MEMORY AND COMPARISON FROM

MEMORY

It is possible to save points touched on a circuit board in an order, and then comparing them
with other circuit boards.

First, open a new file by writing name or code of circuit board that will be saved. Touch the
point which is in the electronic circuit board, will be saved by channel 1; write the name of
point, which will be saved, on the new point label. If New point label is empty, software saves
data with automatic number (N001, N002 etc) to file. Because, all files need a serial number
(N001) for saving an order. In a folder data limit is 999 points (N001 to N999). Then, press
save button. If Add number selections, software adds number automatically data. If Increment
selections, software increments number automatically to data.

In order to test from saved file, press “record memorized test” button, select data to be tested
and open first saved point. Saved data is seen as a red graph at first channel. Touch the point
to be tested with second channel. If it is same as the saved data or in tolerance values, it is
written “Harmonious” at screen. If it is out of tolerance values, it is written “Disharmony”,

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percentage value is seen and wrong voice is heard.

When automatic test is activated, if a test point is harmonious, then it goes to next point
automatically. By this way, circuit boards can be tested faster with the help voices.

Note: Electronic circuit test points, we can only register with Channel 1. Using recording menu
to open as a reference test points by recorded Channel 1, using Channel 2 comparison data
with faulty or solid circuit.

New Folder: Opens a folder by using the name

given to a new circuit.
Open Image: Open and upload the circuit of the
image.
New Point: If New Points is empty, software saves
data with automatic number like“N001, N002” Add to
file.
Add Number: Add numbers automatically test point.
Inc.: Increments number automatically.
Save: Saves the value of test point with mentioned
name to the determined folder. If name is not given,
saves with serial number.
Change: Changes the marked test point data and
save a new test point data. For example: Select
N009_ULN2003_10.dat, touch point on the card, and
then click change button.
Open: Opens data clicked on the list to Channel1.
Delete: Deletes the marked test point data from
Recording Data with Image computer.

First, open a new file by writing name or code of circuit board that will be saved. For uploading
image; click open image and select the circuit of the image and again click open for uploading
circuit board’s image. Software changes automatically name of circuit board’s Picture. For
example, Picture name is “picture4.jpg” and program changes the name automatically
“image.jpg” and adds folder. If you copy a picture in folder, you have to write name of Picture
“image.jpg”. Software checks only image.jpg or not in folder. If picture name is not
“image.jpg”, this function does not work. After uploaded image, you see circuit board’s image
on the right. On the image “+”, “–” buttons are for zoom. Click point on the image which you
want to save than touch the point which is in the circuit board, will be saved by channel 1.
Then, press save button. When you compare data from memory; you can see data which you
saved before on the picture.

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 Picture 20: Recording Data With Image

COMPARISION TESTING COMPONENTS OF ELECTRONIC CIRCUIT BOARDS

When a component is tested in a circuit, generates a complicated signal other due to parallelism
other components in the circuit. FADOS7F1 makes the comparison by removing the component
values of the equivalent circuit and measuring signals.

Connect good circuit board to Channel 1, connect fault or suspect circuit board to Channel 2
and touch same points at the same time. If it is same as, it is written “Harmonious” at screen.
If it is out of tolerance values, it is written “Disharmony”, percentage value is seen and wrong
voice is heard.

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 Picture 21: Comparison Test

Comparing this system is very sensitive and is considered compatible with the values within the
given tolerance.

Picture 22: Comparison Test

A significant difference, different resistance value of the test circuit from reference circuit.

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 Picture 23: Comparison Test

Integrated circuit is usually double reverse diode. It can be capacitors or resistors are
connected to these. If pin of integrated has double reverse diode, it means this pin can be good
(solid).

Picture 24: Comparison Test – Integrated Pin Faults

Using FADOS7F1, faults can be easily found. Pin of integrated is damaged reverse diode by
deterioration; diodes can be resistance, open circuit or short circuit. It is integrated fault. One
diode damaged and now it is a resistor.
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Picture 25: Comparison Test – Integrated Pin Faults

Picture 26: Comparison Test – Parallel Resistor Faults

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Picture 27: Parallel Capacitor Faults

Picture 28: Comparison Test

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3G - 3 DIFFERENT GRAPHS DISPLAY

If you click 1G button, you see 2G and 3G. It means 1, 2 or 3 graphs at different adjustments
(voltage, frequency and current) can be screened simultaneously.

Picture 29: 3G Graph Display

Picture 30: 3G Graph Display

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OSCILLOSCOPE – PROGRAM FEATURES

Picture 31: Oscilloscope Screen

Osc. Active/Passive: Activates oscilloscope or shows latest screen display.
Channel: Selects channel. Channel1, Channel2 and both channels are selected
in an order.
Manual/Auto: When automatic, catches the latest signal if the signal is off.
Save: Saves oscilloscope data or opens recorded data.

Channel: Channel is selected for synchronous.

Up/Down: Starts synchronous at increasing or decreasing signal.

Probe X1: Adjusts voltage value according to X1 or X10 coefficient probe.

Top or Low: Highest or lowest value on screen.
Point: Displays voltage value of cursor at vertical line while at memory
position.
Frequency: Displays frequency if perceive incoming signal.
Active/Passive: If active, then gives square wave or analogue output from
Channel2.
Signal / DAC: Square wave or analogue output is selected.

Frequency: Output frequency.

Voltage: Voltage of square wave or analogue output.

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 Voltage Adjustment: (Voltage/Division) Adjusts screen sensitivity of voltage. Data
received from device is 12 Bit, 2.5mV sensitive.

Zero Adjustment: Moves position of ‘0V’ point up or down. Numbers indicate voltage
values. If numbers are double-clicked, ‘0V’ reference of that channel starts from clicked
point.

Displayed Part: If ‘Osc. Passive’, then adjusts starting point of displayed part of whole
memory.

Time Adjustment: Time/Division.

RECOMMENDATIONS

1. Fault detection probes must be set to 1X at fault detection.

2. Test good (solid) circuit board channel 1, faulty or suspect circuit board channel 2. First
touch the channel 1 probe, and then touch channel 2 probes.

3. Fault detection is important to have same graphics at channel 1 and channel 2. The
circuit diagram and values are elements of help. The circuit diagram values are not for
measuring purposes, it is only for comparison purposes.

4. For fault detection, usually use middle current level. For high value resistor or low value
capacitor, select low current step.

5. When recording in the memory, click save button after touching good (solid) circuit
board’s pins with channel 1. When the data open from memory, using Channel 2
comparison data with faulty, suspect or good (solid) circuit board.

6. Each product has different calibration settings which is include in CD, so that please do
not lost program CD.

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WARRANTY AND CONDITIONS

1. The warranty period is 1 year from the date of product delivery.

2. The repair period is seven (7) business days.

3. Used the product contrary to the matters contained in FADOS user manual are not
covered by the warranty. Giving high-voltage from probes, series resistors which
contained in the device damaged and makes the circuit an open circuit. It is a user error
and this situation is not covered under warranty.

4. The device is in a solid box. Normally use, the card is not physically damaged. Breaking,
wetting etc. are not covered by warranty.

5. Depending of intensive use probes, copper which is in the cable may be damaged.
Therefore, failure of the probe is not covered by warranty.

6. If device is faulty, send us or an authorized repair service or send Prot Ar-Ge Company.

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