CF48100T EMC Test Report - EED32O806770
CF48100T EMC Test Report - EED32O806770
: EED32O806770 Page 1 of 32
Prepared for:
ShenZhen Coslight Power Technology Co ,Ltd
NO.37,XiangshanAvenue, Luotian Third Industrial Zone, Yanluo Street,
Baoan District, Shenzhen City,Guangdong Province, China
Prepared by:
Centre Testing International Group Co., Ltd.
Hongwei Industrial Zone, Bao’an 70 District,
Shenzhen, Guangdong, China
TEL: +86-755-3368 3668
FAX: +86-755-3368 3385
Modification Record
No. Last Report No. Modification Description
1 EED32O804533 First report
Change product model and Applicant
information,In addition to the model name, silk
2 EED32O806770
screen printing and size, other hardware devices
are the same as the model in the original report.
All test data come from the report of No. EED32O804533.
Report No. : EED32O806770 Page 3 of 32
TABLE OF CONTENTS
1. GENERAL INFORMATION.........................................................................................................5
2. TEST SUMMARY......................................................................................................................... 5
3. TEST UNCERTAINTY................................................................................................................. 6
4. PRODUCT INFORMATION AND TEST SETUP.....................................................................6
4.1 PRODUCT INFORMATION.......................................................................................... 6
4.2 TEST SETUP CONFIGURATION................................................................................ 6
4.3 SUPPORT EQUIPMENT............................................................................................... 6
5. FACILITIES AND ACCREDITATIONS..................................................................................... 7
5.1 TEST FACILITY.............................................................................................................. 7
5.2 TEST EQUIPMENT LIST...............................................................................................7
5.3 LABORATORY ACCREDITATIONS AND LISTINGS...............................................8
6. CONDUCTED DISTURBANCE..................................................................................................9
6.1 LIMITS.............................................................................................................................. 9
6.2 BLOCK DIAGRAM OF TEST SETUP......................................................................... 9
6.3 TEST PROCEDURE...................................................................................................... 9
6.4 GRAPHS AND DATA...................................................................................................10
7. RADIATED DISTURBANCE (RE)........................................................................................... 12
7.1 LIMITS............................................................................................................................ 12
7.2 BLOCK DIAGRAM OF TEST SETUP....................................................................... 12
7.3 TEST PROCEDURE.................................................................................................... 13
7.4 GRAPHS AND DATA...................................................................................................14
8. IMMUNITY TEST........................................................................................................................ 18
8.1 ELECTROSTATIC DISCHARGE (ESD)................................................................... 19
8.1.1 TEST SPECIFICATION................................................................................19
8.1.2 BLOCK DIAGRAM OF TEST SETUP........................................................ 19
8.1.3 TEST PROCEDURE.....................................................................................19
8.1.4 RESULTS & PERFORMANCE................................................................... 20
8.2 RADIO-FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY....................... 21
8.2.1 TEST SPECIFICATION................................................................................21
8.2.2 BLOCK DIAGRAM OF TEST SETUP........................................................ 21
8.2.3 TEST PROCEDURE.....................................................................................22
8.2.4 RESULTS & PERFORMANCE................................................................... 22
8.3 ELECTRICAL FAST TRANSIENTS (EFT)............................................................... 23
8.3.1 TEST SPECIFICATION................................................................................23
8.3.2 BLOCK DIAGRAM OF TEST SETUP........................................................ 23
8.3.3 TEST PROCEDURE.....................................................................................23
8.3.4 RESULTS & PERFORMANCE................................................................... 23
8.4 SURGES........................................................................................................................ 24
8.4.1 TEST SPECIFICATION................................................................................24
8.4.2 BLOCK DIAGRAM OF TEST SETUP........................................................ 24
8.4.3 TEST PROCEDURE.....................................................................................24
8.4.4 RESULTS & PERFORMANCE................................................................... 25
8.5 RADIO-FREQUENCY CONTINUOUS CONDUCTED IMMUNITY...................... 26
8.5.1 TEST SPECIFICATION................................................................................26
8.5.2 BLOCK DIAGRAM OF TEST SETUP........................................................ 26
8.5.3 TEST PROCEDURE.....................................................................................26
8.5.4 RESULTS & PERFORMANCE................................................................... 27
Report No. : EED32O806770 Page 4 of 32
APPENDIX 1 PHOTOGRAPHS OF TEST SETUP................................................................... 28
APPENDIX 2 PHOTOGRAPHS OF PRODUCT........................................................................ 32
(Note: N/A means not applicable)
Report No. : EED32O806770 Page 5 of 32
1. GENERAL INFORMATION
Applicant: ShenZhen Coslight Power Technology Co ,Ltd
NO.37,XiangshanAvenue, Luotian Third Industrial Zone,
Yanluo Street, Baoan District, Shenzhen City,Guangdong
Province, China
Manufacturer: ShenZhen Coslight Power Technology Co ,Ltd
NO.37,XiangshanAvenue, Luotian Third Industrial Zone,
Yanluo Street, Baoan District, Shenzhen City,Guangdong
Province, China
Factory: ShenZhen Coslight Power Technology Co ,Ltd
NO.37,XiangshanAvenue, Luotian Third Industrial Zone,
Yanluo Street, Baoan District, Shenzhen City,Guangdong
Province, China
EMC Directive: 2014/30/EU
Product: Rechargeable Lithium-ion Battery
Trade mark: Coslight
Model/Type reference: CF48100T
Serial Number: N/A
Report Number: EED32O806770
State of Sample(s): Normal
Sample Received Date: Mar 30, 2022
Sample tested Date: Mar 30, 2022 to Apr 15, 2022
The tested sample(s) and the sample information are provided by the client.
2. TEST SUMMARY
The Product has been tested according to the following specifications:
EMISSION
Standard Test Item Test
EN 55032 Conducted disturbance N/A1
EN 55032 Radiated disturbance Yes
EN 61000-3-2 Harmonic current emissions N/A3
3. TEST UNCERTAINTY
Where relevant, the following test uncertainty levels have been estimated for tests
performed on the Product as specified in CISPR 16-4-2. This uncertainty represents an
expanded uncertainty expressed at approximately the 95% confidence level using a
coverage factor of k=2.
Test item Value (dB)
Radiated disturbance (30MHz to 1GHz) 4.9
Radiated disturbance (1GHz to 6GHz) 4.7
Notes:
1. All the equipment/cables were placed in the worst-case configuration to maximize the emission during
the test.
2. Grounding was established in accordance with the manufacturer’s requirements and conditions for the
intended use.
Report No. : EED32O806770 Page 7 of 32
Shielding Room No. 3 - EFT / Surges Test (IEC 61000-4-4) (IEC 61000-4-5)
Equipment Manufacturer Model Serial No. Due Date
Compact Generator EM-Test UCS500M/6B V0603101093 04/21/2023
30-230 40
230-1000 47
limit above 1G at 3m
Frequency (GHz) dB(μV/m)
Average peak
1-3 50 70
3-6 54 74
NOTE: The lower limit shall apply at the transition frequencies.
30MHz ~ 1GHz:
Above 1GHz:
Report No. : EED32O806770 Page 13 of 32
7.3 TEST PROCEDURE
30MHz ~ 1GHz:
a. The Product was placed on the non-conductive turntable 0.8m above the ground at a
chamber.
b. Set the spectrum analyzer/receiver in Peak detector, Max Hold mode, and 120 kHz RBW.
Record the maximum field strength of all the pre-scan process in the full band when the
antenna is varied between 1~4 m in both horizontal and vertical, and the turntable is rotated
from 0 to 360 degrees.
c. For each frequency whose maximum record was higher or close to limit, measure its QP
value: vary the antenna’s height and rotate the turntable from 0 to 360 degrees to find the
height and degree where Product radiated the maximum emission, then set the test
frequency analyzer/receiver to QP Detector and specified bandwidth with Maximum Hold
Mode, and record the maximum value.
Above 1GHz:
a. The Product was placed on the non-conductive turntable 0.8m above the ground at a
chamber.
b. Set the spectrum analyzer/receiver in Peak detector, Max Hold mode, and 1MHz RBW.
Record the maximum field strength of all the pre-scan process in the full band when the
antenna is varied in both horizontal and vertical, and the turntable is rotated from 0 to 360
degrees.
c. For each frequency whose maximum record was higher or close to limit, measure its AV
value: rotate the turntable from 0 to 360 degrees to find the degree where Product radiated
the maximum emission, then set the test frequency analyzer/receiver to AV value and
specified bandwidth with Maximum Hold Mode, and record the maximum value.
Report No. : EED32O806770 Page 14 of 32
30MHz ~ 1GHz:
Product : Rechargeable Lithium-ion Battery
Model/Type reference : CF48100T
Power : DC 48V Temperature : 22℃
Mode : Charging Humidity : 53%
Polarization : Horizontal Press : 101kPa
Report No. : EED32O806770 Page 15 of 32
Note:
1. Margin=Measurement-Limit.
2. Measurement=Reading_Level+Correct Factor.
3. Correct Factor=Ant Factor+Cable loss.
Report No. : EED32O806770 Page 18 of 32
8. IMMUNITY TEST
After the test, the equipment shall continue to operate as intended without
operator intervention; no degradation of performance or loss of function is
allowed, below a performance level specified by the manufacturer, when the
CRITERION B
equipment is used as intended. The performance level may be replaced by a
permissible loss of performance.
Min. No. of
Discharge Voltage Discharge per Required
Discharge Position Test Result
Method (±kV) polarity Level
(Each Point)
Conductive Surfaces 8 10 B A
Contact
Indirect Discharge HCP 8 10 B A
Discharge
Indirect Discharge VCP 8 10 B A
Air Slots, Apertures, and
15 10 B A
Discharge Insulating Surfaces
Report No. : EED32O806770 Page 21 of 32
8.2 RADIO-FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY
8.2.1 TEST SPECIFICATION
Basic Standard : EN 55035 & IEC 61000-4-3
Test Port : Enclosure port
Step Size : 1%
Modulation : 1kHz, 80% AM
Dwell Time : 1 second
Polarization : Horizontal & Vertical
8.2.2 BLOCK DIAGRAM OF TEST SETUP
80-1000MHz:
1000-6000MHz:
Report No. : EED32O806770 Page 22 of 32
Voltage
Coupling Polarity Required Level Test Result
(kV)
DC mains power port 2 ± B A
Report No. : EED32O806770 Page 24 of 32
8.4 SURGES
8.4.1 TEST SPECIFICATION
Basic Standard : EN 55035 & IEC 61000-4-5
Test Port : input DC mains power port
Wave-Shape : Open Circuit Voltage - 1.2 / 50 us
Short Circuit Current - 8 / 20 us
Pulse Repetition Rate : 1 pulse / min.
8.4.2 BLOCK DIAGRAM OF TEST SETUP
Voltage
Coupling Line Polarity Required Level Test Result
(kV)
L-N 2 ± B A
L - PE 4 ± B A
N - PE 4 ± B A
Report No. : EED32O806770 Page 26 of 32
View of Product-1
The test report is effective only with both signature and specialized stamp. The result(s) shown in this
report refer only to the sample(s) tested. Without written approval of CTI, this report can’t be reproduced
except in full.
*** End of Report ***