AONS66406
AONS66406
DFN5x6 D
Top View
Top View Bottom View
1 8
2 7
3 6
4 5
G
PIN1
S
PIN1
Thermal Characteristics
Parameter Symbol Typ Max Units
Maximum Junction-to-Ambient A t ≤ 10s 20 25 °C/W
RθJA
Maximum Junction-to-Ambient A D Steady-State 45 55 °C/W
Maximum Junction-to-Case Steady-State RθJC 2.8 3.4 °C/W
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The Power
dissipation PDSM is based on R θJA t≤ 10s and the maximum allowed junction temperature of 150°C. The value in any given application depends on
the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Single pulse width limited by junction temperature TJ(MAX)=150°C.
D. The RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
G. The maximum current rating is package limited.
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
APPLICATIONS OR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT
ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE
PRODUCT DESIGN,FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
100 100
10V 4.5V VDS=5V
80 80
6V 4V
60 60
ID (A)
ID (A)
40 40 125°C
3.5V
20 20 25°C
VGS=3V
0 0
0 1 2 3 4 5 1 2 3 4 5 6
15 1.8
Normalized On-Resistance
1.6
VGS=10V
10
RDS(ON) (mΩ)
ID=20A
VGS=4.5V 1.4
1.2
5 VGS=4.5V
ID=20A
VGS=10V 1
0 0.8
0 5 10 15 20 25 30 0 25 50 75 100 125 150 175
18 1.0E+01
ID=20A
15 1.0E+00
12 1.0E-01 125°C
RDS(ON) (mΩ)
IS (A)
9 125°C 1.0E-02
6 1.0E-03 25°C
3 25°C 1.0E-04
0 1.0E-05
2 4 6 8 10 0.0 0.2 0.4 0.6 0.8 1.0
10 2000
VDS=20V
ID=20A
8 Ciss
1500
Capacitance (pF)
VGS (Volts)
6
1000
4
500
2 Coss
Crss
0 0
0 5 10 15 20 25 0 10 20 30 40
1000.0 500
TJ(Max)=150°C
TC=25°C
100.0 10µs 400
RDS(ON) 10µs
limited
Power (W)
300
ID (Amps)
10.0
100µs
1ms
1.0 10ms 200
TJ(Max)=150°C DC
0.1 TC=25°C 100
0
0.0
0.0001 0.001 0.01 0.1 1 10 100
0.01 0.1 1 10 100
VDS (Volts) Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-to-
VGS> or equal to 4.5V Case (Note F)
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
10
D=Ton/T In descending order
ZθJC Normalized Transient
RθJC=3.4°C/W
1
Ton
T
0.01
1E-05 0.0001 0.001 0.01 0.1 1 10 100
50 40
40
30
Power Dissipation (W)
10
10
0 0
0 25 50 75 100 125 150 0 25 50 75 100 125 150
1 10000
TA=25°C
1000
Eoss(uJ)
Power (W)
0.5 100
10
0 1
0 10 20 30 40 1E-05 0.001 0.1 10 1000
10
ZθJA Normalized Transient
TJ,PK=TA+PDM.ZθJA.RθJA
1 RθJA=55°C/W
0.1
PDM
0.01 Single Pulse
Ton
T
0.001
0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)
Figure
GateA: Charge
Gate Charge Test Circuit
Test Circuit & Waveforms
& Waveform
Vgs
Qg
10V
+
VDC
+ Vds Qgs Qgd
- VDC
DUT -
Vgs
Ig
Charge
Figure B:Resistive
ResistiveSwitching
Switching Test
Test Circuit
Circuit&&Waveforms
Waveforms
RL
Vds
Vds
90%
DUT
+ Vdd
Vgs VDC
Rg - 10%
ton toff
Figure C: UnclampedInductive
Unclamped InductiveSwitching
Switching (UIS) Test
TestCircuit
Circuit&&Waveforms
Waveforms
L 2
Vds EAR= 1/2 LIAR BVDSS
Id Vds
Vgs + Vdd I AR
Vgs VDC
Rg - Id
DUT
Vgs Vgs
Figure
DiodeD: Recovery
Diode Recovery Test Circuit
Test Circuit & Waveforms
& Waveforms
Vds + Q rr = - Idt
DUT
Vgs
t rr
Vds - L Isd IF
Isd dI/dt
+ Vdd I RM
Vgs VDC
Vdd
Ig
- Vds