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Data Sheet H-1000-2131 SFM-H1

The SFM-H1 Surface Finish Probe Module enhances access and inspection capabilities for integrated surface finish measurement in precision manufacturing. It features a range of SFM modules that can be automatically interchanged with other REVO® probe options, allowing for optimal tool selection for various features. The specifications include a diamond tip radius of 2 or 5 µm, measurement ranges, and accuracy dependent on system variables.
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0% found this document useful (0 votes)
24 views2 pages

Data Sheet H-1000-2131 SFM-H1

The SFM-H1 Surface Finish Probe Module enhances access and inspection capabilities for integrated surface finish measurement in precision manufacturing. It features a range of SFM modules that can be automatically interchanged with other REVO® probe options, allowing for optimal tool selection for various features. The specifications include a diamond tip radius of 2 or 5 µm, measurement ranges, and accuracy dependent on system variables.
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© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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SFM-H1

Surface finish probe module


Enhanced access and inspection capability
for integrated surface finish measurement
The SFP2 system consists of a probe and a range of SFM modules which have
been designed to suit the demands of specific parts and features encountered
in a precision manufacturing environment. The probe and modules can be
automatically interchanged with all other REVO® probe options, providing the
flexibility to easily select the optimum tool to inspect a wide range of features.

Each SFM module is its own miniature measuring device, incorporating


Renishaw’s proprietary encoder system to transduce the motion of the stylus tip.

Features
The H-series of modules employ a long skid with a large radius, Typical applications
which is appropriate for inspecting surface finish callouts with
larger cut-off values. Surface finish callouts with cut-off values of 2.5 mm and above.

Specification
Diamond tip radius (µm) 2 or 5
Surface finish 2 µm modules 6.3 to 0.05 Ra
measurement range (µm) 5 µm modules 6.3 to 0.10 Ra
Typical surface finish accuracy (of nominal Ra) * ±(5% + 15 nm)
Skid / stylus arrangement Side-by-side
Skid material DLC coated stainless steel
Nominal stylus tip protrusion beyond skid (mm) 0.5
Skid length / radius (mm) 12.5 / 125
Skid width / radius (mm) 0.6 / 12.5
Skid contact force (N) 0.2
Stylus contact force (N) 0.003
SFM / SFH knuckle adjustment range ±90°
Weight (g) 12
Resolution (nm) 1
Measurement speed (mm/s) Up to 1
Stylus holder compatibility SFH-1, SFH-2
Lateral scanning capability No

* Accuracy values are dependent upon a number of system variables. These include the machine size and configuration, scan
orientation, condition of stylus tip, part fixturing system and environmental noise.

www.renishaw.com/SFP2 #renishaw
Ø11.3 All dimensions in mm.

65.6

Detail B

3.2

24.4

Detail A

6.4

7.9

R125

12.5
R0.002 /
0.6 R0.005

R12.5

Detail A Detail B

www.renishaw.com/SFP2 #renishaw

+44 (0) 1453 524524 [email protected]


© 2021 Renishaw plc. All rights reserved. RENISHAW® and the probe symbol are registered trade marks of Renishaw plc.
Renishaw product names, designations and the mark ‘apply innovation’ are trade marks of Renishaw plc or its subsidiaries.
Other brand, product or company names are trade marks of their respective owners.
Renishaw plc. Registered in England and Wales. Company no: 1106260. Registered office: New Mills, Wotton-under-Edge, Glos, GL12 8JR, UK.
Part no.: H-1000-2132-02-A
WHILE CONSIDERABLE EFFORT WAS MADE TO VERIFY THE ACCURACY OF THIS DOCUMENT AT PUBLICATION, ALL WARRANTIES,
CONDITIONS, REPRESENTATIONS AND LIABILITY, HOWSOEVER ARISING, ARE EXCLUDED TO THE EXTENT PERMITTED BY LAW. Issued: 10.2021

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