CERTIFICATE OF ACCREDITATION

The ANSI National Accreditation Board

Hereby attests that

Transcat - Indianapolis
2845 Tobey Drive
Indianapolis, IN 46219
Fulfills the requirements of

ISO/IEC 17025:2017
and national standard

ANSI/NCSL Z540-1-1994 (R2002)

In the fields of

CALIBRATION and DIMENSIONAL MEASUREMENT

This certificate is valid only when accompanied by a current scope of accreditation document.
The current scope of accreditation can be verified at www.anab.org.

Jason Stine, Vice President

Expiry Date: 07 September 2025
Certificate Number: AC-2489.30

This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017.
This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory
quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017
AND
ANSI/NCSL Z540-1-1994 (R2002)

Transcat - Indianapolis
2845 Tobey Drive
Indianapolis, IN 46219
Kevin Broderick (317) 487-2378

CALIBRATION AND DIMENSIONAL MEASUREMENT

Valid to: September 7, 2025 Certificate Number: AC-2489.30

CALIBRATION
Acoustics and Vibration
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
94 dB
250 Hz 0.4 dB
Sound Level Measuring 1 kHz 0.4 dB Comparison to
Devices 1 114 dB Sound Level Calibrator
250 Hz 0.4 dB
1 kHz 0.4 dB
(35 to 130) dB Comparison to
Sound Level – Measure 1
63 Hz to 8 kHz 1.8 dB Sound Level Meter

Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
4 pH 0.012 pH
Comparison to
pH Meters 1,2 7 pH 0.012 pH
Accredited Solutions
10 pH 0.012 pH

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Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
5 µS/cm 0.32 µS/cm
10 µS/cm 0.32 µS/cm
100 µS/cm 0.82 µS/cm
Comparison to
Conductivity Meters 1,2 1 000 µS/cm 3.3 µS/cm
Accredited Solutions
10 000 µS/cm 36 µS/cm
100 000 µS/cm 300 µS/cm
150 000 µS/cm 590 µS/cm
(1.3 to 1.395) nD 0.0006 nD Comparison to
Refractometers 1
(0 to 30) % Brix 0.032 % Brix Accredited Solutions
Gas Monitors and Detectors 1
CO (Carbon Monoxide) 0.002 5 % CO 0.000 15 % CO
0.005 % CO 0.000 22 % CO
0.01 % CO 0.000 28 % CO
0.03 % CO 0.000 63 % CO

CO2 (Carbon Dioxide) 1 % CO2 0.025 % CO2

3 % CO2 0.068 % CO2
5 % CO2 0.11 % CO2
15 % CO2 0.31 % CO2 Comparison to
Accredited Gases
H2S (Hydrogen Sulfide) 0.002 5 % H2S 0.000 13 % H2S

LEL (Methane) 20 % LEL 2 % LEL

50 % LEL 2.2 % LEL

O2 (Oxygen) 18 % O2 0.48 % O2
20.9 % O2 0.53 % O2

SO2 (Sulfur Dioxide) 0.001 % SO2 0.000 03 % SO2

Electrical – DC/Low Frequency

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
pH Meter Simulation 1
(0 to 15) pH 0.001 pH Fluke 5522A
(Electrical)
Multiproduct Calibrator

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(10 to 100) µS 0.08 µS
Conductivity Meter (101 to 1000) µS 0.09 µS Comparison to
Simulation 1 (1001 to 10 000) µS 0.08 µS Fluke 5522A
(Resistance) (10 001 to 100 000) µS 0.06 µS Multiproduct Calibrator
(100 001 to 1 000 000) µS 0.04 µS
Up to 220 µA
(10 to 20) Hz 0.025 % of reading + 16 nA
(20 to 40) Hz 0.016 % of reading + 10 nA
40 Hz to 1 kHz 0.011 % of reading + 8 nA
(1 to 5) kHz 0.028 % of reading + 12 nA
(5 to 10) kHz 0.11 % of reading + 65 nA
(0.22 to 2.2) mA
(10 to 20) Hz 0.025 % of reading + 40 nA
(20 to 40) Hz 0.016 % of reading + 35 nA
40 Hz to 1 kHz 0.011 % of reading + 35 nA
(1 to 5) kHz 0.021 % of reading + 0.11 µA
(5 to 10) kHz 0.11 % of reading + 0.65 µA
(2.2 to 22) mA
Comparison to
(10 to 20) Hz 0.025 % of reading + 0.4 µA
AC Current – Source 1 Fluke 5730A/03
(20 to 40) Hz 0.016 % of reading + 0.35 µA
Multiproduct Calibrator
40 Hz to 1 kHz 0.011 % of reading + 0.35 µA
(1 to 5) kHz 0.021 % of reading + 0.55 µA
(5 to 10) kHz 0.11 % of reading + 10 µA
(22 to 220) mA
(10 to 20) Hz 0.025 % of reading + 4 µA
(20 to 40) Hz 0.016 % of reading + 3.5 µA
40 Hz to 1 kHz 0.011 % of reading + 2.5 µA
(1 to 5) kHz 0.021 % of reading + 3.5 µA
(5 to 10) kHz 0.11 % of reading + 10 µA
(0.22 to 2.2) A
20 Hz to 1 kHz 0.025 % of reading + 35 µA
(1 to 5) kHz 0.045 % of reading + 80 µA
(5 to 10) kHz 0.7 % of reading + 0.16 mA
(2.2 to 11) A Comparison to
40 Hz to 1 kHz 0.048 % of reading + 0.17 mA Fluke 5730A/03
AC Current – Source 1 (1 to 5) kHz 0.096 % of reading + 0.38 mA Multiproduct Calibrator,
(5 to 10) kHz 0.36 % of reading + 0.75 mA Fluke 5725A
Amplifier

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(11 to 20.5) A
Comparison to
(45 to 100) Hz 0.095 % of reading + 3.9 mA
AC Current – Source 1 Fluke 5522A
100 Hz to 1 kHz 0.12 % of reading + 3.9 mA
Multiproduct Calibrator
(1 to 5) kHz 2.3 % of reading + 3.9 mA
(20 to 150) A
Comparison to
(45 to 65) Hz 0.31 % of reading + 26 mA
AC Clamp-on Ammeters Fluke 5522A
(65 to 440) Hz 0.84 % of reading + 47 mA
(Toroidal Type) Multiproduct Calibrator,
(150 to 1 000) A
Transformer Type Sensor 1 Fluke 5500A/Coil
(45 to 65) Hz 0.35 % of reading + 0.12 A
50-turn Coil
(65 to 440) Hz 1.2 % of reading + 0.22 A
(20 to 150) A
Comparison to
(45 to 65) Hz 0.58 % of reading + 0.25 A
AC Clamp-on Ammeters Fluke 5522A
(65 to 440) Hz 1.1 % of reading + 0.25 A
(Non-Toroidal Type) Multiproduct Calibrator,
(150 to 1 000) A
Hall Effect Sensor 1 Fluke 5500A/Coil
(45 to 65) Hz 0.6 % of reading + 0.9 A
50-turn Coil
(65 to 440) Hz 1.3 % of reading + 0.92 A
(1 to 6) kA Comparison to
(10 to 300) Hz 0.6 % of reading Fluke 5522A
AC Clamp-on Ammeter (1 to 2) kA Multiproduct Calibrator,
(Non-Toroidal Type) (300 to 440) Hz 0.8 % of reading Fluke 52120A
Hall Effect Sensor 1 (2 to 6) kA Transconductance
(300 to 440) Hz 0.66 % of reading Amplifier,
3 kA and 6 kA Coil
Up to 200 μA
1 Hz to 10 kHz 0.031 % of reading + 20 nA
(10 to 30) kHz 0.071 % of reading + 20 nA
(30 to 100) kHz 0.4 % of reading + 20 nA
(0.2 to 2) mA
(1 to 10) Hz 0.031 % of reading + 0.2 µA
10 Hz to 10 kHz 0.03 % of reading + 0.2 µA
(10 to 30) kHz 0.071 % of reading + 0.2 µA
Comparison to
(30 to 100) kHz 0.4 % of reading + 0.2 µA
AC Current – Measure 1 Fluke 8508A
(2 to 20) mA
8.5 Digit Multimeter
(1 to 10) Hz 0.031 % of reading + 2 µA
10 Hz to 10 kHz 0.03 % of reading + 2 µA
(10 to 30) kHz 0.071 % of reading + 2 µA
(30 to 100) kHz 0.4 % of reading + 2 µA
(20 to 200) mA
1 Hz to 10 Hz 0.031 % of reading + 20 µA
10 Hz to 10 kHz 0.029 % of reading + 20 µA
(10 to 30) kHz 0.063 % of reading + 20 µA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0.2 to 2) A
10 Hz to 2 kHz 0.062 % of reading + 0.2 mA
(2 to 10) kHz 0.074 % of reading + 0.2 mA Comparison to
AC Current – Measure 1 (10 to 30) kHz 0.3 % of reading + 0.2 mA Fluke 8508A
(2 to 20) A 8.5 Digit Multimeter
10 Hz to 2 kHz 0.082 % of reading + 2 mA
(2 to 10) kHz 0.25 % of reading + 2 mA
Up to 2.2 mV
(10 to 20) Hz 0.16 % of reading + 4 µV
(20 to 40) Hz 0.1 % of reading + 4 µV
40 Hz to 20 kHz 0.078 % of reading + 4 µV
(20 to 50) kHz 0.13 % of reading + 4 µV
(50 to 100) kHz 0.17 % of reading + 5 µV
(100 to 300) kHz 0.33 % of reading + 10 µV
(300 to 500) kHz 0.47% of reading + 20 µV
500 kHz to 1 MHz 0.58 % of reading + 20 µV
(2.2 to 22) mV
(10 to 20) Hz 0.042 % of reading + 4 µV
(20 to 40) Hz 0.03 % of reading + 4 µV
40 Hz to 20 kHz 0.014 % of reading + 4 µV Comparison to
1
AC Voltage – Source (20 to 50) kHz 0.03 % of reading + 4 µV Fluke 5730A/03
(50 to 100) kHz 0.058 % of reading + 5 µV Multiproduct Calibrator
(100 to 300) kHz 0.12 % of reading + 10 µV
(300 to 500) kHz 0.16 % of reading + 20 µV
500 kHz to 1 MHz 0.27 % of reading + 20 µV
(22 to 220) mV
(10 to 20) Hz 0.028 % of reading + 12 µV
(20 to 40) Hz 0.011 % of reading + 7 µV
40 Hz to 20 kHz 0.009 % of reading + 7 µV
(20 to 50) kHz 0.021 % of reading + 7 µV
(50 to 100) kHz 0.047 % of reading + 17 µV
(100 to 300) kHz 0.091 % of reading + 20 µV
(300 to 500) kHz 0.14 % of reading + 25 µV
500 kHz to 1 MHz 0.28 % of reading + 45 µV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0.22 to 2.2) V
(10 to 20) Hz 0.027 % of reading + 40 µV
(20 to 40) Hz 0.01 % of reading + 15 µV
40 Hz to 20 kHz 0.005 % of reading + 8 µV
(20 to 50) kHz 0.008 % of reading + 10 µV
(50 to 100) kHz 0.012 % of reading + 30 µV
(100 to 300) kHz 0.043 % of reading + 80 µV
(300 to 500) kHz 0.01 % of reading + 0.2 mV
500 kHz to 1 MHz 0.18 % of reading + 0.3 mV
(2.2 to 22) V
(10 to 20) Hz 0.028 % of reading + 0.4 mV
(20 to 40) Hz 0.01 % of reading + 0.15 mV
40 Hz to 20 kHz 0.005 % of reading + 50 µV Comparison to
AC Voltage – Source 1 (20 to 50) kHz 0.008 % of reading + 0.1 mV Fluke 5730A/03
(50 to 100) kHz 0.011 % of reading + 0.2 mV Multiproduct Calibrator
(100 to 300) kHz 0.03 % of reading + 0.6 mV
(300 to 500) kHz 0.1 % of reading + 2 mV
500 kHz to 1 MHz 0.17 % of reading + 3.2 mV
(22 to 220) V
(10 to 20) Hz 0.028 % of reading + 4 mV
(20 to 40) Hz 0.01 % of reading + 1.5 mV
40 Hz to 20 kHz 0.006 % of reading + 0.6 mV
(20 o 50) kHz 0.009 % of reading + 1 mV
(50 to 100) kHz 0.016 % of reading + 2.5 mV
(100 to 300) kHz 0.09 % of reading + 16 mV
(300 to 500) kHz 0.44 % of reading + 40 mV
500 kHz to 1 MHz 0.8 % of reading + 80 mV
(220 to 1 100) V Comparison to
40 Hz to 1 kHz 0.011 % of reading + 4 mV Fluke 5730A/03
AC Voltage – Source 1 (1 to 20) kHz 0.017 % of reading + 6 mV Multiproduct Calibrator,
(20 to 30) kHz 0.061 % of reading + 11 mV Fluke 5725A
Amplifier
Comparison to
AC Voltage – Source 1 (220 to 750) V Fluke 5730A/03
Extended Frequency (30 to 50) kHz 0.061 % of reading + 11 mV Multiproduct Calibrator,
Ranges (50 to 100) kHz 0.23 % of reading + 45 mV Fluke 5725A
Amplifier

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 200 mV
(1 to 10) Hz 0.021 % of reading + 14 µV
(10 to 40) Hz 0.017 % of reading + 4 µV
(40 to 100) Hz 0.014 % of reading + 4 µV
(0.1 to 2) kHz 0.013 % of reading + 2 µV
(2 to 10) kHz 0.016 % of reading + 4 µV
(10 to 30) kHz 0.04 % of reading + 8 µV
(30 to 100) kHz 0.09 % of reading + 20 µV
(0.2 to 2) V
(1 to 10) Hz 0.019 % of reading + 0.12 mV
(10 to 40) Hz 0.014 % of reading + 20 µV
(40 to 100) Hz 0.011 % of reading + 20 µV
(0.1 to 2) kHz 89 µV/V of reading + 20 µV
(2 to 10) kHz 0.013 % of reading + 20 µV
(10 to 30) kHz 0.026 % of reading + 40 µV
(30 to 100) kHz 0.068 % of reading + 0.2 mV
(100 to 300) kHz 0.37 % of reading + 2 mV
(0.3 to 1) MHz 1.3 % of reading + 20 mV
(2 to 20) V
(1 to 10) Hz 0.019 % of reading + 1.2 mV
Comparison to
(10 to 40) Hz 0.014 % of reading + 0 .2 mV
AC Voltage – Measure 1 Fluke 8508A
(40 to 100) Hz 0.011 % of reading + 0.2 mV
8.5 Digit Multimeter
(0.1 to 2) kHz 90 µV/V + 0.2 mV
(2 to 10) kHz 0.013 % of reading + 0.2 mV
(10 to 30) kHz 0.026 % of reading + 0.4 mV
(30 to 100) kHz 0.068 % of reading + 2 mV
(100 to 300) kHz 0.37 % of reading + 20 mV
(0.3 to 1) MHz 2.2 % of reading + 0.2V
(20 to 200) V
(1 to 10) Hz 0.02 % of reading + 12 mV
(10 to 40) Hz 0.014 % of reading + 2 mV
(40 to 100) Hz 0.011 % of reading + 2 mV
(0.1 to 2) kHz 90 µV/V + 2 mV
(2 to 10) kHz 0.013 % of reading + 2 mV
(10 to 30) kHz 0.026 % of reading + 4 mV
(30 to 100) kHz 0.068 % of reading + 20 mV
(200 to 1 000) V
(1 to 10) Hz 0.019 % of reading + 70 mV
(10 to 40) Hz 0.015 % of reading + 20 mV
(0.04 to 10) kHz 0.014 % of reading + 20 mV
(10 to 30) kHz 0.027 % of reading + 40 mV
(30 to 100) kHz 0.071 % of reading + 0.2 V

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Keysight 34401A
Up to 28 kV
AC High Voltage – Measure 1 6.5 Digit Multimeter,
60 Hz 5.2 % of reading + 1.7 V
Fluke 80K-40
High Voltage Probe
(0.22 to 0.4) nF 0.4 % of reading + 7.8 pF
(0.4 to 1.1) nF 0.4 % of reading + 7.8 pF
(1.1 to 3.3) nF 0.4 % of reading + 7.8 pF
(3.3 to 11) nF 0.21 % of reading + 7.8 pF
(11 to 33) nF 0.2 % of reading + 78 pF Comparison to
Capacitance – Source 1
(33 to 110) nF 0.21 % of reading + 78 pF Fluke 5522A
(Simulation)
(110 to 330) nF 0.2 % of reading + 0.23 nF Multiproduct Calibrator
(0.33 to 1.1) µF 0.21 % of reading + 0.78 nF
(1.1 to 3.3) µF 0.21 % of reading + 2.3 nF
(3.3 to 11) µF 0.2 % of reading + 7.8 nF
(11 to 33) µF 0.32 % of reading + 23 nF
(33 to 110) µF 0.37 % of reading + 78 nF
(110 to 330) µF 0.38 % of reading + 0.23 µF
(0.33 to 1.1) mF 0.35 % of reading + 0.78 µF Comparison to
Capacitance – Source 1
(1.1 to 3.3) mF 0.35 % of reading + 2.3 µF Fluke 5522A
(Simulation)
(3.3 to 11) mF 0.35 % of reading + 7.8 µF Multiproduct Calibrator
(11 to 33) mF 0.58 % of reading + 23 µF
(33 to 110) mF 0.85 % of reading + 78 µF
1 kHz
(1 to 1 000) pF 0.5 fF/pF + 23 fF Comparison to
Capacitance – Measure 1
(1 to 1 000) nF 0.5 pF/nF + 0.88 pF Hameg LCR Meter
(1 to 1 000) µF 4.2 nF/µF
(0 to 220) µA 40 µA/A + 6 nA
(0.22 to 2.2) mA 35 µA/A + 7 nA Comparison to
DC Current – Source 1 (2.2 to 22) mA 35 µA/A + 40 nA Fluke 5730A/03
(22 to 220) mA 45 µA/A + 0.7 µA Multiproduct Calibrator
(0.22 to 2.2) A 80 µA/A + 12 µA
(2.2 to 3) A 0.3 mA/A + 31 µA Comparison to
DC Current – Source 1 (3 to 11) A 0.51 mA/A + 0.39 mA Fluke 5522A
(11 to 20.5) A 0.93 mA/A + 0.58 mA Multiproduct Calibrator

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Fluke 5522A
Multiproduct Calibrator,
DC Clamp-on Ammeters (20 to 150) A 0.51 % of reading + 0.14 A
Fluke 5500A/COIL,
(Non-Toroidal Type) (150 to 1 000) A 0.51 % of reading + 0.5 A
Fluke 55120A
Hall Effect Sensor 1 (1 000 to 5 000) A 0.58 % of reading
Transconductance
Amplifier,
1 kA and 6 kA Coils
Up to 200 µA 13 µA/A + 0.31 nA
(0.2 to 2) mA 13 µA/A + 3.1 nA
Comparison to
1 (2 to 20) mA 14 µA/A + 31 nA
DC Current – Measure Fluke 8508A
(20 to 200) mA 47 µA/A + 0.62 µA
8.5 Digit Multimeter
(0.2 to 2) A 0.18 mA/A + 12 µA
(2 to 20) A 0.39 mA/A + 0.31 mA
Comparison to
1 Fluke 8508A
DC Current – Measure (0 to 500) A 0.2 mA/A + 0.16 A
8.5 Digit Multimeter,
DC Current Shunt
(0 to 220) mV 7.5 µV/V + 0.4 µV
(0.22 to 2.2) V 5 µV/V + 0.7 µV
Comparison to
(2.2 to 11) V 3.5 µV/V + 2.5 µV
DC Voltage – Source 1 Fluke 5730A/03
(11 to 22) V 3.5 µV/V + 4 µV
Multiproduct Calibrator
(22 to 220) V 5 µV/V + 40 µV
(220 to 1 100) V 6.5 µV + 0.4 mV
Comparison to
DC Voltage – Source 1 Fluke 732A
10 V 0.31 µV/V
(Fixed Point) DC Voltage
Reference Standard
Up to 200 mV 5.2 µV/V + 90 nV
(0.2 to 2) V 3.6 µV/V + 0.39 µV Comparison to
DC Voltage – Measure 1 (2 to 20) V 3.5 µV/V + 3.9 µV Fluke 8508A
(20 to 200) V 5.5 µV/V + 39 µV 8.5 Digit Multimeter
(200 to 1 000) V 5.5 µV/V + 0.47 mV
Comparison to
(1 to 20) kV 2 % of reading Keysight 34401A
DC High Voltage – Measure 1 (20 to 35) kV 1 % of reading 6.5 Digit Multimeter,
(35 to 40) kV 2 % of reading Fluke 80K-40
High Voltage Probe

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
AC Power – Source 1,2,4
PF = 1
(3.3 to 9) mA (10 to 65) Hz
110 µW to 3 mW 0.13 % of reading
3 mW to 9 W 0.077 % of reading
(9 to 33) mA (10 to 65) W
300 µW to 10 mW 0.089 % of reading
10 mW to 33 W 0.077 % of reading
(33 to 90) mA (10 to 65) Hz
(1 to 30) mW 0.071 % of reading
30 mW to 90 W 0.057 % of reading
(90 to 330) mA (10 to 65) Hz Comparison to
(3 to 100) mW 0.089 % of reading Fluke 5520A
100 mW to 300 W 0.078 % of reading Multiproduct Calibrator
(330 to 900) mA (10 to 65) Hz
(11 to 300) mW 0.071 % of reading
300 mW to 900 W 0.081 % of reading
900 mA to 2.2 A (10 to 65) Hz
(30 to 720) mW 0.089 % of reading
0.72 W to 2 kW 0.079 % of reading
(2.2 to 4.5) A (10 to 65) Hz
80 mW to 1.4 W 0.088 % of reading
1.4 W to 4.5 kW 0.18 % of reading
(4.5 to 20.5) A (10 to 65) Hz
150 mW to 20kW 0.17 % of reading
DC Power – Source 1
330 µW to 330 mA 11 µW to 1.1 mW 0.024 % of reading
(1.1 to 110) mW 0.027 % of reading
110 mW to 110 W 0.024 % of reading
(110 to 330) W 0.018 % of reading
Comparison to
330 mA to 3 A 11 µW to 110 mW 0.044 % of reading Fluke 5520A
110 mW to 990 W 0.053 % of reading Multiproduct Calibrator
990 W to 3 kW 0.01 % of reading

(3 to 20.5) A 99 mW to 0.99 W 0.088 % of reading

0.99 W to 6.8 kW 0.07 % of reading
(6.8 to 20.5) kW 0.04 % of reading

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0 to 90)°
(10 to 65) Hz 0.11°
(65 to 500) Hz 0.21° Comparison to
Phase – Source 1 500 Hz to 1 kHz 0.39° Fluke 5522A
(1 to 5) kHz 1.9° Multiproduct Calibrator
(5 to 10) kHz 3.9°
(10 to 30) kHz 7.8°
Pt 385, 100 Ω
(-200 to -80) °C 0.039 °C
(-80 to 0) °C 0.039 °C
(0 to 100) °C 0.054 °C
(100 to 300) °C 0.07 °C
(300 to 400) °C 0.078 °C
(400 to 630) °C 0.093 °C
(630 to 800) °C 0.18 °C
Pt 385, 200 Ω
(-200 to -80) °C 0.031 °C
(-80 to 0) °C 0.031 °C
(0 to 100) °C 0.031 °C
(100 to 260) °C 0.039 °C
(260 to 300) °C 0.093 °C
(300 to 400) °C 0.1 °C
(400 to 600) °C 0.11 °C
(600 to 630) °C 0.12 °C Comparison to
Electrical Simulation of RTD
Pt 385, 500 Ω Fluke 5522A
Indicating Devices – Source 1
(-200 to -80) °C 0.031 °C Multiproduct Calibrator
(-80 to 0) °C 0.039 °C
(0 to 100) °C 0.039 °C
(100 to 260) °C 0.047 °C
(260 to 300) °C 0.062 °C
(300 to 400) °C 0.062 °C
(400 to 600) °C 0.07 °C
(600 to 630) °C 0.085 °C
Pt 385, 1 kΩ
(-200 to -80) °C 0.023 °C
(-80 to 0) °C 0.023 °C
(0 to 100) °C 0.031 °C
(100 to 260) °C 0.039 °C
(260 to 300) °C 0.047 °C
(300 to 400) °C 0.054 °C
(400 to 600) °C 0.054 °C
(600 to 630) °C 0.18 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Pt 3916, 100 Ω
(-200 to -190) °C 0.19 °C
(-190 to -80) °C 0.031 °C
(-80 to 0) °C 0.039 °C
(0 to 100) °C 0.047 °C
(100 to 260) °C 0.054 °C
(260 to 300) °C 0.062 °C
(300 to 400) °C 0.07 °C
(400 to 600) °C 0.078 °C
(600 to 630) °C 0.18 °C
Pt 3926, 100 Ω Comparison to
Electrical Simulation of RTD
(-200 to -80) °C 0.039 °C Fluke 5522A
Indicating Devices – Source 1
(-80 to 0) °C 0.039 °C Multiproduct Calibrator
(0 to 100) °C 0.054 °C
(100 to 300) °C 0.07 °C
(300 to 400) °C 0.078 °C
(400 to 630) °C 0.093 °C
PtNi 385, 120 Ω
(-80 to 0) °C 0.062 °C
(0 to 100) °C 0.062 °C
(100 to 260) °C 0.1 °C
Cu 427, 10 Ω
(-100 to 260) °C 0.23 °C
Type B
(600 to 800) °C 0.35 °C
(800 to 1 000) °C 0.28 °C
(1 000 to 1 550) °C 0.24 °C
(1 550 to 1 820) °C 0.26 °C
Type C
(0 to 150) °C 0.24 ºC
Electrical Simulation of (150 to 650) °C 0.21 ºC Comparison to
Thermocouple Indicating (650 to 1000) °C 0.24 ºC Fluke 5522A
1
Devices – Source/Measure (1 000 to 1 800) °C 0.39 ºC Multiproduct Calibrator
(1 800 to 2 316) °C 0.65 ºC
Type E
(-250 to -100) °C 0.39 °C
(-100 to -25) °C 0.13 °C
(-25 to 350) °C 0.12 °C
(350 to 650) °C 0.13 °C
(650 to 1 000) °C 0.17 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Type J
(-210 to -100) °C 0.21 °C
(-100 to -30) °C 0.13 °C
(-30 to 150) °C 0.12 °C
(150 to 760) °C 0.14 °C
(760 to 1 200) °C 0.18 °C
Type K
(-200 to -100) °C 0.26 °C
(-100 to -25) °C 0.15 °C
(-25 to 120) °C 0.13 °C
(120 to 1 000) °C 0.21 °C
(1 000 to 1 372) °C 0.31 °C
Type L
(-200 to -100) °C 0.29 °C
(-100 to 800) °C 0.21 °C
(800 to 900) °C 0.14 °C
Type N
(-200 to -100) °C 0.31 °C
(-100 to -25) °C 0.18 °C
Electrical Simulation of Comparison to
(-25 to 120) °C 0.15 °C
Thermocouple Indicating Fluke 5522A
(120 to 410) °C 0.15 °C
Devices – Source/Measure 1 Multiproduct Calibrator
(410 to 1 300) °C 0.21 °C
Type R
(0 to 250) °C 0.46 °C
(250 to 400) °C 0.29 °C
(400 to 1 000) °C 0.26 °C
(1 000 to 1 767) °C 0.32 °C
Type S
(0 to 250) °C 0.45 °C
(250 to 1 000) °C 0.3 °C
(1 000 to 1 400) °C 0.29 °C
(1 400 to 1 767) °C 0.36 °C
Type T
(-250 to -150) °C 0.49 °C
(-150 to 0) °C 0.19 °C
(0 to 120) °C 0.13 °C
(120 to 400) °C 0.12 °C
Type U
(-200 to 0) °C 0.44 °C
(0 to 600) °C 0.21 °C

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Page 13 of 30
Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Magnetic Flux Density – Comparison to
Source 1,5 (0 to 35) G 0.26 % of reading Digital Multimeter,
(Gauss Meters) Helmholtz Coils
Up to 11 Ω 32 µΩ/Ω + 0.78 mΩ
(11 to 33) Ω 24 µΩ/Ω + 1.2 mΩ
(33 to 110) Ω 22 µΩ/Ω + 1.1 mΩ
(110 to 330) Ω 22 µΩ/Ω + 1.6 mΩ
(0.33 to 1.1) kΩ 22 µΩ/Ω + 1.6 mΩ
(1.1 to 3.3) kΩ 22 µΩ/Ω + 1.6 mΩ
(3.3 to 11) kΩ 22 µΩ/Ω + 1.6 mΩ
(11 to 33) kΩ 22 µΩ/Ω + 0.16 Ω Comparison to
Resistance – Source 1
(33 to 110) kΩ 22 µΩ/Ω + 0.16 Ω Fluke 5522A
(Simulated)
(110 to 330) kΩ 27 µΩ/Ω + 1.6 Ω Multiproduct Calibrator
(0.33 to 1.1) MΩ 26 µΩ/Ω + 1.6 Ω
(1.1 to 3.3) MΩ 66 µΩ/Ω + 23 Ω
(3.3 to 11) MΩ 0.1 mΩ/Ω + 39 Ω
(11 to 33) MΩ 0.19 mΩ/Ω + 1.9 kΩ
(33 to 110) MΩ 0.41 mΩ/Ω + 2.3 kΩ
(110 to 330) MΩ 0.23 % of reading + 78 kΩ
(0.33 to 1.1) GΩ 1.2 % of reading + 0.39 MΩ
0Ω 40 µΩ
1Ω 95 µΩ/Ω
1.9 Ω 95 µΩ/Ω
10 Ω 23 µΩ/Ω
19 Ω 23 µΩ/Ω
100 Ω 10 µΩ/Ω
190 Ω 10 µΩ/Ω
1 kΩ 6.5 µΩ/Ω
Comparison to
Resistance – Source 1 1.9 kΩ 6.5 µΩ/Ω
Fluke 5730A/03
(Fixed Points) 10 kΩ 6.5 µΩ/Ω
Multiproduct Calibrator
19 kΩ 6.5 µΩ/Ω
100 kΩ 8.5 µΩ/Ω
190 kΩ 8.5 µΩ/Ω
1 MΩ 13 µΩ/Ω
1.9 MΩ 18 µΩ/Ω
10 MΩ 40 µΩ/Ω
19 MΩ 47 µΩ/Ω
100 MΩ 0.011 % of reading
Comparison to
Resistance – Source 1 1Ω 9.3 µΩ/Ω
Fluke 742A
(Fixed Artifacts) 10 kΩ 7.6 µΩ/Ω
Resistance Standards

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1 kΩ 15 µΩ/Ω
10 kΩ 15 µΩ/Ω
100 kΩ 20 µΩ/Ω
1 MΩ 25 µΩ/Ω
Resistance – Source 1 Comparison to
10 MΩ 31 µΩ/Ω
(Fixed Artifacts) Standard Resistors
100 MΩ 0.013 % of reading
1 GΩ 0.07 % of reading
10 GΩ 0.25 % of reading
100 GΩ 0.45 % of reading
Up to 2 Ω 17 µΩ/Ω + 3.9 µΩ
(2 to 20) Ω 9.5 µΩ/Ω + 14 µΩ
(20 to 200) Ω 7.8 µΩ/Ω + 47 µΩ
(0.2 to 2) kΩ 8.1 µΩ/Ω + 0.47 mΩ
Comparison to
DC Resistance – Measure 1 (2 to 20) kΩ 7.8 µΩ/Ω + 4.7 mΩ
Fluke 8508A
Normal Mode (20 to 200) kΩ 8.6 µΩ/Ω + 47 mΩ
8.5 Digit Multimeter
(0.2 to 2) MΩ 9.5 µΩ/Ω + 93 mΩ
(2 to 20) MΩ 27 µΩ/Ω + 9.3 Ω
(20 to 200) MΩ 0.12 mΩ/Ω + 0.93 kΩ
(0.2 to 2) GΩ 0.14 % of reading + 93 kΩ
Up to 2 Ω 17 µΩ/Ω + 3.9 µΩ
(2 to 20) Ω 9.4 µΩ/Ω + 14 µΩ
(20 to 200) Ω 8 µΩ/Ω + 0.14 mΩ
(0.2 to 2) kΩ 8.2 µΩ/Ω + 1.4 mΩ
Comparison to
DC Resistance – Measure 1 (2 to 20) kΩ 7.9 µΩ/Ω + 14 mΩ
Fluke 8508A
Low Current Mode (20 to 200) kΩ 8.6 µΩ/Ω + 93 mΩ
8.5 Digit Multimeter
(0.2 to 2) MΩ 21 µΩ/Ω + 0.93 Ω
(2 to 20) MΩ 88 µΩ/Ω + 93 Ω
(20 to 200) MΩ 0.14 % of reading + 93 kΩ
(0.2 to 2) GΩ 0.14 % of reading + 0.93 MΩ
(2 to 20) MΩ 25 µΩ/Ω + 9.3 Ω
Comparison to
DC Resistance – Measure 1 (20 to 200) MΩ 70 µΩ/Ω + 0.93 kΩ
Fluke 8508A opt 001
High Voltage Mode (0.2 to 2) GΩ 0.19 mΩ/Ω + 93 kΩ
8.5 Digit Multimeter
(2 to 20) GΩ 0.14 % of reading + 9.3 MΩ
1 kHz Comparison to
Inductance – Source 1 1 µH to 999 mH 0.5 % of reading Inductance Decade Box
(Variable Artifact) characterized with
Hameg LCR Meter
1 kHz Comparison to
Inductance – Measure 1
1 µH to 100 H 0.5 % of reading Hameg LCR Meter

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Oscilloscopes 1,2
Amplitude DC
into 50 Ω load (-6.6 to 6.6) V 0.22 % of reading + 31 µV
into 1 MΩ load (-130 to 130) V 0.12 % of reading + 31 µV

Amplitude Square Wave

into 50 Ω load 10 Hz to 10 kHz
1 mVp-p to 6.6 Vp-p 0.22 % of reading + 31 µV
into 1 MΩ load 10 Hz to 1 kHz
1 mVp-p to 130 Vp-p 0.078 % of reading + 31 µV
(1 to 10) kHz
1 mVp-p to 130 Vp-p 0.19 % of reading + 31 µV

Timing – Generate
into 50 Ω load 1 ns to 20 ms 0.000 22 % reading
50 ms 0.005 9 % reading
100 ms 0.009 8 % reading
200 ms 0.018 % reading Comparison to
500 ms 0.041 % reading Fluke 5522A/11
1s 0.08 % reading Multiproduct Calibrator
2s 0.16 % reading
5s 0.39 % reading

Rise Time – Generate

into 50 Ω Load 5 mVp-p to 2.5 Vp-p
Rate: 1 kHz to 2 MHz (200 to 300) ps 50 ps
Rate: 2 MHz to 10 MHz (250 to 350) ps 50 ps

Leveled Sine Wave –

Generate
into 50 Ω load 5 mVp-p to 5.5 Vp-p
50 kHz 1.8 % of reading + 0.23 mV
100 kHz to 100 MHz 2.8 % of reading + 0.23 mV
(100 to 300) MHz 3.2 % of reading + 0.23 mV
(300 to 600) MHz 4 % of reading + 0.23 mV
5 mVp-p to 3.5 Vp-p
600 MHz to 1.1 GHz 5.5 % of reading + 0.23 mV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Oscilloscopes 1,2
Bandwidth/Flatness –
Measure
(50 kHz Reference)
into 50 Ω load 5 mVp-p to 5.5 Vp-p
50 kHz to 100 MHz 1.4 % of reading + 78 µV
(100 to 300) MHz 1.8 % of reading + 78 µV
(300 to 600) MHz 3.2 % of reading + 78 µV
5 mVp-p to 3.5 Vp-p
600 MHz to 1.1 GHz 4 % of reading + 78 µV

Input Impedance – Measure Comparison to

into 50 Ω load (40 to 60) Ω 0.082 % of reading Fluke 5522A/11
into 1 MΩ load (0.5 to 1.5) MΩ 0.081 % of reading Multiproduct Calibrator

Input Capacitance – Measure (5 to 50) pF 3.9 % of reading + 0.39 pF

Wave Generator – Source

Amplitude
(Sine, Square, Triangle) 10 Hz to 10 kHz
into 50 Ω load 1.8 mVp-p to 2.5 Vp-p 2.3 % of reading + 78 µV
into 1 MΩ load 1.8 mVp-p to 55 Vp-p 2.3 % of reading + 78 µV

Frequency
10 Hz to 10 kHz 0.001 9 % of reading + 12 mHz

Length – Dimensional Metrology

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Gage Blocks,
Length Standards 3
Standard Size Length (0.005 to 0.5) in 2.6 µin
Mechanical Comparison
(0.55 to 1) in 3.4 µin
using Master Gage Blocks
2 in 5.5 µin
3 in 7.7 µin
4 in 9.9 µin

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Gage Blocks,
Length Standards 3
Standard Size Length 5 in 13 µin
6 in 15 µin
7 in 27 µin Mechanical Comparison
8 in 30 µin using Master Gage Blocks
10 in 37 µin
12 in 44 µin
16 in 58 µin
20 in 73 µin

Non-standard Size Length (0.001 to 0.005) in 4.9 µin

(0.005 to 1) in (3 + 2L) µin
(1 to 6) in (8.3 + 2.3L) µin
(6 to 20) in (26 + 2.2L) µin
(20 to 40) in (69 + 1.7L) µin
Comparison to
Up to 1 in 15 µin
Feeler Gages, 1 Universal Length
Shims Measuring Machine,
Up to 25.4 mm 0.38 µm
Gage Blocks
Comparison to
Up to 24 in 24 µin Indicator with
Height Masters 1 Gage Amplifier,
Up to 600 mm 0.61 µm Gage Blocks,
Surface Plate
Up to 60 in (8 + 3.5L) µin Comparison to
Height Gages 1,3,5 Gage Blocks,
Up to 1 500 mm (0.2 + 0.003 5L) µm Surface Plate
Up to 20 in (7 + 4.5L) µin
Comparison to
Micrometers 1,3,5
Gage Blocks
Up to 500 mm (0.2 + 0.005L) µm
Up to 80 in (24 + 4.6L) µin
Comparison to
Calipers 1,3,5
Gage Blocks
Up to 2 000 mm (0.6 + 0.005L) µm
Up to 12 in (3 + 3.3L) µin Comparison to
LVDT’s,
Gage Blocks,
Indicators 1,3,5
Up to 300 mm (0.08 + 0.005L) µm Surface Plates
Up to 5 ft 0.006 3 in
Measuring Tapes, (5 to 10) ft 0.013 in Comparison to
Rulers 1 (10 to 48) ft 140 µin/in Ruler Calibrator
(48 to 1 000) ft 120 µin/in

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Page 18 of 30
Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Sine Bar,
Angle Blocks 1,3 (0.25 to 90)° (13 + 0.07A)ʺ
Gage Blocks,
Surface Plate
0.005 6ʺ to 5° 3.3ʺ
(5 to 20)° 6.5ʺ
Angle Measuring Devices 1, 3 (20 to 35)° 12ʺ Comparison to
(Protractors, Inclinometers, (35 to 45)° 17ʺ 5 in Sine Bar,
Squares, Angle Gages, etc.) (45 to 60)° 28ʺ Gage Blocks
(60 to 75)° 59ʺ
(75 to 85)° 190ʺ
(0.15 to 2) in 290 µin
Comparison to
Chamfer Gage 1
Reference Ring Gages
(3.8 to 50) mm 7.5 µm
Cylindrical Square Comparison to
Squareness Up to 24 in 25 µin Indicator,
Height Stand,
Up to 600 mm 0.6 µm Surface Plate
Comparison to
Electronic Levels, Sine Bar,
Up to 1 000ʺ 0.23ʺ
Inclination Levels 3 Gage Blocks,
Surface Plate
Up to 4 ft 50 µin/ft Sine Bar,
Spirit Levels,
Gage Blocks,
Clinometers 5
Up to 1.2 m 1.3 µm/m Surface Plate
Sine Plates/Bars 3 Comparison to
Parallelism Up to 15 in 78 µin Surface Plate,
Indicator with
Angle (0 to 45)° (10 + 0.6A)ʺ Gage Amplifier,
Gage Blocks,
Angle Blocks
Up to 4 in 6.4 µin
Comparison to
Optical Flats/Parallels
Master Optical Flat
Up to 100 mm 0.16 µm
Comparison to
3 Gage Blocks,
Cylindrical Pins/Plugs (0.003 to 40) in (8 + 0.8D) µin
Universal Length
Measuring Machine

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Gage Blocks,
Cylindrical Rings/Bores 3 (0.02 to 33) in (4.8 + 0.9D) µin
Universal Length
Measuring Machine
Comparison to
(0.015 to 4) in 12 µin
CMM Spheres, Gage Blocks,
Gage Balls Universal Length
(0.38 to 100) mm 0.3 µm
Measuring Machine
Comparison to
(0.003 to 0.825) in 10 µin Master Thread Wires,
Thread Wires Gage Blocks,
76 µm to 30 mm 0.25 µm Universal Length
Measuring Machine
Comparison to
Thread Pitch Gages Up to 6 in 430 µin
Optical Comparator
Thread Plug Gages 1, 3 Comparison to
Pitch Diameter, (40 to 80) TPI Up to 1.25 in 97 µin Universal Length
(1.25 to 4.5) in 100 µin Measuring Machine,
(4.5 to 7) in 110 µin Master Thread Wires,
Gage Blocks

Major Diameter Up to 1.75 in 59 µin Universal Length

(1.75 to 7) in (56 + 2D) µin Measuring Machine,
Gage Blocks

Step Height Up to 1 in 160 µin Gage Blocks, Test Stand

Thread Ring Gages 3 Comparison to
Pitch Diameter Up to 20 in (66 + 0.26D) µin Universal Length
Measuring Machine,
Minor Diameter Up to 20 in 45 µin Thread Balls,
Gage Blocks
Thread Ring Gages 1,3 Comparison to
Inner Pitch Diameter Up to 2 in (140 + 27.5D) µin Master Thread
(2 to 12) in (160 + 18D) µin Plug Gages
Adjustable Thread Rings 3 Tactile Fit to
Pitch Diameter Up to 2 in (140 + 2D) µin Class X Master Set Plugs
Comparison to
Parallels, Indicator,
Up to 12 in 40 µin
Straight Edges Height Stand,
Surface Plate

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Planekator Up to 48 in 57 µin Laser System,
Surface Plate
Profilometers,
Comparison to
Surface Testers 1 Ra = 120 µin 8.4 µin
Master Surface Patch
(Primary)
Profilometers,
Comparison to
Surface Testers 1 Ra = (10 to 200) µin 8 % of reading + 2.6 µin
Surface Patches
(Secondary)
Comparison to
Roughness Standards/Patches
Ra = (10 to 200) µin 7 % of reading + 1.5 µin Master Surface Patch,
(ISO Type C)
Profilometer
Comparison to
Coating Thickness Meters 1 (0.94 to 20.24) mils 0.095 mils Coating Thickness
Standards
V-Blocks Comparison to
Groove Up to 4 in 64 µin Indicator,
Height Stand,
Squareness Up to 24 x 24 x 24 in 45 µin Surface Plate
Bench Micrometers,
Universal Length
Measuring Machines 1,3,5
Standard Length (> 0.005 to 1) in (2.5 + 0.5L) µin
2 in 4.2 µin
3 in 4.9 µin
4 in 6.4 µin
5 in 8.1 µin Comparison to
6 in 8.9 µin Gage Blocks,
7 in 9.7 µin Long Gage Blocks
8 in 11 µin
10 in 12 µin
12 in 14 µin
16 in 17 µin
20 in 20 µin

Non-standard Length (20 to 40) in (20 + 0.86L) µin

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Coordinate Measuring
Machines (CMM’s) 1,3 Comparison to
Linear Displacement Up to 72 in (8 + 3L) µin Gage Blocks, Optical Flats
Accuracy (X, Y, Z)

Volumetric Repeatability Up to 72 in 100 µin Ball Bar

Probe Repeatability Up to 72 in 25 µin Sphere

Optical Comparators 1,3 Comparison to
X,Y Measuring Stage Travel Up to 12 in (130 + 17L) µin Calibration Grids

Squareness (0.4 to 1) in 120 µin Calibration Grids

Magnification 10X to 62.5X (240 + 21L) µin Magnification Checker

Comparison to
Radius Gages Up to 2 in 460 µin
Optical Comparator
Granite Surface Plates 1,3 In accordance with
ASME B89.3.7 using
Overall Flatness (8.49 to 299.25) DL 4 √DL µin Electronic Level System

Local Area Flatness Up to 0.005 in 40 µin Repeat-o-Meter

(Repeat Readings)
Comparison to
Surface Plate,
Torque Wheels, Indicator with
Up to 40 in (470 + 2L) µin
Torque Arms 3 Gage Amplifier,
Gage Blocks,
Digital Outside Micrometer
Comparison to
Depth Micrometers 1,3 (0.01 to 72) in (50 + 55.1L) µin
Gage Blocks

Mass and Mass Related

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Air Velocity
Measuring Devices (30 to 250) ft/min 2.3 % of reading + 2.6 ft/min
Comparison to
(Anemometers, Thermal, Pitot, (250 to 1 500) ft/min 2.3 % of reading + 6 ft/min
Wind Tunnel
Vane-style and Similar (1 500 to 9 000) ft/min 1.2 % of reading + 17 ft/min
Equipment)

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Gas Mass Flow 1 (1 to 10) sccm 0.25 sccm
Fluke molBloc-L
(Flow Meters, (10 to 1 000) sccm 0.22 % of reading
Calibration System
Flow Controllers,
Comparison to
Rotameters, and
(1 to 1 000) slpm 0.1 % of reading Fluke molBloc-S
Leak Orifices)
Calibration System
Calibration by
Liquid Flow Meters 1 Up to 10 gpm 1.4 % of reading + 0.001 8 gpm
Time and Mass
(0.6 to 0.64) SG 0.002 5 SG Comparison to
Hydrometers (0.64 to 1.67) SG 0.001 4 SG Reference Hydrometer
(1.67 to 2) SG 0.005 SG per ASTM E126.
< 10 mm²/s 0.25 % of reading Comparison to
(11 to 100) mm²/s 0.32 % of reading Accredited Viscosity
Kinematic Viscosity
(101 to 1000) mm²/s 0.37 % of reading Standard,
Meters 1
(1001 to 10 000) mm²/s 0.44 % of reading Temperature Indicator
(10 001 to 100 000) mm²/s 0.51 % of reading with Probe
Viscosity Cups 1 Accredited Viscosity
(Kinematic Viscosity @ 25 °C) Standard per
Zahn (5 to 1 800) mm²/s 2.2 % of reading ASTM D4212

Shell (2 to 1 300) mm²/s 2.2 % of reading ASTM D4212

Ford (2 to 1 400) mm²/s 2.2 % of reading ASTM D1200

Piston Operated Gravimetric Method using
(1 to 2 000) µL 94 nL
Volumetric Apparatus 7 Electronic Balances and
(2000 to 10 000) µL 0.22 µL
(Pipettes, Syringes, Burettes, ASTM E617 Class 1
(10 000 to 100 000) µL 2 µL
Liquid, Handlers, Dispensers) Weights.
Per ASTM E542 using
Temperature Indicator
Volume Measuring with Probe,
(0.001 to 4 000) mL 0.8 µL
Equipment 1 Electronic Balance,
Distilled Water,
Barometer
(25 to 250) cN 5.2 cN Comparison to
(250 to 2 000) cN 52 cN Correx Gram Gauge
Comparison to
Load Cells, Force Testers, (0 to 500) lbf 0.088 % of reading
NIST Class F Weights
Force Gages 1
(100 to 5 000) lbf 0.008 % of reading + 1.7 lbf
(Tension and Compression) Comparison to
(5 000 to 10 000) lbf 0.013 % of reading + 1.7 lbf
Tovey Engineering
(10 000 to 25 000) lbf 0.013 % of reading + 4.2 lbf
Calibration System
(25 000 to 50 000) lbf 0.013 % of reading + 8.3 lbf

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Durometers 1
(Type A, B, C, CF, D, DO, E,
M, O, OO, OOO-S, SA,
ASKER C) Direct Verification per
Indenter Dimensions ASTM D2240 using
Extension Length Up to 0.2 in 160 µin Optical Comparator
Diameter Up to 1 in 170 µin
Angle Up to 35° 0.1°
Radius Up to 1 in 170 µin

Spring Force (0 to 100) Duro 0.34 Duro Durometer Calibrator

Shore Durometer Calibrators Comparison to
Dimensional Measurements Up to 8 in 480 µin Optical Comparator

Mass Up to 4 kg 30 mg Single Substitution

Method using Electronic
Balance
HRBW
(80 to 100) HRBW 0.48 HRBW
(60 to 79) HRBW 0.77 HRBW
Indirect verification per
Rockwell Hardness and (40 to 59) HRBW 1.1 HRBW
ASTM E18 using
Superficial Testers 1 HRC
hardness test blocks.
(60 to 65) HRC 0.37 HRC
(35 to 55) HRC 0.48 HRC
(20 to 30) HRC 0.57 HRC
1 mg to 5 g 21 µg
(5 to 30) g 24 µg
Comparison to
(30 to 200) g 0.21 mg
Electronic Balances,
Mass Determination 1 (200 to 500) g 2.1 mg
OIML Class E1 Weights,
(Variable) (500 to 2000) g 21 mg
ASTM E617
(2 to 10) kg 0.21 g
Class 1 Weights
(10 to 30) kg 0.24 g
(30 to 45) kg 0.45 g

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1 mg 4.2 µg
2 mg 4.2 µg
5 mg 4.2 µg
10 mg 4.2 µg
20 mg 4.2 µg
50 mg 4.3 µg
100 mg 4.5 µg
200 mg 4.5 µg
500 mg 4.5 µg Comparison to
Mass Determination
1g 8.6 µg Electronic Balances,
(Fixed Points)
2g 9.1 µg OIML Class E1 Weights
5g 11 µg
10 g 15 µg
20 g 19 µg
50 g 28 µg
100 g 18 µg
200 g 0.13 mg
500 g 0.91 mg
1 kg 0.86 mg
Comparison to
Ruska 7010
(0.1 to 15) psi 0.003 4 % of reading + 0.000 5 psi
Pressure
Pneumatic Pressure
Controller/Calibrator
Measuring Equipment 1
Comparison to
(Absolute, Gauge)
Ruska 7215I
(0.1 to 1 000) psi 0.006 % of reading + 0.015 psi
Pressure
Controller/Calibrator
(-104 to -7.5) kPa 0.007 7 % of reading + 5.2 Pa
Pressure Measuring Comparison to
(-7.5 to -2.9) kPa 0.009 1 % of reading
Equipment 1 Fluke PPC4
(-2.9 to -0.75) kPa 0.009 % of reading + 35 mPa
(Absolute, Gauge, Negative Pressure
(-0.75 to 0.75) kPa 0.007 5 % of reading + 51 mPa
and Positive) Controller/Calibrator
(0.75 to 2.9) kPa 0.009 % of reading + 35 mPa
(2.9 to 7.5) kPa 0.009 1 % of reading
Pressure Measuring Comparison to
(7.5 to 26) kPa 0.007 7 % of reading + 1.3 Pa
Equipment 1 Fluke PPC4
(26 to 63) kPa 0.009 % of reading + 50 mPa
(Absolute, Gauge, Negative Pressure
(63 to 700) kPa 0.008 % of reading + 0.7 Pa
and Positive) Controller/Calibrator
(700 to 7 000) kPa 0.008 % of reading + 0.3 Pa
Pressure Measuring Comparison to
Equipment (7 000 to 82 737) kPa 0.005 % of reading Ruska 2400HL
(Absolute, Gauge) Hydraulic Piston Gauge

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Pneumatic Only Pressure (9 to 385) kPa 0.001 2 % of reading + 0.1 Pa Comparison to
Measuring Equipment (70 to 825) kPa 0.002 % of reading + 0.6 Pa Fluke PG7601
Absolute, Gauge (140 to 7 650) kPa 0.002 % of reading + 1.2 Pa Gas Piston Gauge
Up to 500 mg 22 µg
(0.5 to 5) g 29 µg
ASTM E617
(5 to 10) g 39 µg
1,8 Class 1 weights and
Scales and Balances (10 to 20) g 54 µg
NIST HB44 utilized in the
Metric (SI) (20 to 100) g 0.28 mg
calibration of the
(100 to 200) g 0.43 mg
weighing system.
(0.2 to 2) kg 0.002 2% of reading
(2 to 20) kg 0.004 2% of reading
NIST Class F weights and
Up to 0.5 lb 0.026 % of reading
Scales and Balances 1,8 NIST HB44 utilized in the
(0.5 to 1) lb 0.019 % of reading
Avoirdupois calibration of the
(1 to 2 000) lb 0.013 % of reading
weighing system.
NIST Class F weights and
Up to 250 g 0.026 % of reading
Scales and Balances 1,8 NIST HB44 utilized in the
(250 to 500) g 0.019 % of reading
Metric (SI) calibration of the
(0.5 to 908) kg 0.013 % of reading
weighing system.
Comparison to
Torque Wrenches, (1 to 1 000) lbf·in 0.52 % of reading Torque Transducers,
Torque Watches 1 (1 to 1 000) lbf·ft 0.52 % of reading Torque Indicators,
Manual Loader
Comparison to
Torque Transducers, (1 to 1 000) lbf·in 0.09 % of reading Torque Wheels,
Torque Meters 1 (1 to 1 000) lbf·ft 0.08 % of reading Torque Arms,
NIST Class F Weights

Photometry and Radiometry

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 40 lux 3.6 % of reading + 0.2 lux
(40 to 400) lux 3.6 % of reading + 2 lux Comparison to
Light Meters
(400 to 4 000) lux 3.6 % of reading + 20 lux Master Light Meter
(4 000 to 40 000) lux 4.5 % of reading + 200 lux

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Dew Point Measuring Thunder Scientific 2500
(-25 to 68) °C 0.15 °C
Equipment 1 Two-pressure
Humidity Generator
Comparison to
Dew Point – Measure 1 (-15 to 20) °C 0.26 °C
Chilled Mirror
(-10 to 15) °C
(10 to 75) % RH 0.5 %RH
(75 to 95) %RH 0.65 %RH
Comparison to
(15 to 35) °C
Thunder Scientific 2500
Relative Humidity – Source 1 (10 to 95) %RH 0.5 %RH
Two-Pressure Humidity
(35 to 70) °C
Generator
(10 to 50) %RH 0.5 %RH
(50 to 75) %RH 0.7 %RH
(75 to 95) %RH 0.85 %RH
Relative Humidity – Measure Comparison to
1 (10 to 95) %RH 1.3 %RH
Chilled Mirror
Temperature Measuring Comparison to
0.01 °C 1.5 mK
Equipment Triple Point of Water
Temperature Measuring
Equipment by Comparison 2,3
Comparison to
NBPLN2 -195 °C 4 mK
Fluke 1595A
Hg -38.8 °C 5 mK
Super Thermometer,
In 156.6 °C 5 mK
Fluke 5628
Sn 231.9 °C 5 mK
Secondary PRT
Zn 419.5 °C 4 mK
Al 660.3 °C 10 mK
Temperature – Measure 1
(PRT, RTD, Thermistor, Comparison to
(-95 to 700) °C 10 mK
Thermocouple, Stirred Baths, SPRT and Indicator
Liquid Baths)
(-15 to 0) °C 0.83 °C
(0 to 50) °C 0.66 °C Comparison to
(50 to 100) °C 0.67 °C Blackbody Source
Infrared Thermometers 1 (100 to 120) °C 0.72 °C (Flat Plate)
(120 to 200) °C 0.97 °C λ = (8 to 14) µm,
(200 to 350) °C 1.6 °C Ɛ = (0.9 to 1)
(350 to 500) °C 2.2 °C

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Time and Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Comparison to
Frequency – Source/Measure
10 MHz 3.7 pHz/Hz Fluke 910R
Reference 1
GPS Frequency Standard
Comparison to
Agilent 33250A
1 µHz to 80 MHz 0.58 µHz/Hz
Arbitrary Waveform
1
Frequency – Source Generator
Comparison to
250 kHz to 3 GHz 0.58 µHz/Hz Agilent E4432B
RF Signal Generator
Comparison to
Agilent 53132A
Frequency – Measure 1 1 Hz to 12.4 GHz 51 pHz/Hz
Universal Frequency
Counter
AC Duty Cycle – Source 1
Square Wave: < 3.3 Vp-p (1 to 10) % Duty Cycle
Freq: 0.1 Hz to 100 kHz 10 µs to 100 s 0.62 % of reading + 78 ns
(10 to 49) % Duty Cycle
10 µs to 100 s 0.039 % of reading + 78 ns Comparison to
50 % Duty Cycle Fluke 5522A
10 µs to 100 s 0.001 6 % of reading + 78 ns Multiproduct Calibrator
(51 to 90) % Duty Cycle
10 µs to 100 s 0.039 % of reading + 78 ns
(90 to 99) % Duty Cycle
10 µs to 100 s 0.62 % of reading + 78 ns
Comparison to
Stopwatches,
Up to 19.99 s/d 58 ms/d Helmut Klein TM-4500
Timers 1
Timometer
Comparison to
Agilent 33250A
Tachometers – Optical
(0 to 60 000) rpm 0.000 23 % of reading + 0.001 2 rpm Arbitrary Waveform
Pickup 1,3
Generator,
LED
(1 to 10) rpm 0.012 % of reading + 0.085 rpm Comparison to
1,3 (10 to 1 000) rpm 0.012 % of reading + 0.12 rpm Tachometer Calibrator,
Tachometers – Contact
(1 000 to 8 000) rpm 0.012 % of reading + 0.53 rpm Master Optical
(8 000 to 20 000) rpm 0.012 % of reading + 5 rpm Tachometer
Rotation Speed – Measure 1,3 (6 to 8 300) rpm 1.7 rpm Comparison to
(Conveyor Belts, Line Speed, (8 300 to 99 999) rpm 2.6 rpm Optical Tachometer
Centrifuges, and Mechanical (6 to 8 300) rpm 2.4 rpm Comparison to
Tachometers) (8 300 to 99 999) rpm 3 rpm Mechanical Tachometer

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 DIMENSIONAL MEASUREMENT

1 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Digital Caliper utilized as
Dimensional Measurement –
Up to 12 in 1 500 µin the reference standard for
1D 1
1-D Length Measurements.
Digital Outside Micrometer
Dimensional Measurement – utilized as the reference
Up to 1 in 150 µin
1D 1 standard for 1-D Length
Measurements.
Digital Depth Micrometer
Dimensional Measurement – utilized as the reference
Up to 6 in 150 µin
1D 1 standard for 1-D Length
Measurements.
Gage Pins utilized as the
Dimensional Measurement –
Up to 1 in 600 µin reference standard for 1-D
1D 1
Length Measurements.

2 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Optical Comparator
Dimensional Measurement – utilized as the reference
Up to 6 in (420 + 0.52L) µin
2D standard for 2-D Length
Measurements.
CMM utilized as the
Dimensional Measurement –
Up to 30 in 200 µin reference standard for 2-D
2D
Length Measurements.
Profilometer utilized as a
Surface Finish 1 Ra = (10 to 200) µin 7 % of reading + 1.5 µin reference standard for
Dimensional Inspection.

3 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Dimensional Measurements – X-axis: Up to 18 in (300 + 43L) µin CMM utilized as the
3D 3 Y-axis: Up to 20 in (300 + 44L) µin reference standard for 3-D
(Volumetric) Z-axis: Up to 16 in (300 + 42L) µin Length Measurements.

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Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and
reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a
coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.
Notes:
1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement
uncertainties are expected on-site than what is reported on the accredited scope.
2. The values represented here are nominal values. The certified values and associated uncertainty will be reported at the time of calibration.
3. L = length in inches or millimeters; rpm = revolutions per minute; PF = Power Factor; A = Angle in degrees (°); ʺ = arcsecond; D = diameter in inches or millimeters;
DL = diagonal length in inches; NBPLN2 = Boiling Point of Liquid Nitrogen.
4. The uncertainties shown are for the most favorable conditions. There is an increase in uncertainty that corresponds to the laboratory’s AC voltage and current
uncertainties at different frequencies other than the ones shown. Power factors (PF) other than the one shown contribute to the power uncertainty. PF is related to
the cosine of phase. Therefore, uncertainties track the laboratory’s phase uncertainty closely at PF near one but are magnified heavily as PF approaches zero. The
lab may also report reactive power, apparent power, and power factor under this accreditation. If needed, contact the laboratory for more information regarding
uncertainties at frequency and power factor combinations other than the ones shown.
5. At the time of Calibration, 0.6R will be added to the Measurement Uncertainty, where R = resolution of the unit under calibration.
6. ΔP measurement with density correction for standard condition normalization.
7. The contributions from “the best existing device” are not included in the CMC presented claim.
8. The CMC for scales and balances is highly dependent upon the resolution of the unit under test. The CMC presented here does not include the resolution of the unit
under test. The resolution will be included in the reported measurement uncertainty at the time of calibration.
9. Volume calculations are based on independent linear measurements.
10. The legal entity name for this client is Transcat, Inc.
11. Unless otherwise specified in the far-right column, the calibration procedure/method utilized by the laboratory was internally written.
12. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2489.30.

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