TÜV Rheinland (Shanghai) Co., Ltd.
Solar/ Fuelcell Technology
Test Report
Photovoltaic Module Tests
according to Client’s Requirements
TÜV Report No. 15104057.001
Shanghai, May 2017
Solar/ Fuelcell Technology
Test report No.: 15104057.001 Page 1 / 14
Prüfbericht - Nr.:
Client RenewSys India Pvt. Ltd.
(Customer No. + address):
Plot No. 06, Survey # 114/P,Srinagar Village, Maheshwaram Mandal
Auftraggeber
(Kunden-Nr. + Adresse): Rangareddy Distric t. Telangana-501359, India.
Test Item: Photovoltaic (PV) Module(s) Date of receipt: 03/03/2017
Gegenstand der Prüfung: Eingangsdatum:
Identification:
DESERV 3M6-315
Bezeichnung:
Order No.: Quotation No.:
Auftragsnummer: 154226745 52187459
Angebotsnummer:
Place of testing:
Ort der Prüfung: China Telecommunication Technology Labs
Testing laboratory:
Prüflaboratorium: TÜV Rheinland (Shanghai) Co., Ltd.
Test specification: IEC 60068-2-68:1994, etc
Prüfgrundlage: Refer to details on page 4.
Test Result: Refer to the verdict of the test report
Prüfergebnis:
tested by / geprüft: reviewed by / kontrolliert:
Project Engineer/ Technical Reviewer/
Stan Liu Victor Feng
Date Title/Name Signature Date Title/Name Signature
Datum Titel/Name Unterschrift Datum Titel/Name Unterschrift
Other Aspects / Sonstiges:
N/A
Abkürzungen: P(ass) = entspricht Prüfgrundlage Abbreviations: P(ass) = passed
F(ail) = entspricht nicht Prüfgrundlage F(ail) = failed
N/A = nicht anwendbar N/A = not applicable
N/T = nicht getestet N/T = not tested
This test report relates to the listed test samples. Without permission of the test centre this test report is not permitted
to be duplicated in extracts. This test report does not entitle to carry any safety mark on this or similar products.
Dieser Prüfbericht bezieht sich nur auf die gelisteten Prüfmuster und darf ohne Genehmigung der Prüfstelle nicht
auszugsweise vervielfältigt werden. Dieser Bericht berechtigt nicht zur Verwendung eines Prüfzeichens.
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Table of Content
General Information 3
Sampling and Test Assignment 4
Sampling procedure 4
Module test assignment 4
Visual inspection (according to IEC61215:2005, 10.1) 6
Initial maximum power determination (according to IEC61215:2005, 10.2) 6
Initial insulation test (according to IEC61215:2005, 10.3) 6
Initial wet leakage current test (according to IEC61215:2005, 10.15) 6
Initial ground continuity test (refer to IEC61730-2:2004, MST 13) 7
EL-images (Initial) 7
Dust and sand test (according to IEC 60068-2-68:1994) 7
Visual inspection after dust and sand test (according to IEC61215:2005, 10.1) 8
Maximum power determination after dust and sand test (according to IEC61215:2005, 10.2) 8
Insulation test after dust and sand test (according to IEC61215:2005, 10.3) 8
Wet leakage current test after dust and sand test (according to IEC61215:2005, 10.15) 8
Ground continuity test after dust and sand test (refer to IEC61730-2:2004, MST 13) 9
Bypass diode functional test 9
EL-images (Final) 9
Appendix 1: Main measuring equipment and used software 10
Appendix 2: Photos of the modules 11
Appendix 3:EL-images 12
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General Information
Date(s) of performance of tests : From 13/04/2017 to 25/04/2017
Reference standard are as follows:
- IEC 60068-2-68:1994 Environmental testing for electric and electronic products-Part 2: Test methods-
Test L: Dust and sand.
- IEC 61215:2005 Crystalline silicon terrestrial photovoltaic (PV) modules – Design qualification and type
approval.
- IEC 61730-2:2004+A1+A2 Photovoltaic (PV) module safety qualification – Part 2: Requirements for
testing.
- IEC 61701:2011 Salt mist corrosion testing of PV modules.
Abbreviations used in the report:
Pmax – Maximum power point Vmpp – Maximum power point voltage
Impp – Maximum power point current Voc – Open circuit voltage
Isc – Short circuit current FF – Fill factor
MPD – Maximum Power determination EL – Electroluminescence imaging
Possible test case verdicts:
Test case does not apply to the test object..............................: N/A
Test object does meet the requirement ...................................: Pass (P)
Test object does not meet the requirement .............................: Fail (F)
Further Remarks
All tests were performed at China Telecommunication Technology Labs.
The test verdicts presented in this report relate only to the test specimen.
This report shall not be reproduced, except in full, without the written approval of the Issuing testing
laboratory.
IV curves are only included in the report if they show any deviations. If required, other IV curves will be
provided upon request.
Any question regards the report, please contact to TÜV Rheinland (Shanghai) within one week after
report issued.
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Sampling and Test Assignment
Sampling procedure
Random sampling from production (e.g. during factory audit (FA) or inline inspection)
Random sampling from the warehouse, container or transportation boxes
Modules have been submitted by the manufacturer/ client without random sampling by TÜV
Rheinland
Module test assignment
Remarks /
Module manufacturer Module type
constructional characteristics
Renewsys India Pvt Ltd DESERV 3M6-315 6” poly c-Si module, 72 pcs
Sample # 1 2 3
R1000003171238063
R1000003171238073
R1000003171238066
Serial number
Setting of tasks
Test item Test specification
Reference module ×
Initial visual inspection IEC61215:2005, 10.1 × × ×
Initial maximum power determination IEC61215:2005, 10.2 × × ×
Initial insulation test IEC61215:2005, 10.3 × × ×
Initial wet leakage test IEC61215:2005, 10.15 × × ×
Initial ground continuity test IEC61730-2:2004, MST 13 × × ×
Initial EL-images × × ×
Dust and sand test IEC 60068-2-68:1994 × ×
Final visual inspection IEC61215:2005, 10.1 × × ×
Final maximum power determination IEC61215:2005, 10.2 × × ×
Final insulation test IEC61215:2005, 10.3 × × ×
Final wet leakage test IEC61215:2005, 10.15 × × ×
Final ground continuity test IEC61730-2:2004, MST 13 × × ×
Final bypass diode functionality test × ×
Final EL-images × × ×
Legend:
x Selected sample for test
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Test sequence and test sample requirement
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Tables
Visual inspection (according to IEC61215:2005, 10.1)
Test Date [DD-MM-YYYY] ............................... : 13/04/2017 —
Sample # Nature and position of initial findings Verdict
1 No visual defect found P
2 No visual defect found P
3 No visual defect found P
Supplementary information: N/A
Initial maximum power determination (according to IEC61215:2005, 10.2)
Test Date [DD-MM-YYYY] ............................... : 13/04/2017 —
Test method ..................................................... : indoor outdoor —
Irradiance W/m²............................................. : 1000 —
Module temperature °C ................................. : Corrected to 25 —
Sample # Pmpp W Vmpp V Impp A Voc V Isc A FF %
1 318.9 37.42 8.522 45.75 8.998 77.5
2 319.7 37.51 8.523 45.72 9.014 77.6
3 320.6 37.51 8.547 45.75 8.997 77.9
Supplementary information: N/A
Initial insulation test (according to IEC61215:2005, 10.3)
Test Date [DD/MM/YYYY] ............................... : 14/04/2017 —
Maximum system voltage VDC .................... : 1000 —
High voltage applied VDC ............................. : 6000 —
Insulation resistance measured at VDC ....... : 1000 —
Measured Area Result* Dielectric breakdown
Sample # Verdict
G m² G * m² Yes (description) No
1 >9.90 1.99 >19.70 - No P
2 >9.90 1.99 >19.70 - No P
3 >9.90 1.99 >19.70 - No P
*Minimum requirement acc. to the standard is 0.04 G × m².
Supplementary information: The maximum resistance measurement range is 9900 MΩ.
Initial wet leakage current test (according to IEC61215:2005, 10.15)
Test Date [DD/MM/YYYY] ............................... : 14/04/2017 —
Insulation resistance measured at VDC ....... : 1000 —
Solution resistivity cm ................................ : < 3500
: —
Solution temperature °C ................................ : 22 3 —
Sample # Measured Area Result* Verdict
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G m² G * m²
1 4.98 1.99 9.91 P
2 5.34 1.99 10.63 P
3 5.37 1.99 10.69 P
* Minimum requirement acc. to the standard is 40 M × m².
Supplementary information: N/A
Initial ground continuity test (refer to IEC61730-2:2004, MST 13)
Test date [DD/MM/YYYY] 14/04/2017 —
Maximum over-current protection rating [A] 20 —
Current applied [A] 37.5 —
Location of designated grounding point Grounding point of the long edge —
Location of second contacting point The greatest physical displacement of adjacent side —
Sample No Voltage [V] Resistance [] —
1 0.049 0.0013 P
2 0.050 0.0013 P
3 0.062 0.0017 P
Supplementary information: N/A
EL-images (Initial)
Test date [DD/MM/YYYY] 14/04/2017 —
Forward bias current [A] .................................. : 9.0 —
Sample No Remarks —
1 One cracked cell as marked in EL picture. —
2 One cracked cell as marked in EL picture. —
3 One cracked cell as marked in EL picture. —
Supplementary information: Refer to Appendix 3: EL-images of the appendix for more details.
Dust and sand test (according to IEC 60068-2-68:1994)
Test Date [DD/MM/YYYY / DD/MM/YYYY] ................ : 17/04/2017 – 20/04/2017 —
Sample No ................................................................. : 2, 3 —
Cell interconnection circuit ......................................... : S SP SPS —
Chamber temperature [°C] ........................................ : 40-44 —
Chamber relative humidity [%] ................................... : 4-7 —
Method Lc1 or Lc2 ...................................................... : Lc1 —
Dust/sand type and composition ................................ : Quartz, 95% SiO2 —
Particle size................................................................. : Average 0.5mm —
3
Dust/sand concentration [g/m ] ................................. : 4.8-5.3 —
Wind speed [m/s] ...................................................... : 18.3-20.7 —
Duration [min] ............................................................ : 240 min for front side+240 min for rear side —
Supplementary information: N/A
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Visual inspection after dust and sand test (according to IEC61215:2005, 10.1)
Test Date [DD-MM-YYYY] ............................... : 21/04/2017 —
Sample # Nature and position of initial findings Verdict
1 No visual defect found P
2 No visual defect found P
3 No visual defect found P
Supplementary information: N/A
Maximum power determination after dust and sand test (according to IEC61215:2005, 10.2)
Test Date [DD/MM/YYYY] ............................... : 21/04/2017 —
Module temperature °C ................................. : Corrected to 25 —
Irradiance W / m²........................................... : 1000 —
Degradation
Sample # Pmpp W Vmpp V Impp A Voc V Isc A FF % —
[%]
1 318.9 37.41 8.524 45.75 9.002 77.4 0.00 P
2 311.2 37.53 8.291 45.70 8.994 75.7 -2.66 P
3 313.6 37.91 8.271 45.73 8.937 76.7 -2.20 P
Supplementary information: N/A
Insulation test after dust and sand test (according to IEC61215:2005, 10.3)
Test Date [DD/MM/YYYY] ............................... : 21/04/2017 —
Maximum system voltage VDC .................... : 1000 —
High voltage applied VDC ............................. : 6000 —
Insulation resistance measured at VDC ....... : 1000 —
Measured Area Result* Dielectric breakdown
Sample # Verdict
G m² G * m² Yes (description) No
1 >9.90 1.99 >19.70 - No P
2 >9.90 1.99 >19.70 - No P
3 >9.90 1.99 >19.70 - No P
*Minimum requirement acc. to the standard is 0.04 G × m².
Supplementary information: Insulation tester can measure up to 9900.0 M.
Wet leakage current test after dust and sand test (according to IEC61215:2005, 10.15)
Test Date [DD/MM/YYYY] ............................... : 21/04/2017 —
Insulation resistance measured at VDC ....... : 1000 —
Solution resistivity cm ................................ : < 3500
: —
Solution temperature °C ................................ : 22 3 —
Measured Area Result*
Sample # Verdict
G m² G * m²
1 5.31 1.99 10.57 P
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2 5.34 1.99 10.63 P
3 5.28 1.99 10.51 P
* Minimum requirement acc. to the standard is 40 M × m².
Supplementary information: N/A
Ground continuity test after dust and sand test (refer to IEC61730-2:2004, MST 13)
Test date [DD/MM/YYYY] 24/04/2017 —
Maximum over-current protection rating [A] 20 —
Current applied [A] 50.0 —
Location of designated grounding point Grounding point of the long edge —
Location of second contacting point The greatest physical displacement of adjacent side —
Sample No Voltage [V] Resistance [] —
1 0.048 0.0013 P
2 0.051 0.0014 P
3 0.050 0.0013 P
Supplementary information: N/A
Bypass diode functional test
Test Date [DD/MM/YYYY] 24/04/2017
Number of diodes in junction box 3
Diode manufacturer —
—
Diode type designation —
Max. permissible junction temperature Tjmax
200
°C (according to diode datasheet)
Sample No. Diode 1 Diode 2 Diode 3 —
2 Functional Functional Functional P
3 Functional Functional Functional P
Supplementary information: N/A
EL-images (Final)
Test date [DD/MM/YYYY] 25/04/2017 —
Forward bias current [A] .................................. : 9.0 —
Sample No Remarks —
1 One cracked cell as marked in EL picture. —
2 One cracked cell as marked in EL picture. —
3 One cracked cell as marked in EL picture. —
Supplementary information: Refer to Appendix 3: EL-images of the appendix for more details.
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Appendix 1: Main measuring equipment and used software
Measuring equipment
Test equipment Equipment type ID-No. Next calibration
Solar simulator PasanⅢb PAA0352 2017.12.22
Dielectrometer TOS5051A NG001602 2017.11.03
Reference cell CH-2000 10-0118-11 2017.12.15
Infrared thermometer RAYST60XBAP 17200075 2018.01.04
Power supply 62150H-600S GK451 —
Blowing sand test
SC-GF-01 HJ-15-3 2017.11.29
chamber
Multimeter FLUKE289C 33650010 2017.10.31
DC clamp HIOKI 3287 130912099 2017.05.16
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Appendix 2: Photos of the modules
Fig. 1: front view of test module Fig. 2: rear view of test module
Fig. 3: rating label of test module Fig. 4: junction box of test module
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Appendix 3:EL-images
Fig. 5: EL-image of sample R1000003171238073 (initial)
Fig. 6: EL-image of sample R1000003171238073 (final)
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Fig. 7: EL-image of sample R1000003171238063 (initial)
Fig. 8: EL-image of sample R1000003171238063 (final)
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Fig. 9: EL-image of sample R1000003171238066 (initial)
Fig. 10: EL-image of sample R1000003171238066 (final)
End of Test Report
Report no.: 15104057.001