BS EN 61180:2016

BSI Standards Publication

High-voltage test techniques

for low-voltage equipment —
Definitions, test and procedure
requirements, test equipment
BS EN 61180:2016 BRITISH STANDARD

National foreword
This British Standard is the UK implementation of EN 61180:2016. It is
identical to IEC 61180:2016. It supersedes BS EN 61180-1:1995 and BS EN
61180-2:1995, which are withdrawn.
The UK participation in its preparation was entrusted to Technical
Committee PEL/42, Testing techniques for high voltages and currents.
A list of organizations represented on this committee can be obtained on
request to its secretary.
This publication does not purport to include all the necessary provisions of
a contract. Users are responsible for its correct application.
© The British Standards Institution 2016.
Published by BSI Standards Limited 2016
ISBN 978 0 580 79356 1
ICS 19.080
Compliance with a British Standard cannot confer immunity from
legal obligations.
This British Standard was published under the authority of the
Standards Policy and Strategy Committee on 30 November 2016.

Amendments/corrigenda issued since publication

Date Text affected

 BS EN 61180:2016

EUROPEAN STANDARD EN 61180

NORME EUROPÉENNE
EUROPÄISCHE NORM October 2016

ICS 19.080 Supersedes EN 61180-1:1994, EN 61180-2:1994

English Version

High-voltage test techniques for low-voltage equipment -

Definitions, test and procedure requirements, test equipment
(IEC 61180:2016)

Techniques des essais à haute tension pour matériel à Hochspannungs-Prüftechnik für Niederspannungsgeräte -
basse tension - Définitions, exigences et modalités relatives Begriffe, Prüfung und Prüfbedingungen, Prüfgeräte
aux essais, matériel d'essai (IEC 61180:2016)
(IEC 61180:2016)

This European Standard was approved by CENELEC on 2016-07-29. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization

Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 61180:2016 E

BS EN 61180:2016
EN 61180:2016

European foreword

The text of document 42/341/FDIS, future edition 1 of IEC 61180, prepared by IEC/TC 42 "High-
voltage and high-current test techniques" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 61180:2016.

The following dates are fixed:

• latest date by which the document has to be implemented at (dop) 2017-04-29

national level by publication of an identical national
standard or by endorsement

• latest date by which the national standards conflicting with (dow) 2019-07-29
the document have to be withdrawn

This document supersedes EN 61180-1:1994 and EN 61180-2:1994.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

Endorsement notice

The text of the International Standard IEC 61180:2016 was approved by CENELEC as a European
Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards indicated:

IEC 61000-4-5:2014 NOTE Harmonized as EN 61000-4-5:2014 (not modified).

IEC 61010-1 NOTE Harmonized as EN 61010-1.

IEC 61010-2-030:2010 NOTE Harmonized as EN 61010-2-030:2010 (not modified).

2
 BS EN 61180:2016
EN 61180:2016

Annex ZA
(normative)

Normative references to international publications

with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.

Publication Year Title EN/HD Year

IEC 60060-1 2010 High-voltage test techniques - EN 60060-1 2010
Part 1: General definitions and test
requirements
IEC 60060-2 2010 High-voltage test techniques - EN 60060-2 2011
Part 2: Measuring systems
IEC 60068-1 2013 Environmental testing - EN 60068-1 2014
Part 1: General and guidance
IEC 60335 series Household and similar electrical EN 60335 series
appliances - Safety
IEC 60664-1 2007 Insulation coordination for equipment EN 60664-1 2007
within low-voltage systems -
Part 1: Principles, requirements and
tests
IEC 61083-1 2001 Instruments and software used for EN 61083-1 2001
measurement in high-voltage impulse
tests -
Part 1: Requirements for instruments
IEC 61083-2 2013 Instruments and software used for EN 61083-2 2013
measurement in high-voltage and high-
current tests -
Part 2: Requirements for software for
tests with impulse voltages and currents
ISO/IEC Guide 98-3 2008 Uncertainty of measurement - - -
Part 3: Guide to the expression of
uncertainty in measurement
(GUM:1995)

3
 BS EN 61180:2016
–2– IEC 61180:2016 © IEC 2016

CONTENTS

FOREWORD ......................................................................................................................... 5
1 Scope ............................................................................................................................ 7
2 Normative references..................................................................................................... 7
3 Terms and definitions .................................................................................................... 8
3.1 General terms ....................................................................................................... 8
3.2 Definitions related to disruptive discharge and test voltages ................................... 8
3.3 Characteristics related to the test equipment ......................................................... 9
3.4 Characteristics related to direct voltage tests ......................................................... 9
3.5 Characteristics related to alternating voltage tests ............................................... 10
3.6 Characteristics related to impulse tests (see Figure 1) ......................................... 11
3.7 Definitions relating to tolerance and uncertainty ................................................... 12
4 General requirements .................................................................................................. 13
4.1 General ............................................................................................................... 13
4.2 Atmospheric conditions for test procedures and verification of test equipment ...... 14
4.3 Procedures for qualification and use of measuring systems .................................. 14
4.3.1 General principles ........................................................................................ 14
4.3.2 Schedule of performance tests ..................................................................... 15
4.3.3 Requirements for the record of performance ................................................. 15
4.3.4 Uncertainty .................................................................................................. 15
4.4 Tests and test requirements for an approved measuring system and its
components ........................................................................................................ 16
4.4.1 Calibration – Determination of the scale factor .............................................. 16
4.4.2 Influence of load .......................................................................................... 18
4.4.3 Dynamic behaviour ...................................................................................... 18
4.4.4 Short-term stability ....................................................................................... 19
4.4.5 Long-term stability ....................................................................................... 19
4.4.6 Ambient temperature effect .......................................................................... 20
4.4.7 Uncertainty calculation of the scale factor ..................................................... 20
4.4.8 Uncertainty calculation of time parameter measurement (impulse
voltages only) .............................................................................................. 22
5 Tests with direct voltage .............................................................................................. 25
5.1 General ............................................................................................................... 25
5.2 Test voltage ........................................................................................................ 25
5.2.1 Requirements for the test voltage ................................................................. 25
5.2.2 Generation of the test voltage ...................................................................... 25
5.2.3 Measurement of the test voltage ................................................................... 25
5.3 Test procedures .................................................................................................. 26
5.3.1 Withstand voltage tests ................................................................................ 26
6 Tests with alternating voltage ....................................................................................... 27
6.1 Test voltage ........................................................................................................ 27
6.1.1 Requirements for the test voltage ................................................................. 27
6.1.2 Generation of the test voltage ...................................................................... 27
6.1.3 Measurement of the test voltage ................................................................... 28
6.2 Test procedures .................................................................................................. 30
6.2.1 Withstand voltage tests ................................................................................ 30
7 Tests with impulse voltage ........................................................................................... 30
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 –3–

7.1 Test voltage ........................................................................................................ 30

7.1.1 General ....................................................................................................... 30
7.1.2 Requirements for the test voltage ................................................................. 31
7.1.3 Generation of the test voltage ...................................................................... 31
7.1.4 Measurement of the test voltage and determination of impulse shape ............ 32
7.2 Test procedures .................................................................................................. 32
7.2.1 Verification of impulse voltage waveshape .................................................... 32
7.2.2 Impulse voltage tests ................................................................................... 32
7.3 Measurement of the test voltage .......................................................................... 32
7.3.1 Requirements for an approved measuring system ......................................... 32
7.3.2 Uncertainty contributions .............................................................................. 33
7.3.3 Dynamic behaviour ...................................................................................... 33
7.3.4 Requirements for measuring instrument ........................................................ 33
8 Reference measurement systems ................................................................................ 33
8.1 Requirements for reference measuring systems ................................................... 33
8.1.1 Direct voltage............................................................................................... 33
8.1.2 Alternating voltage ....................................................................................... 33
8.1.3 Impulse voltages .......................................................................................... 33
8.2 Calibration of a reference measuring system ........................................................ 33
8.2.1 General ....................................................................................................... 33
8.2.2 Reference method: comparative measurement ............................................. 34
8.3 Interval between successive calibrations of reference measuring systems ............ 34
8.4 Use of reference measuring systems ................................................................... 34
Annex A (informative) Uncertainty of measurement ............................................................. 35
A.1 General ............................................................................................................... 35
A.2 Terms and definitions in addition to 3.7 ................................................................ 35
A.3 Model function .................................................................................................... 36
A.4 Type A evaluation of standard uncertainty ........................................................... 36
A.5 Type B evaluation of standard uncertainty ........................................................... 37
A.6 Combined standard uncertainty ........................................................................... 38
A.7 Expanded uncertainty .......................................................................................... 39
A.8 Effective degrees of freedom ............................................................................... 40
A.9 Uncertainty budget .............................................................................................. 40
A.10 Statement of the measurement result .................................................................. 41
Annex B (informative) Example for the calculation of measuring uncertainties in high-
voltage measurements ........................................................................................................ 43
Annex C (informative) Atmospheric correction .................................................................... 47
C.1 Standard reference atmosphere ........................................................................... 47
C.2 Atmospheric correction factor .............................................................................. 47
C.2.1 General ....................................................................................................... 47
C.2.2 Humidity correction factor k 2 ......................................................................... 47
C.2.3 Air density correction factor k 1 ...................................................................... 48
Bibliography ....................................................................................................................... 49

Figure 1 – Full impulse voltage time parameters .................................................................. 11

Figure 2 – Calibration by comparison over the full voltage range .......................................... 17
Figure 3 – Uncertainty contributions of the calibration (example with a minimum of 5
voltage levels) .................................................................................................................... 18
 BS EN 61180:2016
–4– IEC 61180:2016 © IEC 2016

Figure 4 – Shaded area for acceptable normalised amplitude-frequency responses of

measuring systems intended for single fundamental frequencies f nom (to be tested in
the range (1….7) f nom) ....................................................................................................... 29
Figure 5 – Shaded area for acceptable normalised amplitude-frequency responses of
measuring systems intended for a range of fundamental frequencies f nom1 to f nom2 (to
be tested in the range f nom1 to 7 f nom2 ) .............................................................................. 29
Figure 6 – 1,2/50 µs standard impulse voltage ..................................................................... 31
Figure A.1 – Normal probability distribution p(x) ................................................................... 42
Figure A.2 – Rectangular probability distribution p(x) ........................................................... 42

Table 1 – Tests required for an approved direct voltage measuring system .......................... 26
Table 2 – Minimum currents of the test circuit ...................................................................... 27
Table 3 – Tests required for an approved alternating voltage measuring system ................... 30
Table 4 – Tests required for an approved impulse voltage measuring system ....................... 33
Table A.1 – Coverage factor k for effective degrees of freedom ν eff (p = 95,45 %) ................ 40
Table A.2 – Schematic of an uncertainty budget .................................................................. 41
Table B.1 – Result of the comparison measurement up to 500 V at a single voltage level ..... 44
Table B.2 – Summary of results for h = 5 voltage levels (V Xmax = 500 V) ............................. 45
Table B.3 – Uncertainty budget of the assigned scale factor F X ........................................... 46
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 –5–

INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________

HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT –

Definitions, test and procedure requirements, test equipment

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61180 has been prepared by IEC technical committee 42: High-
voltage and high-current test techniques.

This 1 st edition of IEC 61180 cancels and replaces the 1 st edition of IEC 61180-1, issued in
1992, and the 1 st edition of IEC 61180-2, issued in 1994.

The text of this standard is based on the following documents:

FDIS Report on voting

42/341/FDIS 42/342/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
 BS EN 61180:2016
–6– IEC 61180:2016 © IEC 2016

The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be

• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 –7–

HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT –

Definitions, test and procedure requirements, test equipment

1 Scope

This International Standard is applicable to:

– dielectric tests with direct voltage;

– dielectric tests with alternating voltage;
– dielectric tests with impulse voltage;
– test equipment used for dielectric tests on low-voltage equipment.

This standard is applicable only to tests on equipment having a rated voltage of not more than
1 kV a.c. or 1,5 kV d.c.

This standard is applicable to type and routine tests for objects which are subjected to high
voltage tests as specified by the technical committee.

The test equipment comprises a voltage generator and a measuring system. This standard
covers test equipment in which the measuring system is protected against external
interference and coupling by appropriate screening, for example a continuous conducting
shield. Therefore, simple comparison tests are sufficient to ensure valid results.

This standard is not intended to be used for electromagnetic compatibility tests on electric or
electronic equipment

NOTE Tests with the combination of impulse voltages and currents are covered by IEC 61000-4-5.

This standard provides the relevant technical committees as far as possible with:

– defined terms of both general and specific applicability;

– general requirements regarding test objects and test procedures;
– methods for generation and measurement of test voltages;
– test procedures;
– methods for the evaluation of test results and to indicate criteria for acceptance;
– requirements concerning approved measuring devices and checking methods;
– measurement uncertainty.

Alternative test procedures may be required and these should be specified by the relevant
technical committees.

Care should be taken if the test object has voltage limiting devices, as they may influence the
results of the test. The relevant technical committees should provide guidance for testing
objects equipped with voltage limiting devices.

2 Normative references

The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
 BS EN 61180:2016
–8– IEC 61180:2016 © IEC 2016

undated references, the latest edition of the referenced document (including any
amendments) applies.

IEC 60060-1:2010, High-voltage test techniques – Part 1: General definitions and test
requirements

IEC 60060-2:2010, High-voltage test techniques – Part 2: Measuring systems

IEC 60068-1:2013, Environmental testing – Part 1: General and guidance

IEC 60335(all parts): Household and similar electrical appliances – Safety

IEC 60664-1:2007, Insulation co-ordination for equipment within low-voltage systems – Part 1:
Principles, requirements and tests

IEC 61083-1:2001, Instruments and software used for measurement in high-voltage impulse
test – Part 1: Requirements for instruments

IEC 61083-2:2013, Instruments and software used for measurement in high-voltage and high-
current tests – Part 2: Requirements for software for tests with impulse voltages and currents

ISO/IEC Guide 98-3:2008, Uncertainty of measurement – Part 3: Guide to the expression of

uncertainty in measurements (GUM)

3 Terms and definitions

For the purposes of this document, the following terms and definitions apply.

3.1 General terms

3.1.1
clearance
distance between two conductive parts along a string stretched across the shortest path
between these conductive parts

[SOURCE: IEC 60050-441:1984, 441-17-31]

3.1.2
creepage distance
shortest distance along the surface of a solid insulating material between two conductive
parts

[SOURCE: IEC 60050-151: 2001, 151-15-50]

3.2 Definitions related to disruptive discharge and test voltages

3.2.1
disruptive discharge
failure of insulation under electric stress, in which the discharge completely bridges the
insulation under test, reducing the voltage between electrodes to practically zero

3.2.2
withstand voltage
specified voltage value which characterizes the insulation of the object with regard to a
withstand test
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 –9–

Note 1 to entry: Unless otherwise specified, withstand voltages are referred to standard reference atmospheric
conditions (see 4.2).

3.3 Characteristics related to the test equipment

3.3.1
calibration
set of operations that establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement

Note 1 to entry: The determination of the scale factor is included in the calibration.

[SOURCE: IEC 60050-311:2001, 311-01-09, modified: note modified]

3.3.2
type test
conformity test made on one or more items representative of the production

Note 1 to entry: For a measuring system, this is a test performed on a component or on a complete measuring
system of the same design to characterize it under operating conditions.

[SOURCE: IEC 60050-151: 2001, 151-16-16, modified:note added]

3.3.3
routine test
conformity test made on each individual item during or after manufacture

Note 1 to entry: This is a test performed on each component or on each complete measuring system to
characterize it under operating conditions.

[SOURCE: IEC 60050-151: 2001, 151-16-17, modified:note added]

3.3.4
performance test
test performed on a complete measuring system to characterize it under operating conditions

3.3.5
test equipment
complete set of devices needed to generate and measure the test voltage or current applied
to a test object

3.3.6
reference measuring system
measuring system with its calibration traceable to relevant national and/or international
standards, and having sufficient accuracy and stability for use in the approval of other
systems by making simultaneous comparative measurements with specific types of waveform
and ranges of voltage

3.3.7
assigned scale factor
scale factor of a measuring system determined at the most recent performance test

Note 1 to entry: A measuring system may have more than one assigned scale factor; for example, it may have
several ranges, each with a different scale factor.

3.4 Characteristics related to direct voltage tests

3.4.1
value of the test voltage
arithmetic mean value
 BS EN 61180:2016
– 10 – IEC 61180:2016 © IEC 2016

3.4.2
ripple
periodic deviation from the arithmetic mean value of the test voltage

3.4.3
ripple amplitude
half the difference between the maximum and minimum values

Note 1 to entry: In cases where the ripple shape is nearly sinusoidal, true r.m.s. values multiplied by √ 2 are
acceptable for determination of the ripple amplitude.

3.4.4
ripple factor
ratio of the ripple amplitude to the value of test voltage

3.5 Characteristics related to alternating voltage tests

3.5.1
peak value
average of the magnitudes of the positive and negative maximum values

3.5.2
r.m.s. value
square root of the mean value of the square of the voltage values during a complete cycle

3.5.3
true r.m.s. value
value obtained from

T
1
∫i
2
I rms = (t ) dt
T
0

where
0 is the time instant (t = 0) of an a.c. periodic wave, convenient for the beginning of
integration;
T is the time taken over an integral number of cycles;
i(t) is the instantaneous value of the current.
Note 1 to entry: The true r.m.s. value can in general be calculated from a digitized record of any periodic
waveform, provided a sufficient number of samples have been taken.

Note 2 to entry: In cases with varying frequency, no strict formula for true r.m.s. value can be given.

3.5.4
total harmonic distortion
THD
the ratio of the rms value of the harmonic content of an alternating quantity to the rms value of
the fundamental component of the quantity

[SOURCE: IEC 60050-551: 1998, 551-17-06]

BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 11 –

3.6 Characteristics related to impulse tests (see Figure 1)

U
1,0
B
0,9

0,5

0,3 A

0
T t

T′ T1 = T/ 0,6
T1
T2 T′ = 0,3 T1 = 0,5 T

O O1 IEC

Figure 1 – Full impulse voltage time parameters

Note 1 to entry: Oscillations are negligible.

3.6.1
impulse voltage
intentionally applied aperiodic transient voltage which usually rises rapidly to a peak value
and then falls more slowly to zero

3.6.2
peak value
maximum value

3.6.3
value of the test voltage
for an impulse without overshoot or oscillations, its peak value

Note 1 to entry: The determination of the peak value, in the case of oscillations or overshoot on standard
impulses, is considered in IEC 60060-1.

3.6.4
front time
T1
virtual parameter defined as 1/0,6 times the interval T between the instants when the impulse
is 30 % and 90 % of the peak value on the test voltage curve (points A and B, Figure 1)

3.6.5
virtual origin
O1
instant preceding point A, of the test voltage curve (see Figure 1) by a time 0,3 T 1

Note 1 to entry: For records having linear time scales, this is the intersection with the time axis of a straight line
drawn through the reference points A and B on the front.
 BS EN 61180:2016
– 12 – IEC 61180:2016 © IEC 2016

3.6.6
time to half-value
T2
virtual parameter defined as the time interval between the virtual origin O 1 and the instant
when the voltage has decreased to half the peak value

3.6.7
recorded curve
graphical or digital representation of the test data of an impulse voltage

3.7 Definitions relating to tolerance and uncertainty

3.7.1
tolerance
permitted difference between the measured value and the specified value

3.7.2
uncertainty of measurement
parameter, associated with the result of a measurement, that characterizes the dispersion of
the values that could be reasonably attributed to the measurand

Note 1 to entry: Uncertainty is positive and given without sign.

[SOURCE: IEC 60050-311:2001, 311-01-02]

3.7.3
error
measured quantity value minus a reference quantity value

[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.2]

3.7.4
standard uncertainty
u
uncertainty of the result of a measurement expressed as a standard deviation

Note 1 to entry: The standard uncertainty associated with an estimate of a measurand has the same dimension as
the measurand.

Note 2 to entry: In some cases, the relative standard uncertainty of a measurement may be appropriate. The
relative standard uncertainty of measurement is the standard uncertainty divided by the measurand, and is
therefore dimensionless.

[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.1]

3.7.5
combined standard uncertainty
uc
standard uncertainty of the result of a measurement when that result is obtained from the
values of a number of other quantities, equal to the positive square root of a sum of terms, the
terms being the variances or covariances of these other quantities weighted according to how
the measurement result varies with changes in these quantities

[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.4]

BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 13 –

3.7.6
expanded uncertainty
U
quantity defining an interval about the result of a measurement that may be expected to
encompass a large fraction of the distribution of values that could reasonably be attributed to
the measurand

Note 1 to entry: Expanded uncertainty is the closest match to the term “overall uncertainty”.

Note 2 to entry: The true, but unknown test-voltage value may lie outside the limits given by the uncertainty
because the coverage probability is < 100 % (see 3.7.7).

[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.5, modified:notes added]

3.7.7
coverage factor
k
numerical factor used as multiplier of the combined standard uncertainty in order to obtain an
expanded uncertainty

Note 1 to entry: For 95 % coverage probability and normal (Gaussian) probability distribution the coverage factor
is approximately k = 2.

[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.6, modified:note added]

3.7.8
type A evaluation
method of evaluation of an uncertainty by statistical analysis of a series of observations

3.7.9
type B evaluation
method of evaluation of an uncertainty by means other than statistical analysis of a series of
observations

3.7.10
national metrology institute
institute designated by national decision to develop and maintain national measurement
standards for one or more quantities

4 General requirements

4.1 General

Unless otherwise specified by the relevant technical committee, the test object should be
clean and dry, stabilized to ambient environmental conditions and the voltage application shall
be as specified in the relevant clauses of this standard. The test procedures applicable to
particular types of test objects, should be specified by the relevant technical committee,
having regard to such factors as:

• the required accuracy of test results;

• the random nature of the observed phenomenon and any polarity dependence of the
measured characteristics;
• the possibility of progressive deterioration with repeated voltage applications.

This includes for example, the polarity to be used, the preferred order if both polarities are to
be used, the number of applications and the interval between applications, and any
conditioning and preconditioning.
 BS EN 61180:2016
– 14 – IEC 61180:2016 © IEC 2016

The connections between the test equipment and the object subjected to the high voltage test
shall be direct and as short as possible. Loops of the connections should be avoided to
minimize oscillations on the front of the impulse. The leads should be as close to each other
as possible in order to minimize the area between the leads.

These requirements shall also apply for the qualification of the measuring system, e.g. the
test equipment to be calibrated and the reference measuring system.

The manufacturer of the test equipment shall give information on the characteristics of the
test equipment, so that the generated voltage is still within the allowed tolerances when
testing the object subjected to the high voltage test.

4.2 Atmospheric conditions for test procedures and verification of test equipment

The atmospheric conditions for test procedures and the verification of test equipment shall be
those stated for testing in IEC 60068-1:

Temperature 15 °C to 35 °C
Air pressure 86 kPa to 106 kPa
Relative humidity 25 % to 75 %
Absolute humidity ≤ 22 g/m 3

The actual atmospheric conditions during the test shall be recorded.

For the purpose of testing, where the atmospheric conditions are within the ranges specified
in this standard, corrections to the test voltage due to variations of the temperature, humidity
and air pressure do not need to be applied.

When the atmospheric conditions during the test are not within the ranges specified in this
standard, the method in Annex C shall be used, by agreement, for test voltage correction.

4.3 Procedures for qualification and use of measuring systems

4.3.1 General principles

Every approved measuring system shall undergo initial tests, followed by periodic
performance tests throughout its service life, as specified in 4.3.2. The initial tests consist of
type tests and routine tests.

The performance tests shall prove that the measuring systems can measure the intended test
voltages within the uncertainties given in this standard, and that the measurements are
traceable to national and/or international standards of measurement. The system is approved
only for the arrangements and operating conditions included in its record of performance, as
specified in 4.3.3.

A major requirement for measuring systems is stability within the specified range of operating
conditions so that the scale factor remains constant over long periods.

The assigned scale factor is determined in the performance test by calibration. Any calibration
shall be traceable to national and/or international standards. The user shall ensure that any
calibration is performed by competent personnel using reference measuring systems and
suitable procedures.

Alternatively, any user may choose to have the performance tests made by a national
metrology institute or by a calibration laboratory accredited for the quantity to be calibrated.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 15 –

Calibrations performed by a national metrology institute, or by a laboratory accredited for the

quantities calibrated and reported under the accreditation, are considered traceable to
national and/or international standards.

In all cases, the user shall include the test data in the record of performance.

4.3.2 Schedule of performance tests

To maintain the quality of a measuring system, the assigned scale factor(s) shall be
determined by periodic performance tests. The interval between performance tests shall be
not longer than 1 year unless otherwise stated by the manufacturer and based on experience
demonstrating long-term stability.

Performance tests shall be made following major repairs to the measuring system and
whenever a circuit arrangement that is beyond the limits given in the record of performance is
to be used.

4.3.3 Requirements for the record of performance

The results of all tests, including the conditions under which the results were obtained, shall
be kept in the record of performance (stored in paper format or electronically if permitted by
quality systems and local laws) established and maintained by the user. The record of
performance shall uniquely identify the components of the measuring system and shall be
structured so that performance of the measuring system can be traced over time.

The record of performance shall comprise at least the following information:

• General description of the measuring system.

• Results of type and routine tests on the measuring system.
• Results of subsequent performance tests on the measuring system.

The general description of the measuring system usually comprises main data and
capabilities of the measuring system, such as the rated operating voltage, waveform(s),
range(s) of clearances, operating time, or maximum rate of voltage applications. For many
measuring systems, information on the transmission system as well as high-voltage and
ground-return arrangements are important. If required, a description is also given of
components of the measuring system, including for example the type and identification of the
measuring instrument.

4.3.4 Uncertainty

The uncertainty of all measurements made under this International Standard shall be
evaluated according to ISO/IEC Guide 98-3. Uncertainty of measurement shall be
distinguished from the tolerance. A pass/fail decision is based solely on the measured value
in relation to the pass/fail criteria. The measurement uncertainty shall not be applied to the
measured value to make the pass/fail decision. Procedures for evaluating uncertainties given
in 4.4.7 are specified in accordance with the principles of ISO/IEC Guide 98-3, and are
considered sufficient for the instrumentation and measurement arrangements commonly used
in high-voltage testing. However, users may select other appropriate procedures from
ISO/IEC Guide 98-3, some of which are outlined in Annex A and Annex B.

In general, the measurand to be considered is the scale factor of the measuring system, but in
some cases other quantities, such as the time parameters of an impulse voltage and their
associated errors, should also be considered.

NOTE 1 Other measurands for specific converting devices are in common use. For example, a voltage divider is
characterized by the voltage ratio and its uncertainty in the assigned measurement ranges used. A voltage
transformer is characterized by the ratio error, the phase displacement and the corresponding uncertainties.
 BS EN 61180:2016
– 16 – IEC 61180:2016 © IEC 2016

According to the ISO/IEC Guide 98-3, the uncertainty of a measurement is determined by

combining the uncertainty contributions of Type A and Type B (see 4.4.7). These contributions
are obtained from measurement results, manufacturers’ handbooks, calibration certificates
and from estimating reasonable values of the influence quantities during the measurement.
Influence quantities considered in 4.4 include temperature effects, influence of the load,
dynamic behaviour of the measuring system and long and short term stability influence. Other
effects, including limited resolution of the measuring instrument, may be included if
necessary.

The uncertainty shall be given as the expanded uncertainty for a coverage probability of
approximately 95 % corresponding to a coverage factor k=2 under the assumption of a normal
distribution.

NOTE 2 In this International Standard, the uncertainties of the scale factor and of voltage measurement (4.4.1 to
4.4.6) are expressed by the relative uncertainties instead of the absolute uncertainty normally considered in the
ISO/IEC Guide 98-3.

4.4 Tests and test requirements for an approved measuring system and its
components

4.4.1 Calibration – Determination of the scale factor

The assigned scale factor of the measuring system shall be determined by calibration
according to the specified performance tests. The assigned scale factor is a single value for
the assigned measurement range. If necessary, several assigned measurement ranges with
different scale factors may be defined.

Scale factor(s) is (are) determined for a complete measuring system by comparison with a
reference measuring system.

The input voltage used for calibration should be of the same type, frequency or waveform as
voltages to be measured. If this condition is not fulfilled, the related uncertainty contributions
shall be estimated.

Calibration shall be performed by connecting a reference measuring system, traceable to a

national metrology institute, in parallel with the measuring system to be calibrated. Care shall
be taken to avoid ground loops between the converting device(s) and measuring instrument(s).
Simultaneous readings shall be taken on both systems. The value of the input quantity
obtained for each measurement by the reference measuring system is divided by the
corresponding reading of the instrument in the system under test to obtain a value F i of its
scale factor. The procedure is repeated n times to obtain the mean value F g of the scale
factor of the system under test at one voltage level U g . The mean value is given by:

1 n
Fg =
n
∑F
i =1
i, g

The relative standard deviation s g of F g is given by:

1 1 n
sg =
Fg
∑
n − 1 i =1
( Fi , g − Fg ) 2

and the Type A relative standard uncertainty u g of the mean value F g is given by (Annex A):

sg
ug =
n
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 17 –

Usually no more than n = 10 independent readings are necessary.

For measurement of direct and alternating voltages, independent readings should be obtained
either by applying the test voltage and taking n readings or by applying the test voltage n
times and taking a reading each time. For impulse voltages, n impulses are applied.

The scale factor determination shall be made at the minimum and maximum levels of the
assigned measurement range and on at least three approximately equally spaced
intermediate levels (Figure 2). The assigned scale factor F is taken as the mean value of all
scale factors F g recorded at h voltage levels:

1 h
F = ∑ Fg for h ≥ 5
h g =1

Calibration range

Voltage

Assigned measurement range

IEC

Figure 2 – Calibration by comparison over the full voltage range

The standard uncertainty of the determination of the assigned scale factor F is obtained as
the largest of the single standard uncertainties of type A (Figure 3):

h
u A = max u g .
g =1

The effect of a non-linearity in F is estimated as a Type B standard uncertainty expressed by:

1 h Fg
uBo = max −1 .
3 g =1 F

A rounded value F o may be taken as the assigned scale factor if the difference between F o
and F is introduced as an uncertainty contribution of Type B in the estimate of the expanded
uncertainty of the scale factor F o .

The individual scale factors and their uncertainties at the h voltage levels should be given in
the calibration certificate.
 BS EN 61180:2016
– 18 – IEC 61180:2016 © IEC 2016

F2; u2 F4; u4

Voltage
F1; u1

5 Fg 1 F5
1
F3; u3 u B0 = max −1 = −1
F5; u5 3 g =1 F 3 F
5
u A = max u g = u 3
g=1
IEC

Figure 3 – Uncertainty contributions of the calibration

(example with a minimum of 5 voltage levels)

4.4.2 Influence of load

Each comparison test shall be made first with the minimum load (the reference measuring
system alone) and be repeated with the maximum load (resistive, capacitive, inductive or any
combination of these) allowed by the manufacturer of the test equipment.

The uncertainty contribution of the load shall be taken into account by:

1 FMaxload
u Bl = −1
3 FMinload

This is needed especially when the voltage is not directly measured on the high-voltage side
at the test object terminals.

4.4.3 Dynamic behaviour

4.4.3.1 General

The response of a component or a measuring system shall be determined in conditions

representative of its use, particularly clearances to earthed and energized structures. The
preferred methods of measurement are the amplitude/frequency response for direct or
alternating voltages, and determination of the scale factors and time.

NOTE Additional information on unit step-response measurements is given in Annex C of IEC 60060-2:2010.

A type B estimate of the relative standard uncertainty related to the dynamic behaviour is
given by:

1 k Fi
uB2 = max −1
3 i =1 F

where k is the number of scale factor determinations within a frequency range, or within a
range of impulse time parameters defining the nominal epoch. F i are the individual scale
factors and F is the mean scale factor within the nominal epoch.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 19 –

4.4.3.2 Determination of the amplitude/frequency response

The system or component is subjected to a sinusoidal input of known amplitude, usually at

low level, and the output is measured. This measurement is repeated for an appropriate range
of frequencies. The deviations of the scale factor are evaluated according to the above
formula (4.4.3.1).

4.4.3.3 Reference method for impulse voltage measuring systems

Records of the impulse voltage taken for calibration of the scale factor described in 4.4.1 are
used for the limits of the nominal epoch, and the uncertainty contribution of voltage and time-
parameter measurements shall be evaluated according to the above formula (4.4.3.1).

NOTE For additional information on unit step response measurement and evaluation, see Annex C of IEC 60060-
2:2010.

4.4.4 Short-term stability

The maximum voltage of the assigned measurement range shall be applied to the measuring
system continuously (or at the assigned rate for impulses) for a period appropriate to the
anticipated use. The scale factor shall be measured as soon as the maximum voltage has
been reached and again immediately before the voltage is reduced.

The period of voltage application should not be longer than the assigned operating time, but
can be limited to a time sufficient to reach equilibrium.

NOTE The short term stability test is intended to cover the effects of self-heating on the converting device.

The result of the test is an estimate of the change of scale factor within the voltage
application time from which the standard uncertainty contribution is obtained as a type B
estimate:

1 Fafter
u B3 = ⋅ −1 ,
3 Fbefore

where F before and F after are the scale factors before and after the short-term stability test.

4.4.5 Long-term stability

The stability of the scale factor shall be considered and evaluated over a long time-span and
is usually estimated as an uncertainty contribution valid for a projected time of use (usually
until the next calibration), T use . The evaluation can be based on manufacturer’s data or on
results of a series of performance tests. The result of the evaluation is an estimate of a
change of the scale factor. The evaluation delivers a standard uncertainty contribution, which
is a type B estimate:

1 F2 T
uB 4 = ⋅ − 1 ⋅ use ,
3 F1 T2 − T1

where F 1 and F 2 are the scale factors of two consecutive performance tests made at times T 1
and T 2 .

In cases where a number of performance test results are available, the long-term stability can
be characterised by the type A contribution:
 BS EN 61180:2016
– 20 – IEC 61180:2016 © IEC 2016

2
n
 Fi 
Tuse
∑ 
i =1  Fm
− 1
u B4 =  ,
Tmean n(n − 1)

where the results of repeated performance tests are the scale factors F i , with a mean value
F m and repeated with a mean time interval T mean .

NOTE The long-term stability is usually stated for a period of one year.

4.4.6 Ambient temperature effect

The scale factor of a measuring system can be affected by ambient temperature. This can be
quantified by determination of the scale factor at different ambient temperatures or by
computations based on properties of components. Details of test or calculations shall be
included in the record of performance.

The result of a test or calculation is an estimate of a change of the scale factor due to ambient
temperature. The related standard uncertainty is the following type B estimate:

1 FT
u B5 = ⋅−1 ,
3 F

where F T is the scale factor at the considered temperature and F is that at calibration
temperature.

If the deviation F T from F is greater than 1 %, a correction of the scale factor is recommended.

NOTE Self-heating effect is covered by the short-term stability test.

A temperature correction factor for the scale factor may be used in cases where the ambient
temperature varies over a wide range. Any temperature corrections to be used should be
listed in the record of performance. For cases where temperature correction has been applied,
the uncertainty u B5 of the temperature correction factor may be taken as the uncertainty
contribution.

4.4.7 Uncertainty calculation of the scale factor

4.4.7.1 General

A simplified procedure to determine the expanded uncertainty of the assigned scale factor F
of a measuring system is given here. It is based on several assumptions, which in many
cases may be true, but should be verified in each individual case. The main assumptions are:

a) There is no correlation between the measurement quantities.

b) Standard uncertainties evaluated by the method of Type B are assumed to have a
rectangular distribution.
c) The largest three uncertainty contributions to uncertainty have approximately equal
magnitude.

These assumptions lead to a procedure of evaluation of the expanded uncertainty of the scale
factor F, both for the calibration situation and for the use of an approved measuring system in
measurements.

The expanded uncertainty of calibration U cal is estimated from the uncertainty of the
calibration of the reference system and from influence of other quantities explained in this
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 21 –

clause, such as stability of the reference measuring system and ambient parameters during
the calibration.

The expanded uncertainty of a measurement U M of the test quantity is evaluated from the
uncertainty of the calibration of the scale factor of the approved measuring system and from
the influence of other quantities discussed in 4.4, such as the stability of the measuring
system and ambient parameters during the measurement as they are not considered in the
calibration certificate.

Further methods for estimating uncertainty are given in the ISO/IEC Guide 98-3:2008 and are
also described in Annex A.

4.4.7.2 Uncertainty of the calibration

The relative expanded uncertainty of a calibration of the scale factor U cal is calculated from
the uncertainty of the reference measuring system and the Type A and Type B uncertainties
explained in this clause:

N
2
U cal = k ⋅ ucal = 2 u ref + u A2 + ∑ u B2 i ,
i =0

where:
k=2 is the coverage factor for a coverage probability of approximately 95 % and
normal distribution;
u ref is the combined standard uncertainty of the scale factor of the reference
measuring system at its calibration;
uA is the statistical Type-A uncertainty in the determination of the scale factor;
u B0 is the non-linearity contribution to standard uncertainty determined during
calibration of the scale factor (4.4.1);
u Bi is the contribution to the combined standard uncertainty of the scale factor caused
by the i th influence quantity and evaluated as a Type B contribution (Annex A).
These contributions are related to the reference measuring system, and arise from
non-linearity, short- and long-term instabilities, etc., and are determined either by
additional measurements or estimated from other data sources according to 4.4.2
to 4.4.6. Influences related to the approved measuring systems, such as its short-
term stability, and resolution of the measurement shall also be taken into account
if they are significant during the calibration.

In cases where the assumptions mentioned above are not valid, the procedures given in
Annex A or, if necessary, in the ISO/IEC Guide 98-3:2008 shall be applied.

The number N of Type B uncertainty contributions may differ for the different types of test
voltages (Clauses 5 to 7). More information on the Type B contributions is given in the
relevant clauses.

4.4.7.3 Uncertainty of measurement using an approved measuring system

Estimation of the expanded uncertainty of measurement of the test voltage value is the
responsibility of the user. However, this estimation may be given for a defined range of
measurement conditions in conjunction with the calibration certificate.

The relative expanded uncertainty of measurement of the test voltage value U M is calculated
from the combined standard uncertainty of the assigned scale factor as determined in the
calibration of the approved measuring system and additional Type B uncertainty contributions
explained in this clause:
 BS EN 61180:2016
– 22 – IEC 61180:2016 © IEC 2016

N
U M = k ⋅ uM = 2 u 2
cal + ∑ u B2 i ,
i =1

where:
k=2 is the coverage factor for a coverage probability of approximately 95 % and
normal distribution;
uM is the combined standard uncertainty of the measurement using the approved
measuring system, valid for a projected time of use, e.g. a calibration interval;
u cal is the combined standard uncertainty of the scale factor of the approved
measuring system determined at the calibration (see 4.4.7.2);
u Bi is the contribution to the combined standard uncertainty of the scale factor of the
approved measuring system and caused by the i th influence quantity, evaluated
as a Type B contribution. These contributions are related to normal use of the
approved measuring system, and arise from non-linearity, short- and long-term
instabilities, etc., and are determined according to 4.4.2 to 4.4.6 based either on
additional measurements or estimated from other data sources. Other significant
influences shall also be taken into account, e.g. resolution of instrument display of
the approved measuring system.

The calibration certificate may include information on both the uncertainty of the calibration,
U cal , and the relative expanded uncertainty of measurement of the test voltage value, U M ,
when using the approved measuring system under stated, predefined conditions.

In cases where the assumptions mentioned above in 4.4.7.1 are not valid, the procedures
given in Annex A or, if necessary in the ISO/IEC Guide 98-3:2008, shall be applied.

The number N of Type B uncertainty contributions may differ for the different types of test
quantities (Clauses 5 to 7, voltages and time parameters).

4.4.8 Uncertainty calculation of time parameter measurement (impulse voltages only)

4.4.8.1 General

An approved measuring system for impulse voltages shall be able to measure the time
parameters (T 1 , T 2 ,) within the specified uncertainty limits when the parameter lies within its
specified range. For front time this is usually the nominal epoch. The experimental proof can
be given either by the comparison or the component method.

NOTE The estimation of the uncertainty of time parameters results in an absolute uncertainty value.

4.4.8.2 Uncertainty of the time parameter calibration

The front times T 1 of n impulse voltages shall be evaluated simultaneously with the measuring
system under test, denoted by X, and the reference system, denoted by N. The error of the
reference measuring system is assumed to be negligible. The mean error of the front times is:

1 n
ΔT1 = ∑ (T1X,i − T1N,i )
n i =1

and the experimental standard deviation is:

2
1 n
s (ΔT1 ) = ∑ (∆T1,i − ∆T1 )
n − 1 i =1
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 23 –

where ∆T 1,i is the i th difference of the front times measured by the systems X and N.

Usually no more than n = 10 independent readings are necessary.

NOTE In general, the front times are evaluated from the same records of N and X, used to evaluate the peak
values for determining the scale factor (clause 4.4.7).

From s(∆T 1 ), the Type A standard uncertainty is calculated:

s (∆T1 )
uA = .
n

The comparison is performed at a suitable voltage level using at least two front times,
including the minimum and maximum T 1 values of the nominal epoch, for which the measuring
system is to be approved. An additional T 1 value in the middle of the nominal epoch can be
added. The standard uncertainty Type A of the time parameter measurement is obtained as
the largest of the single standard uncertainties determined for the different T 1 values. For
each of the different T 1 values, the mean error ∆T 1,j is calculated as described above. The
overall mean of the m ≥ 2 mean errors is:

1 m
ΔT1m = ∑ ΔT1, j .
m j =1

The maximum difference between the individual values ∆T 1,j and their mean value ∆T 1m is
taken to determine the Type B uncertainty u B by:

1 m
uB = max ΔT1, j − ∆T1m .
3 j =1

More general, the reference measuring system N may be characterised in the same manner
by its mean error of the front time, denoted by ∆T 1ref , as stated in its calibration certificate for
the nominal epoch. The resultant error of the calibrated system X itself for front time
measurements is:

∆T1cal = ∆T1m + ∆T1ref .

The expanded uncertainty of the time parameter calibration, equal to that of the resultant
mean error, ∆ T 1cal , is determined by:

2
U cal = k ⋅ ucal = 2 uref + uA2 + uB2
,

where:
u cal is the combined standard uncertainty of the mean front time error, ∆T 1cal , of the
calibrated measuring system;
k=2 is the coverage factor for a coverage probability of approximately 95 % and
normal distribution;
u ref is the combined standard uncertainty of the mean front time error, ∆T 1ref , of the
reference measuring system;
uA is Type A standard uncertainty of the mean front time error, ∆T 1m , of the
calibrated measuring system;
 BS EN 61180:2016
– 24 – IEC 61180:2016 © IEC 2016

uB is Type B standard uncertainty of the mean front time error ∆T 1m of the calibrated
measuring system.

Additional contributions to the expanded uncertainty U cal may be important in special cases
and shall be considered.

4.4.8.3 Uncertainty of time parameter measurement using an approved measuring

system

Estimation of the expanded uncertainty of a time parameter measurement is the responsibility

of the user. However, this estimation may be given for defined range of measuring conditions
in conjunction with the calibration certificate.

If the expanded uncertainty of the time parameter calibration is less than 70 % of the
expanded uncertainty specified for time parameter measurement in this standard, it can
generally be assumed that the uncertainty of the approved measuring system for time
parameter measurement U M is equal to U cal .

The expanded uncertainty of the time parameter measurement U M shall be calculated

according to:

N
2
U M = k ⋅ uM = 2 u cal + ∑ uB2i ,
i =1

where:
u cal is the combined standard uncertainty of the mean front time error, ∆T 1cal , of the
calibrated measuring system;
k=2 is the coverage factor for a coverage probability of approximately 95 % and
normal distribution;
u Bi is the contribution to the combined standard uncertainty of the time parameter of
an impulse using the approved measuring system and caused by the i th influence
quantity and evaluated as a Type B contribution. These contributions are related
to normal use of the approved measuring system, and arise for example from
long-term instabilities, software influence, etc., but also from the influence of
having non-perfect impulse shapes. They are determined according to 4.4.2 to
4.4.6, based either on additional measurements or estimated from other data
sources. In some situations further influences shall also be taken into account, e.g.
resolution of instrument displays;
uM is the combined standard uncertainty of the time parameter of an impulse voltage
measured with the approved measuring system, valid for an projected period of
use.

Additional contributions to the expanded uncertainty may be important in special cases and
shall be considered when calculating U M , e.g. when the impulse voltage is superimposed by
front oscillations.

When the approved measuring system is used to measure impulse voltages without
oscillations, the measured time parameter T 1meas can be corrected by the resultant error ∆T 1cal
of the relevant time parameter determined in the calibration:

T1corr = T1meas − ΔT1cal .

The same procedures can be applied to other time parameters.

BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 25 –

5 Tests with direct voltage

5.1 General

In the area of low voltage equipment, dielectric tests with direct voltage cannot be covered by
tests with alternating voltage where the peak value equals the direct test voltage. This is due
to different effects of partial discharge, leakage currents and stress duration on the insulation.

5.2 Test voltage

5.2.1 Requirements for the test voltage

5.2.1.1 Voltage shape

The test voltage, as applied to the test object, shall be a direct voltage with not more than 3 %
ripple factor, unless otherwise specified by the relevant technical committee.

The verification of the ripple factor shall be done under worst load conditions. In cases
where the ripple shape is nearly sinusoidal, true r.m.s. values multiplied by √ 2 are acceptable
for determination of the ripple amplitude.

It is important to maintain the d.c. voltage without significant increase in ripple and to keep a
constant arithmetic mean value of the voltage up to the tripping current.

5.2.1.2 Tolerance

If not otherwise specified by the relevant technical committee, a tolerance of ± 3 % is

acceptable between the specified and the measured test voltage values throughout the test.

5.2.2 Generation of the test voltage

The test voltage is generally obtained by means of rectifiers or by controlled electronic

circuits. The requirements to be met by the test voltage source depend considerably upon the
type of apparatus which is to be tested and on the test conditions. These requirements are
determined mainly by the value and nature of the test current to be supplied.

The source characteristics should be such as to permit charging of the capacitance of the test
object in a reasonably short time. The source, including its storage capacitance, should also
be adequate to supply the leakage, absorption and partial discharge currents in order to
maintain the test voltage within the tolerance of ± 3 %.

5.2.3 Measurement of the test voltage

5.2.3.1 Requirements for an approved measuring system

5.2.3.1.1 General

The general requirement is to measure the test voltage value (arithmetic mean value) with an
expanded uncertainty U M ≤ 3 %.

The uncertainty limits shall not be exceeded in the presence of ripple, the magnitude of which
is within the limits specified in 5.2.1.1, for a purely resistive load at the maximum current and
at the minimum test voltage specified.

NOTE Attention is drawn to the possible presence of alternating voltages coupled to the measuring system and
affecting the reading of the measuring instrument.
 BS EN 61180:2016
– 26 – IEC 61180:2016 © IEC 2016

5.2.3.1.2 Uncertainty contributions

For a direct voltage measuring system, the expanded uncertainty of measurement U M shall be
evaluated with a coverage probability of 95 %, according to 4.4.7 and – if necessary –
Annex A and Annex B. Tests for assessing contributions to uncertainty which are usually
considered are summarized in Table 1. Other contributions can be important in some cases
and shall also be considered.

5.2.3.1.3 Dynamic behaviour for measuring voltage changes

The time constant of the high-voltage measuring system shall not be greater than 0,25 s for
the measurement of direct voltages that rise or fall with rates in the order of 1 % of the test
voltage value per second.

NOTE In general, the instruments used for the measurement of the test voltage value (i.e. the arithmetic mean),
are not affected by the ripple present. However, if instruments with fast response are used, it may become
necessary to ensure that the measurement is not adversely affected by the ripple.

5.2.3.2 Tests on an approved measuring system

The tests according to 4.4, summarized in Table 1, are necessary for the qualification of a
direct voltage measuring system as well as for the estimation of the expanded uncertainty of
measurement.

The results of the type and routine tests can be taken from manufacturer's data. Routine tests
shall be performed on each component.

Table 1 – Tests required for an approved direct voltage measuring system

Type of test Type test Routine test Performance test

Influence of load 4.4.2
Dynamic behaviour 4.4.3
Scale factor at calibration 4.4.1 4.4.1
Short-term stability 4.4.4
Long-term stability 4.4.5 4.4.5
(if applicable)
Ambient temperature effect 4.4.6

5.3 Test procedures

5.3.1 Withstand voltage tests

The voltage shall be applied to the test object starting at a value sufficiently low to prevent
any effect of overvoltage due to switching transients. It should be raised sufficiently slow to
permit reading of the measuring instruments, but not so slowly as to cause unnecessary
prolongation of stress to the test object near the test voltage.

These requirements are, in general, met if the rate of rise is about 5 % of the estimated final
voltage per second when the applied voltage is above 75 % of this voltage. It shall be
maintained for the specified time and then reduced by discharging the smoothing capacitor
and the test object through a suitable resistor.

The test duration at the specified test voltage shall be 60 s if not specified by the relevant
technical committee.

The test duration should take into consideration that the time to reach the steady state voltage
distribution depends on the resistances and capacitances of the test object components.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 27 –

The polarity of the voltage or the order in which voltages of each polarity are applied, and any
required deviation from the above specifications, should be specified by the relevant technical
committee.

Unless otherwise specified by the relevant technical committee, the tripping current of the
generator shall be adjusted to 10 mA for type tests of test objects.

For routine testing, the tripping current may be adjusted to lower levels.

6 Tests with alternating voltage

6.1 Test voltage

6.1.1 Requirements for the test voltage

6.1.1.1 Voltage waveshape

The alternating test voltage, as applied to the test object, should generally have a frequency
in the range 45 Hz to 65 Hz, normally referred to as power-frequency test voltage. Special
tests may be required at frequencies considerably below or above this range, as specified by
a technical committee.

The voltage waveshape shall be substantially sinusoidal. The ratio between the peak value
and the r.m.s. value is √2 ± 3 %. The total harmonic distortion (THD) of the test voltage shall
be less than 5 % under full load conditions.

The test voltage is the r.m.s. value.

NOTE In the area of low-voltage equipment the r.m.s. value is used to specify the test voltage, although the
important factor for breakdown is the peak value.

6.1.1.2 Tolerance

If not otherwise specified by the relevant technical committee, a tolerance of ±3 % is

acceptable between the specified and the measured test voltage values throughout the test.

6.1.2 Generation of the test voltage

6.1.2.1 Requirements for the test circuit

One of the following alternatives shall be used.

Alternative A:

At the test voltage, the prospective short-circuit current at the test object and the tripping
current of the generator shall be in accordance with Table 2.

Table 2 – Minimum currents of the test circuit

Minimum currents
Testvoltage mA
V
prospective short-circuit current tripping current

≤ 4 000 200 100

> 4 000 and ≤ 10 000 80 40

> 10 000 40 20

NOTE The values are identical as in IEC 60335.

 BS EN 61180:2016
– 28 – IEC 61180:2016 © IEC 2016

If high capacity loading limits the a.c. test voltage, it may be necessary to perform a d.c. test
as an alternative where the direct test voltage equals the peak value of the alternating voltage.
The relevant technical committee should specify when testing with direct voltage is acceptable.

Alternative B:

If the test voltage is obtained by means of controlled electronic circuits, the requirement is to
supply the leakage, absorption and partial discharge currents without voltage drops exceeding
3 % at the maximum tripping current according to Table 2.

6.1.3 Measurement of the test voltage

6.1.3.1 Requirements for an approved measuring system

6.1.3.1.1 General

The general requirement is to measure the test voltage value (peak/√2 or r.m.s. value) at its
rated frequency with an expanded uncertainty U M ≤ 3 %.

6.1.3.1.2 Uncertainty contributions

For an alternating voltage measuring system the expanded uncertainty U M shall be evaluated
with a coverage probability of 95 % according to 4.4.7. Tests for assessing contributions to
uncertainty which are usually considered are summarized in Table 3. Other contributions can
be important in some cases and shall also be considered.

6.1.3.1.3 Dynamic behaviour

The amplitude-frequency response of a measuring system, intended for operation at one

single fundamental frequency f nom, shall be within the marked area of Figure 4, derived from
the uncertainty requirements. Number pairs in the diagram show the normalised frequency
(logarithmic scale) and the corresponding deviation at the corner points of the limit lines.
Performance shall be proven from f nom to 7 f nom by tests or circuit analysis. The amplitude-
frequency response outside this range is given for information only.

A measuring system can also be approved for a range of fundamental frequencies (e.g. 45 Hz
to 65 Hz). In this case, the scale factor shall be constant within 1 % from the lowest
fundamental frequency f nom1 up to the highest fundamental frequency f nom2 . The amplitude-
frequency response inside the interval f nom1 to 7 f nom2 , shall be within the marked area of
Figure 5. Number pairs in the diagram show the normalised frequency and the corresponding
permitted deviation from the ideal response at the corner points of the limit lines. Performance
shall be proven from f nom1 to 7 f nom2 by tests or circuit analysis. The amplitude-frequency
response outside this range is given for information only.

Special requirements on dynamic behaviour may be specified by the relevant technical

committee.

NOTE 1 Measuring systems complying with these requirements are considered to have a frequency response
suitable for measurement of the total harmonic distortion (THD) on the test voltage.

NOTE 2 The frequency response outside the marked area, although not required, does represent good practice.
 BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 29 –

0,2fnom; +15 % 7fnom; +15 %

fnom; ± 0 %
Amplitude-frequency response G( f ) (dB)

0,2fnom; –15 % 7fnom; –15 %

f / fnom
IEC

Figure 4 – Shaded area for acceptable normalised amplitude-frequency

responses of measuring systems intended for single fundamental frequencies f nom
(to be tested in the range (1….7) f nom )

f nom1 ; +1 % 7fnom2; +15 %

Amplitude-frequency response G( f ) (dB)

f nom2 ; +1 %

f nom2 ; –1 %

f nom1 ; –1 % 7f nom2 ; –15 %

f / f nom1 f nom1 f nom2 f / f nom2

IEC

Figure 5 – Shaded area for acceptable normalised amplitude-frequency

responses of measuring systems intended for a range of fundamental frequencies f nom1
to f nom2 (to be tested in the range f nom1 to 7 f nom2 )
 BS EN 61180:2016
– 30 – IEC 61180:2016 © IEC 2016

6.1.3.2 Dynamic behaviour test

To determine the dynamic behaviour, the system is subjected to a sinusoidal input of known
amplitude, usually at low level, and the output is measured. This measurement is repeated for
the range of frequencies between 1 and 7 times the test frequency. The result shall be in
accordance with 6.1.3.1.

6.1.3.3 Tests on an approved measuring system

The tests according to 4.4, summarized in Table 3, are necessary for the qualification of an
alternating voltage measuring system, as well as for the estimation of the expanded
uncertainty of measurement.

The results of the type and routine tests can be taken from manufacturer's data. Routine tests
shall be performed on each unit.

Table 3 – Tests required for an approved alternating voltage measuring system

Type of test Type test Routine test Performance test

Scale factor at the 4.4.1 4.4.1
calibration
Influence of load 4.4.2
Dynamic behaviour 4.4.3/6.1.3.2
Short-term stability 4.4.4
Long-term stability 4.4.5 4.4.5
(if applicable)
Ambient temperature effect 4.4.6

6.2 Test procedures

6.2.1 Withstand voltage tests

The a.c. test voltage shall be raised uniformly from 0 V to the test voltage value within not
more than 5 s.

If not specified by the relevant technical committee the test duration at the specified test
voltage shall be 60 s and shall be independent of the frequency in the range from 45 Hz to
65 Hz.

For routine testing, the tripping current may be adjusted to lower levels.

Unless otherwise specified by the relevant technical committee, the requirements of the test
are satisfied if no tripping of the test equipment occurs.

It is recommended that for safety reasons the current should be reduced to 3 mA.

7 Tests with impulse voltage

7.1 Test voltage

7.1.1 General

For an impulse measuring system, the performance tests also show that its dynamic
performance is adequate for the specified measurements and that the level of any
interference is less than the specified limits.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 31 –

7.1.2 Requirements for the test voltage

7.1.2.1 Standard impulse voltage

The standard impulse voltage is a smooth full impulse voltage having a front time of 1,2 µs
and a time to half-value of 50 µs and described as a 1,2/50 impulse, Figure 6. Other impulse
shapes may be specified by the relevant technical committee. For other impulse shapes, the
relevant technical committee shall define the value of the test voltage, taking into account the
type of test and test object.

U
1,0
B
0,9

0,5

0,3 A

0
1,2 µsec t
T′ T1 = T / 0,6
T1
50 µsec T ′ = 0,3 T1 = 0,5 T

O O1
IEC

Figure 6 – 1,2/50 µs standard impulse voltage

7.1.2.2 Tolerances on standard impulse

If not otherwise decided by the relevant technical committee, the following differences are
accepted between specified values for the standard impulse and those calculated from the
impulse waveform:

Peak value ±3 %
Front time ±30 %
Time to half-value ±20 %

In commonly used impulse generator circuits, oscillations on that part of the impulse-front
during which the voltage does not exceed 90 % of the peak value have generally negligible
influence on test results. The impulse should be essentially unidirectional.

In specific cases, such as during tests on low impedance objects, e.g. large capacitors, it may
be impossible to adjust the shape of the impulse within the tolerances recommended, to keep
the oscillations within the specified limits, or to avoid a polarity reversal. Such cases should
be dealt with by the relevant technical committee and should take into account the provisions
of IEC 60060-1.

7.1.3 Generation of the test voltage

The impulse is usually produced by an impulse generator consisting essentially of a number

of capacitors that are charged in parallel from a direct voltage source, then switched into
series and discharged into an impulse-forming circuit that includes the test object.
 BS EN 61180:2016
– 32 – IEC 61180:2016 © IEC 2016

7.1.4 Measurement of the test voltage and determination of impulse shape

The measurement of the test voltage value and the time parameters of the test voltage shall
be made with approved measuring systems. The measurement shall be made with the test
object in the circuit and, in general, the impulse shape shall be checked for each test object.
Where a number of test objects of the same design and size are tested under identical
conditions, the shape needs only to be verified once. Where high capacitive loading does not
allow the impulse waveshape to be obtained within the specified tolerances, it may be
necessary to adapt the test setup or the devices.

NOTE For disruptive discharge see IEC 60060-1:2010, Clause 7.

The measurement may be made with the impulse generator not connected to the test object
when the impedance of the test object has a negligible effect on the amplitude and waveform
of the test voltage. This shall be verified prior to using this measurement technique.

Determination of the impulse shape by calculation from the test circuit parameters is not
considered to be satisfactory.

More than one impulse may be necessary to establish consistent operation.

7.2 Test procedures

7.2.1 Verification of impulse voltage waveshape

The waveshape of the impulse voltage applied to the test object(s) shall be verified using
peak values not less than 50 % of the test voltage level. In the case of identical test objects,
this verification only needs to be performed once at the beginning of the series.

7.2.2 Impulse voltage tests

Five impulses of the specified shape and of each polarity shall be applied at the impulse
voltage level. The requirements of the test are satisfied if no indication of disruptive discharge
or partial breakdown is obtained.

NOTE 1 Non-sustained disruptive discharge in which the test object is momentarily bridged by a spark or arc may
occur. During these events the voltage across the test object is momentarily reduced to zero or to a very small
value. Depending on the characteristics of the test circuit and the test object, a recovery of dielectric strength may
occur and may even allow the test voltage to reach a higher value. Such an event is interpreted as a disruptive
discharge unless otherwise specified by the relevant Technical Committee.

NOTE 2 A disruptive discharge in a solid dielectric produces permanent loss of dielectric strength; in a liquid or
gaseous dielectric the loss may be only temporary.

The relevant technical committee shall specify the criteria for identification and evaluation of
partial breakdown, where applicable.

7.3 Measurement of the test voltage

7.3.1 Requirements for an approved measuring system

The general requirements are:

to measure the test voltage value with an expanded uncertainty U M1 ≤ 3 %;

to measure the time parameters which define the waveform with an expanded uncertainty
U M3 ≤ 10 %.
NOTE No recommendations are given for the measurement of voltage collapse since no IEC apparatus committee
has yet specified a requirement.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 33 –

7.3.2 Uncertainty contributions

For a lightning impulse voltage measuring system, the expanded uncertainty of measurement
U M shall be evaluated with a coverage probability of 95 %. Tests for assessing contributions
to uncertainty which are usually considered are summarized in Table 4. Other contributions
can be important in some cases and shall also be considered.

7.3.3 Dynamic behaviour

The dynamic behaviour of a measuring system is adequate for the measurement of peak
voltage and time parameters over the nominal epoch for waveforms specified in the record of
performance when the expanded uncertainty of the time parameters measurement is not
greater than 10 %.

Table 4 – Tests required for an approved impulse voltage measuring system

Type of test Type test Routine test Performance test

Scale factor at the calibration 4.4.1 4.4.1
Time parameter 4.4.8 4.4.8
Influence of load 4.4.2
Dynamic behaviour 4.4.3
Short-term stability 4.4.4
Long-term stability 4.4.5 4.4.5
(if applicable)
Ambient temperature effect 4.4.6

7.3.4 Requirements for measuring instrument

The measuring instrument shall comply with IEC 61083-1 and IEC 61083-2.

8 Reference measurement systems

8.1 Requirements for reference measuring systems

8.1.1 Direct voltage

The reference measuring system shall enable direct voltage measurement with an expanded
uncertainty U M ≤ 1 % over its range of use. The uncertainty shall not be influenced by a ripple
factor up to 3 %.

8.1.2 Alternating voltage

The reference measuring system shall enable alternating voltage measurement with an
expanded uncertainty U M ≤ 1 % over its range of use.

8.1.3 Impulse voltages

According to IEC 60060-2 the requirements for an Impulse voltage reference measuring
system are ≤ 1 % for the peak value and ≤ 5 % for the time parameters.

8.2 Calibration of a reference measuring system

8.2.1 General

The compliance of a reference measuring system with the relevant requirements given in 8.1
of this standard shall be shown by the reference method.
 BS EN 61180:2016
– 34 – IEC 61180:2016 © IEC 2016

8.2.2 Reference method: comparative measurement

The satisfactory performance of a reference measuring system shall be shown by calibration

against another suitable reference measuring system, which itself is traceable to national or
international standards of measurement.

The satisfactory performance of an impulse reference measuring system shall be shown by

calibration by comparison measurements at the relevant test voltage with waveforms of two or
more different front times covering the range of the nominal epoch.

8.3 Interval between successive calibrations of reference measuring systems

The interval between calibrations shall be determined according to national regulations. If

there is no regulation it is recommended that the calibrations shall be repeated at least once
every year.

8.4 Use of reference measuring systems

It is recommended that reference measuring systems should be used only for comparative
measurements in performance tests. However, a reference measuring system may be used as
an approved measuring system provided it is maintained in accordance with the requirements
of this standard, and such use is shown not to affect its performance as a reference system.
An approved measuring system may not be used as a reference measuring system.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 35 –

Annex A
(informative)

Uncertainty of measurement

A.1 General

Subclause 4.4 describes a simplified procedure to evaluate the uncertainty of measurement

under conditions usually applicable and fully sufficient in high-voltage measurement. In some
cases it may, however, be necessary or desirable to evaluate uncertainties in a more complex
manner. Annex A gives a survey on how to proceed in these cases, and Annex B describes an
application example.

Each measurement of a quantity is to some degree imperfect, and the result of a

measurement is only an approximation (“estimate”) of the “true” value of the measurand. The
uncertainty of measurement makes a clear statement on the quality of a measurement. It
enables the user to compare and weight the measurement results, e.g. obtained from different
laboratories, and it provides information as to whether or not a measurement result is within
the limits specified by a standard. A Guide to the expression of Uncertainty in Measurement
(GUM) was first published in 1993 by the International Organization for Standardization (ISO)
and has been re-issued in 2008, with minor modifications as the ISO/IEC Guide 98-3:2008. It
is now the internationally accepted document for the estimation of measurement uncertainty.

The GUM as a guide provides general rules for evaluating and expressing uncertainty in a
broad spectrum of measurements at various levels of uncertainty. It is therefore necessary to
extract from the GUM a set of specific rules that deals with the specific field of high-voltage
measurement and its level of accuracy and complexity. Corresponding to the basic principles
of the GUM, uncertainties are grouped into two categories according to their methods of
evaluation. Both methods are based on probability distributions of the quantities influencing
the measurement and on standard uncertainties quantified by variances or standard
deviations. This allows a uniform treatment of both categories of uncertainties and an
evaluation of a combined standard uncertainty of the measurand. Within the scope of this
standard, an expanded uncertainty corresponding to a coverage probability of approximately
95 % is required.

The basic principles of the GUM and examples of how to determine uncertainties in high
voltage measurements are presented in the following clauses. The formulae and examples
given herein are valid for uncorrelated input quantities, which is often the case in high-voltage
measurements.

A.2 Terms and definitions in addition to 3.7

A.2.1
measurable quantity
attribute of a phenomenon, body or substance that may be distinguished qualitatively and
determined quantitatively

A.2.2
value of a quantity
magnitude of a particular quantity generally expressed as unit of measurement multiplied by a
number

A.2.3
measurand
specific quantity subjected to measurement
 BS EN 61180:2016
– 36 – IEC 61180:2016 © IEC 2016

A.2.4
variance
expectation of the square of the deviation of a random variable about its expectation

A.2.5
correlation
relationship between two or several random variables within a distribution of two or more
random variables

A.2.6
coverage probability
fraction, usually large, of the distribution of values that as a result of a measurement could
reasonably be attributed to the measurand

A.3 Model function

Each measurement can be described by a functional relationship f:

Y = f ( X 1 , X 2 , . . ., X i , ..., X N ) (A.1)

where Y is the measurand and X i are the different input quantities numbered from 1 to N. In
the meaning of the GUM the model function f comprises all measurement values, influencing
quantities, corrections, correction factors, physical constants, and any other data that can
contribute a significant amount to the value of Y and its uncertainty. It may exist as a single or
manifold analytical or numerical expression, or a combination of both. In general the input
quantities X i are random variables and described by observations x i (”input estimates”) having
specific probability distributions and being associated with standard uncertainties u(x i ) of Type
A or Type B. The combination of both types of uncertainty according to the rules of the GUM
yields the standard uncertainty u(y) of the output estimate y.

NOTE 1 The model function f in (A.1) is also valid for the input and output estimates x i and y, respectively.

NOTE 2 In a series of observations, the k’ th observed value of the quantity X i is denoted x ik .

A.4 Type A evaluation of standard uncertainty

The evaluation method of Type A is applied to quantities that vary randomly and for which n
independent observations have been obtained under the same conditions of measurement. In
general, a normal (Gaussian) probability distribution of the n observations x ik can be assumed
(Figure A.1).

NOTE X i might be a scale factor, a test voltage value or a time parameter with the observations x ik .

The arithmetic mean value xi of the observations x ik is defined by:

1 n
xi = ∑ xi
n k =1 k
, (A.2)

which is considered to be the best estimate of X i . Its Type A standard uncertainty is equal to
the experimental standard deviation of the mean:

s ( xi )
u ( xi ) = s( xi ) = (A.3)
n
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 37 –

where s(x) is the experimental standard deviation (of the individual values):

1 n
s ( xi ) = ∑ ( xi k − xi ) 2 . (A.4)
n − 1 k =1

The quadratic values of s 2 (x i ) and s 2 ( xi ) are called sample variances and variances of the
mean, respectively. The number of observations should be n ≥ 10, otherwise the reliability of
a Type A evaluation of standard uncertainty has to be checked by means of the effective
degrees of freedom (see Clause A.8).

In some cases a pooled estimate of variance sp2 may be available from a large number of
previous observations under well-defined conditions. Then the standard uncertainty of a
comparable measurement with a small number n (n = 1, 2, 3, …) is better estimated by
u (xi ) = sp / n than by formula (A.3).

A.5 Type B evaluation of standard uncertainty

The evaluation method of Type B applies to all cases other than the statistical analysis of a
series of observations. The standard uncertainty of Type B is evaluated by scientific judgment
based on all available information on the possible variability of an input quantity X i with
observations x i , such as the:

• method of evaluating the quantities,

• uncertainty of calibration of the measuring system and its components,
• non-linearity of dividers and measuring instruments,
• dynamic behavior, e. g. scale factor variation with frequency or impulse shape,
• short-term stability, self-heating,
• long-term stability, drift,
• ambient conditions during measurement,
• proximity effect of nearby objects,
• effects caused by software used in instruments or in evaluation of results,
• limited resolution of digital instruments, reading of analogue instruments.

Information on the input quantities and uncertainties can be obtained from actual and previous
measurements, calibration certificates, data in handbooks and standards, manufacturer’s
specifications or knowledge of the characteristics of relevant materials or instruments. The
following cases of a Type B evaluation of uncertainties can be identified:

a) Often only a single input value x i and its standard uncertainty u(x i ) is known, e.g. a single
measured value, a correction value or a reference value from literature. This value and its
uncertainty will be adopted in the model function (A.1). In case u(x i ) is unknown, it has to
be calculated from other relevant uncertainty data or be estimated on the basis of
experience.
b) The uncertainty of a device is quoted as a standard uncertainty multiplied by the coverage
factor k, e.g. the expanded standard uncertainty U of a digital voltmeter in a calibration
certificate (Claus A.7). When the voltmeter is used in a complex measuring system it
contributes to uncertainty by:

U
u(x i ) = (A.5)
k
 BS EN 61180:2016
– 38 – IEC 61180:2016 © IEC 2016

where k is the coverage factor. Instead of expressing the expanded uncertainty and
coverage factor, one may find a statement on the confidence level, e.g. 68,3 %, 95,45 %
or 99,7 %. In general, a normal distribution according to Figure A.1 can be assumed and
the statement on the confidence level is equivalent to the coverage factor k = 1, 2 or 3,
respectively.
c) The value x i of an input quantity X i is estimated to lie within the interval a - to a + with a
certain probability distribution p(x i ). Often there is no specific knowledge of p(x i ) and a
rectangular distribution of the probable values is then assumed (Figure A.2). Then the
expected value of X i is the midpoint xi of the interval:

xi =
(a− + a+ ) (A.6)
2
and the associated standard uncertainty:

a
u(xi ) = (A.7)
3
where a = (a + – a - )/2.

In some cases other probability distributions may be more appropriate, such as trapezoidal,
triangular or normal distributions.

NOTE The standard uncertainty is u( x i ) = a/√6 for the triangular distribution and u(x i ) = σ for the normal
distribution. This means that the rectangular distribution yields a larger standard uncertainty than the other
distributions.

The ISO/IEC Guide 98-3:2008 states that a Type B uncertainty should not be double-counted
if the particular effect has already contributed to a Type A uncertainty. Furthermore, the
evaluation of uncertainty should be realistic and based on standard uncertainties, avoiding the
use of personal or any other factors of safety to obtain larger uncertainties than those
evaluated according to the GUM. Often an input quantity X i has to be adjusted or corrected to
eliminate systematic effects of significant magnitude, e.g. on the basis of a temperature or
voltage dependence. However, the uncertainty u(x i ) associated with this correction shall still
be taken into account.

Double-counting of uncertainty contributions may occur when a digital recorder is used for
repetitive impulse measurements, e.g. when calibrating the scale factor. The dispersion of the
n measurement values producing a Type A standard uncertainty may be partially caused by a
limited resolution of the recorder and its internal noise. The resolution does not need to be
considered again, in full, but rather only in a small portion as a residual Type B uncertainty.
However, if the digital recorder is then used during an impulse voltage test to obtain a single
measurement value, the limited resolution has to be considered in a Type B uncertainty.

The evaluation of Type B uncertainties requires extensive knowledge and experience on the
relevant physical relationships, influence quantities and measurement techniques. As the
evaluation itself is not an exact science leading to only a single solution, it is not uncommon
that experienced test engineers may judge the measurement process in a different manner
and obtain different Type B uncertainty values.

A.6 Combined standard uncertainty

Each standard uncertainty u(x i ) of the estimate x i of each input quantity X i evaluated by
method Type A or Type B contributes to the standard uncertainty of the output quantity by:

ui ( y ) = ci u (x i ) (A.8)
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 39 –

where c i is the sensitivity coefficient. It describes how the output estimate y is influenced by
small variations of the input estimate x i . It can be evaluated directly as the partial derivative of
the model function f:

∂f ∂f
ci = X i = xi = , (A.9)
∂X i ∂xi

or by using equivalent numerical and experimental methods. The sign of c i may be positive or
negative. In cases where input quantities are uncorrelated, the sign needs not be considered
further since only the quadratic value of standard uncertainties is used in the next steps.

The N standard uncertainties u i (y) defined by formula (A.8) contribute to a combined standard
uncertainty u c (y) of the output quantity according to the “law of propagation of uncertainty”:

N
uc ( y ) = u12 ( y ) + u 22 ( y ) + ... + u N2 ( y ) = ∑ ui2 ( y )
2
(A.10)
i =1

from which u c (y) is evaluated as the positive square root:

N N
uc ( y ) = ∑ u ( y ) = ∑ [c u(x )]
i =1
i
2

i =1
i i
2
. (A.11)

If the output quantity Y is a product or quotient of the input quantities X i a similar relationship
as shown in (A.10) and (A.11) can be obtained for the relative uncertainties u c (y)/|y| and
u(x i )/|x i |. The law of propagation of uncertainty thus applies to both types of the model
function for uncorrelated input quantities.

In a case where correlation exists, linear terms will be present in the law of propagation of
uncertainty, and the sign of the sensitivity coefficients becomes relevant. Correlation occurs
when, for example, the same instrument is used for measuring two or more input quantities.
To avoid complicated calculation, the correlation can be removed by adding additional input
quantities in the model function f with appropriate corrections and uncertainties. In some
cases, the presence of correlated input quantities may even reduce the combined uncertainty.
Taking correlation into account is thus mainly essential for sophisticated uncertainty analysis
to achieve a very accurate estimation of uncertainty. Correlation will not be discussed further
in this standard.

A.7 Expanded uncertainty

In the field of high-voltage and high-current measurements, as in most other industrial

applications, a statement of uncertainty corresponding to a coverage probability of
approximately p = 95 % is required. This is achieved by multiplying the combined standard
uncertainty u c (y) in (A.11) by a coverage factor k:

U = ku c (y), (A.12)

where U is the expanded uncertainty. The coverage factor k = 2 is used in cases where a
normal distribution can be attributed to y and u c (y) has sufficient reliability, i.e. the effective
degrees of freedom of u c (y) is sufficiently large (see Clause A.8). Otherwise a value k > 2 has
to be determined to obtain p = 95 %.
 BS EN 61180:2016
– 40 – IEC 61180:2016 © IEC 2016

NOTE 1 In some older standards the term “overall uncertainty” is used. In the majority of cases this term is
interpreted as an expanded uncertainty U with the coverage factor being equal to 2.

NOTE 2 Since uncertainties are defined as positive numbers, the sign of U is always positive. Of course, in cases
where U is used in the meaning of an uncertainty interval, it is quoted k as ±U.

A.8 Effective degrees of freedom

The assumption of a normal distribution of the expanded uncertainty is, in general, fulfilled in
cases where several (i.e. N ≥ 3) uncertainty components of comparable value and well-
defined probability distribution (Gaussian, rectangular, etc.) contribute to the combined
standard uncertainty and where the Type A uncertainty is based on n ≥ 10 repeated
observations. These conditions are fulfilled in many calibrations of voltage measuring systems.
When the assumption of a normal distribution is not justified, a value of k > 2 shall be
evaluated to obtain a coverage probability of approximately 95 %. The appropriate coverage
factor can be evaluated on the basis of the effective degrees of freedom ν eff of the standard
uncertainty u c (y):

uc4 ( y )
ν eff = , (A.13)
N
ui4 ( y )
∑
i =1 νi

where u i (y) is given by (A.8) for i = 1, 2, …, N and ν i is the corresponding degrees of freedom.
Reliable values of ν i are:

• νi = n – 1 for a Type A uncertainty based on n independent observations,

• ν i ≥ 50 for a Type B uncertainty taken from a calibration certificate, and when the
coverage probability is stated to be not less than 95 %,
• νi = ∞ for a Type B uncertainty assuming a rectangular, Figure A.2, distribution within
a - and a +

The effective degrees of freedom can then be calculated by formula (A.13) and the coverage
factor be taken from Table A.1 which is based on a t-distribution evaluated for a coverage
probability of p = 95,45 %. If ν eff is not an integer interpolate or truncate ν eff to the next lower
integer.

Table A.1 – Coverage factor k for effective degrees of freedom ν eff (p = 95,45 %)

ν eff 1 2 3 4 5 6 7 8 10 20 50 ∞

k 13,97 4,53 3,31 2,87 2,65 2,52 2,43 2,37 2,28 2,13 2,05 2,00

A.9 Uncertainty budget

The uncertainty budget of a measurement is a detailed analysis of all sources and values of
uncertainty according to the model function f. The relevant data should be kept for inspection
in the form of a table equal or comparable to Table A.2. The last line indicates the values of
the measurement result y, the combined uncertainty u c (y) and the effective degrees of
freedom ν eff .
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 41 –

Table A.2 – Schematic of an uncertainty budget

Quantity Value Standard Degrees of Sensitivity Contribution to

uncertainty freedom coefficient combined
contribution standard
uncertainty
Xi xi u(x i ) ν i / ν eff ci u i (y)

X1 x1 u (x 1 ) ν1 c1 u 1 (y)
X2 x2 u (x 2 ) ν2 c2 u 2 (y)
: : : : : :
XN xN u (x N ) νN cN u N (y )

Y y ν eff u c (y)

NOTE Validated software is commercially available or may be developed by the user from general software that
enables automated calculation of the quantities in Table A.2 from the model equation f.

A.10 Statement of the measurement result

In calibration and test certificates the measurand Y shall be expressed as y ± U for a coverage
probability (or: level of confidence) of approximately p = 95 %. The numerical value of the
expanded uncertainty U shall be rounded to give not more than two significant figures. If
rounding down reduces the value by more than 0,05U, the rounded-up value shall be used.
The numerical value of y shall be rounded to the least significant figure that could be affected
by the expanded uncertainty.

EXAMPLE 1 The result of a voltage measurement is stated in one of the following ways:
(227,2 ± 2,4) kV,
227,2 × (1 ± 0,011) kV, or
227,2 × (1 ± 1,1·10 –2 ) kV.

An explanatory note should be added informing of the coverage probability p and the coverage factor k.

EXAMPLE 2 The following complete wording is recommended (the terms in brackets apply to the cases where ν eff
< 50, i.e. k > 2,05 according to Table A.1):

“The reported expanded uncertainty of measurement is stated as the uncertainty of measurement multiplied by the
coverage factor k = 2 (k = XX), which for a normal distribution (t-distribution with ν eff = YY effective degrees of
freedom) corresponds to a coverage probability of approximately 95 %. The standard uncertainty of measurement
has been determined in accordance with IEC 60060-2.”
 BS EN 61180:2016
– 42 – IEC 61180:2016 © IEC 2016

p(x )

x
x −σ x x +σ
IEC

The shaded area indicates the standard uncertainty above and below xi i .

Figure A.1 – Normal probability distribution p(x)

The shaded area indicates the standard uncertainty above and below xi i .

p(x )

2a
1
2a

a− x a+ x

2a
3
IEC

The shaded area indicates the standard uncertainty above and below xi i .

Figure A.2 – Rectangular probability distribution p(x)

BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 43 –

Annex B
(informative)

Example for the calculation of measuring

uncertainties in high-voltage measurements

An AC measuring system of rated voltage 500 V, denoted by X, is calibrated by an accredited

calibration laboratory. The calibration is performed up to V Xmax = 500 V by comparison with a
reference measuring system, denoted by N (Table B.1). The scale factor and the relative
expanded uncertainty of the reference system N at 20 °C is F N = 1,025 and U N = 0,8 % (k=2),
including an uncertainty contribution estimated for the long-term instability.

During the calibration, ambient temperature is (15 ± 2) °C. Since the scale factor of N was
calibrated at 20 °C, it is corrected by -0,3 % according to its temperature coefficient, yielding
the actual value F N = 1,022 at 15 °C. This correction, however, is not very accurate and,
furthermore, due to the temperature variation within ±2 °C during the calibration, the probable
values of F N are assumed to lie within an interval of ±0,001 around F N with rectangular
distribution. The comparison measurements are performed at h = 5 voltage levels of about
20 %, 40 %, and 100 % of V Xmax . At each voltage level, simultaneous readings of the voltages
V N and V X are taken for n = 10 voltage applications. Further investigations on the dynamic
behaviour, short-term stability, temperature interval, and interference show an influence on
the scale factor of the test object, F X , within ±0,2 % each. Its long-term stability is estimated
on the basis of the manufacturer’s data to lie within ±0,3 % until the next calibration.

The model equation for calculating the value of F X and its combined standard uncertainty can
be developed as follows. In the ideal case, both measuring systems indicate the same value
of the AC test voltage V (Table B.1):

V = FN VN = FX VX . (B.1)

This leads to the basis formula for calculating the scale factor of the system under test:

VN
FX = FN . (B.2)
VX

As described above, the scale factors of both systems are subject to several influence
quantities such as drift, temperature, etc. They contribute to the scale factor values and their
uncertainties as well. These contributions are denoted here by ∆F N,1 , ∆F N,2 , … for the
reference system, and by ∆F X,1 , ∆F X,2 , … for the system under test. In general, each
contribution to the scale factor F N or F X consists of an error and a standard uncertainty. The
error is taken to correct the scale factor, the correction being of opposite sign. The uncertainty
contribution is related to the relevant scale factor F N or F X and evaluated in a similar way as
described in Clause A.5, i.e., either by assuming a rectangular probability distribution within
an interval ±a i , leading to a standard uncertainty u i = a i /√3, or, in the case of a calibrated
component, by dividing its expanded uncertainty U by the coverage factor k. The contribution
∆F N,m or ∆F X,i needs not always have an error (or the error is assumed being negligibly small),
and then it consists only of the uncertainty contribution u i .

The basis formula (B.2) is supplemented by the contributions ∆F N,m and ∆F X,i to obtain the
complete model function for determining the scale factor F X and its combined standard
uncertainty. Since correlation between the influence quantities is neglected, (B.2) can then be
written in the general version:
 BS EN 61180:2016
– 44 – IEC 61180:2016 © IEC 2016

VN  
FX − ∑ ΔFX,i =  FN − ∑ ΔFN,m  . (B.3)
i VX  m 

NOTE 1 As per definition, the errors inserted on both sides of the equation have a negative sign. They are
defined as ∆F = (indicated value) – (correct value).

For the relevant case, the scale factor F X of the AC measuring system can be expressed by:

5
VN
FX = (FN − ΔFN ) + ∑ ∆ FX,i , (B.4)
VX i =1

where:
∆F N is the contribution caused by the lower temperature of the reference system,
∆F X,1 is the contribution caused by the nonlinearity of the quotient,
∆F X,2 is the contribution caused by the short-term instability of the system under test,
∆F X,3 is the contribution caused by the long-term instability of the system under test,
∆F X,4 is the contribution caused by the dynamic behaviour of the system under test,
∆F X,5 is the contribution caused by the temperature variation of the system under test.

NOTE 2 In this example, ∆F N consists both of a correction and an uncertainty contribution to the scale factor F N ,
whereas the terms ∆F X1 to ∆F X5 contribute only to the uncertainty of the scale factor F X . For convenience, the
uncertainty contributions ∆F X1 to ∆F X5 are directly related to F X , i.e. the sensitivity coefficients of these input
quantities have already been taken into consideration.

The comparison measurement at a single voltage level between the measuring system X and
the reference system N yields n = 10 pairs of measured values V N and V X , from which the
quotients V N / V X , their mean and the experimental standard deviation s(V N / V X ) are calculated.
An example for the values measured at a voltage level of about 40 % V Xmax is given in Table
B.1. In the same manner, the quotients V N / V X and standard deviations s(V N /V X ) are obtained
for in total h = 5 voltage levels up to 500 V (Table B.2).

Table B.1 – Result of the comparison measurement up to 500 V at a single voltage level

Number of Reference system System under test Quotient

measurements
VN VX V N /V X
V V

1 191,4 190,8 1,0031

2 191,6 190,9 1,0037
3 190,7 189,9 1,0042
4 189,9 189,0 1,0048
5 190,9 189,9 1,0053
6 191,2 190,3 1,0047
7 191,3 190,4 1,0047
8 191,2 190,4 1,0042
9 190,6 189,9 1,0037
10 191,3 190,7 1,0031

Mean of V N /V X at about 40 % V Xmax 1,0042

Experimental standard deviation s(V N /V X ): 0,73*10 –3
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 45 –

Table B.2 – Summary of results for h = 5 voltage levels (V Xmax = 500 V)

g Voltage level V N /V X s(VN/VX)

No. % of V Xmax

1 18 1,0032 0,71*10 -3
2 38 1,0042 0,73*10 -3
3 63 1,0045 0,81*10 -3
4 83 1,0065 0,68*10 -3
5 100 1,0101 0,85*10 -3 (= s max )

Mean 1,0057

The mean of the five quotients V N /V X in Table B.2 is 1,0057. To be on the safe side of the
uncertainty estimation, the Type A standard uncertainty of V N / V X is evaluated from the
maximum standard deviation s max = 0,85 * 10 -3 according to (A.3):

s max 0,85 ⋅ 10 −3
uA = = = 0,27 ⋅ 10 −3 .
n 10

The deviation of the quotients V N /V X from their mean characterises the nonlinearity of system
X. The maximum deviation is a 1 = 4,4*10 -3 at 100 % of V Xmax (Table B.2). The Type B
standard uncertainty of V N / V X , originating from nonlinearity, is thus a 1 /√3 = 2,54*10 –3
according to (A.7). This value is multiplied by the relevant sensitivity coefficient
c 1 = ∂F X /∂(V N /V X ) = F N – ∆F N = 1,025 – 0,003 * 1,025 = 1,022 to obtain the Type B
uncertainty contribution:

a1 4,4 *10 −3
u B1 = ( FN − ∆FN ) = 1,022 = 2,6 *10 −3 .
3 3

The values and standard uncertainties of all input quantities are entered on the right side of
the model formula (B.4). The model formula can be evaluated manually, using the equations
given in Annex A, or with the aid of special software which should be validated for calculating
uncertainties. The result of the evaluation is summarized in Table B.3. In the last line, the
assigned scale factor F X , its combined standard uncertainty, and the effective degrees of
freedom are given. The large value ν eff = 180 indicates normal distribution of the probable
values of F X , and thus k = 2 is valid (see Annex A, Table A.1).

The estimate of uncertainty is not very precise and high numerical precision is not required.

Finally, the complete result of the calibration of the approved measuring system is expressed
by the assigned scale factor and its expanded uncertainty:

F X = 1,028 ± 11*10 -3 = 1,028(1 ± 0,011) for a coverage probability of not less than 95 %
(k = 2).

The relative expanded uncertainty of the assigned scale factor is U = 1,1 %. Since it contains
an uncertainty contribution of the long-term stability, it can be applied as the expanded
uncertainty of the test voltage until the next calibration of the approved measuring system,
provided the stability of the scale factor is checked by intermediate performance tests (see
4.4).

NOTE 3 The simplified method of Clause 5 delivers an identical relative expanded uncertainty of the assigned
scale factor.
 BS EN 61180:2016
– 46 – IEC 61180:2016 © IEC 2016

Table B.3 – Uncertainty budget of the assigned scale factor F X

Quantity Value Standard Degrees of Sensitivity Contribution to

uncertainty freedom coefficient combined
contribution standard
uncertainty
a
FN 1,025 0,004 50 1,0057 4,0*10 -3
b
∆F N 0,003 0,000577 ∞ -1,0057 -0,58*10 -3

V N /V X 1,0057 0,27*10 -3 a 9 1,022 0,28*10 -3

∆F X ,1 0 2,60*10 -3 b ∞ 1 2,6*10 -3

∆F X ,2 0 1,19*10 -3 b ∞ 1 1,2*10 -3

∆F X ,3 0 1,78*10 -3 b ∞ 1 1,8*10 -3

∆F X ,4 0 1,19*10 -3 b ∞ 1 1,2*10 -3

∆F X ,5 0 1,19*10 -3 b ∞ 1 1,2*10 -3

FX 1,0278 180 5,54*10 -3

a Normal distribution.
b Rectangular distribution.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 47 –

Annex C
(informative)

Atmospheric correction

C.1 Standard reference atmosphere

Temperature t 0 = 20 °C;
Absolute pressure p 0 = 1013 hPa (1 013 mbar);
Absolute humidity h 0 = 11 g/m 3 .

An absolute pressure of 1013 hPa corresponds to the height of 760 mm of the mercury
column in a mercury barometer at 0 °C. If the barometer height is H mm of mercury, the
atmospheric pressure in hectopascal is approximately:
p = 1,333 H hPa
Correction for temperature with respect to the height of the mercury column is considered to
be negligible.

Instruments automatically correcting pressure to sea level are not suitable and should not be
used.

C.2 Atmospheric correction factor

C.2.1 General

Normal laboratory conditions are specified in IEC 60068-1:

Temperature: 15 °C to 35 °C;
Air pressure: 860 hPa to 1060 hPa at sea level;
Relative humidity 25 % to 75 %.

The applied test voltage can be defined under normal laboratory conditions according to
IEC 60060-1:

U = Kt* U0

where
U is the applied test voltage;
U 0 is the specified test voltage;
K t is the atmospheric correction factor.

The applied test voltage is proportional to the correction factor K t that results from the product
of two correction factors:

– the air density correction factor k 1

– the humidity correction factor k 2

Kt = k1* k2

C.2.2 Humidity correction factor k2

No humidity correction can at present be specified for low voltage equipment.

 BS EN 61180:2016
– 48 – IEC 61180:2016 © IEC 2016

However, when the relative humidity exceeds about 80 %, the disruptive discharge applied
test voltage becomes irregular, especially when the disruptive discharge occurs over an
insulating surface.

C.2.3 Air density correction factor k 1

The air density correction factor k 1 depends on the relative air density δ and can be generally
expressed as:

k1 = δm

The exponent m is obtained from curve 1 of Figure A.1 for the specified ranges according to
IEC 60664-1:

m = 0,9163 for 0,001 < d ≤ 0,01 mm;

m = 0,3305 for 0,01 < d ≤ 0,0625 mm;
m = 0,6361 for 0,0625 < d ≤ 1 mm;
m = 0,8539 for 1 < d ≤ 10 mm;
m = 0,9243 for 10 < d ≤ 100 mm.

When the temperatures t and t 0 are expressed in degrees Celsius and the atmospheric
pressures p and p 0 are expressed in the same units, the relative air density is:

p 273 + t0
δ= ∗
p 0 273 + t

The correction is considered reliable for 0,8 < k 1 < 1,05.

In IEC 60664-1 the applied test voltage is given at 2 000 m. For calculation of the air density
correction factor to define the test voltage at any altitude, the air pressure at 2 000 m altitude
p 0 = 80 kPa is to be regarded as absolute pressure.
BS EN 61180:2016
IEC 61180:2016 © IEC 2016 – 49 –

Bibliography

IEC 61000-4-5:2014, Electromagnetic compatibility (EMC) – Part 4-5: Testing and

measurement techniques – Surge immunity test

IEC 61010-1, Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 1: General requirements

IEC 61010-2-030:2010, Safety requirements for electrical equipment for measurement, control,
and laboratory use – Part 2-030: Particular requirements for testing and measuring circuits

_____________
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