Training WM | Quartis R2025-1

Probe Systems
Triggered

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 Probe Systems
Triggered

Contents
Probe systems 3
Learning goals 3

Probe system components 4

Stylus Changing System 5

Adopt current configuration 5

Setup probe system 6

Template and user catalog 6

Configuration 7

Save probe system as assembly 8

Calibrate probe system 9

Reference sphere settings 9

Probe system settings 10

Machine settings 10

Calibrate probe system manually 11

Calibrate probe system semi-automatically 12

Calibrate star probe 13

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Calibrate probe system automatically 14

Calibrate articulating probe system 14

Select calibrate 14

List view 16

Clear probe 17

Information about the dialog Calibrate probe system (matrix)17

Calibrate individual positions 18

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 Probe Systems
Triggered

Probe systems

Probe systems are used in order to probe points on the work piece. WM | Quartis uses these points to cre-
ate elements such as lines, planes, circles, cylinders, and so forth.

One differentiates between

• Tactile (touching) probe system triggered, meaning point for point measurement

• Tactile probe system scanning, meaning continuous probing (scanning)

• Optical probe system, meaning contactless measurement

This chapter explains the handling of triggered probe systems.

Learning goals • Setup probe systems (configure graphically)

• Calibrate triggered probe systems manually

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• Calibrate triggered probe systems automatically
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 Probe Systems
Triggered
Probe system components

A probe system consists the following components:

• Articulation system, e.g. Renishaw PH10M

• Adapter and extensions, e.g. PAA1 or PEL2

• Sensor or probe, e.g. TP200 or TP20

• Probe insertion module, e.g. TP 200 SF or TP20 6W

• Stylus, e.g. ruby stylus with 25mm carbide metal shaft

or star probe with up to 5 different styli

In the case of special, star and disc stylus, it is essential to set them up
graphically. Certain set-up data is required during calibration.

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Pay particular attention to the permissible weight and length dimen-
sions of the sensor manufacturer. This can influence the accuracy of
the calibration.
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 Probe Systems
Triggered

Stylus Changing If a Stylus changing system is configured for automatic changing of the
probe systems, it is important to first assign the correct changer and
System
rack slot to the new probe system.

Opens the Dialog

on

Adopt current configuration

on

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With the Function the actual configuration is deleted.

with selection in the window «Deposit in » and the Button differ-

ent slots ( changer and slot ) can be assigned to the actual Probe System

Confirm the actual configuration

Closes the dialogue and the changer configuration remains in the back-
ground

Existing modified probe systems are marked with "*"..

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Loading an empty probe system is indicated by a "?"

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 Probe Systems
Triggered

Setup probe system It is beneficial to set up (configure graphically) the used probe system
for the display in offline mode (not connected to machine). This allows
selecting adequate probe systems easier, checking probe positions and
accomplishing collision considerations.
Template and user catalog The most common Renishaw components are included in a template
catalog. The user can assemble his own catalog, containing only the
components available on his machine. With this user catalog, the setup
of the probe system can be easily made.

The lowerhalf represents the template catalog containing the most

common Renishaw components. Out of these components you can mo-
dify your own compenents and after saving they will appear in the user

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catalog (upper half).

Add or remove components from user catalog.

Components in the user catalog can be edited. Therefore it is possible,

on &
for example, to change the stylus length, diameter, description and co-
lor.

The length information of the stylus refers to the center of the probing
sphere.

The template catalog cannot be modified.

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User catalog is saved.

on

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 Probe Systems
Triggered
Configuration The probe system configuration is done in the tab Configuration. Select
the components from the user catalog in the correct order.

Select the corresponding com-

ponents.

on

Adopt the configuration for the current probe system while the configu-
ration dialog remains opened.

on
Adopts the configuration for the current probe system and closes the
dialog at the same time.

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on

Unsuitable components

When trying to mount unsuitable components, the dialog shown above

is displayed.
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 Probe Systems
Triggered
Save probe system as assembly A name can be assigned to a configured probe system, which can also
be saved as an assembly in the user catalog. In doing so, further equal
or similar probe systems can be configured even faster.
Select the probe system

on
You can enter any name for the assembly when saving.

on

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More information about the function Set up probe system is available
in the WM | Quartis help.
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 Probe Systems
Triggered
The calibration of probe systems determines the diameter of the pro-
Calibrate probe system bing spheres as well as their position to each other using a common re-
ference, the reference sphere.

The functions related to the probe systems are found in the ribbon
Machine.

Requirement for the calibration of a probe system is a calibrated refe-

rence sphere.

If neither a probe system nor a reference sphere is available, a refe-

rence sphere will be created first during this process. For this purpose
the data of the reference sphere need to be known. During the creation
of the reference sphere, a reference probe system will be simultaneou-
sly created and suggested for saving.

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Reference sphere settings Check the reference sphere settings first.

on

on
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 Probe Systems
Triggered
Probe system settings Check the probe system settings. Determine the number of probe
points and the maximum range during the calibration. The message
when the maximum range is exceeded can be activated or deactivated.
on

on

Machine settings Define the machine settings also when calibrating.

on

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on

The same measuring speed and acceleration should be set for calibra-
tion and for measuring on the work piece. Overall, the same setting
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leads to a higher measurement quality and reliability of the results.

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 Probe Systems
Triggered

Calibrate probe system

Calibrate manually means complete manual probing of the reference
manually
sphere.

on

Select stylus

Start the calibration by manually probing the required probe points on

the sphere using the joystick. The save dialog is displayed as soon as de
predefined point number is reached.

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Number and name of the probe system can be edited.

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Save the probe system with

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 Probe Systems
Triggered

Calibrate probe system With the semi-automatic calibration, only the point on the pole of the
semi-automatically reference sphere has to be probed, all other points are probed by the
machine automatic.

on

Select stylus

Start the calibration via the command button Start. In this case only a point
on the pole of the sphere has to be probed. Probe in stylus direction towa-
rds the center of the sphere.
on
The machine then autonomously probes the reference and measuring
points that are required for probe system calibration.

Afterwards the save dialog is also displayed.

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Number and name of the probe system can be edited.

Save probe system with

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 Probe Systems
Triggered

Calibrate star probe

If a star probe needs to be calibrated, one proceeds analog to the previ-

ous description. As shown here, one selects all existing styli and subse-
quently calibrates them either manually or semi-automatically.

Stylus switching is performed automatically and the save dialog is dis-

played after the calibration of the last stylus.

Save probe system with

on

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Number and name of the probe system can be adjusted.
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 Probe Systems
Triggered

Calibrate probe system If an articulating probing system, e.g. PH10M, is available, multiple
probe positions can be calibrated automatically.
automatically

The automatic calibration is possible with single probes (spherical, cy-

lindrical or disc styli) that lie in the axis extension of the sensor (probe
body). Star probes cannot be calibrated automatically.

A calibrated articulating probe system and a previously created refe-

rence probe system are required for automatic calibration of probe sys-
tems.

Calibrate articulating probe sys- If needed, the articulating probe system has to be calibrated first using
tem this function.

The reference probe system usually is the probe system that is calibra-
ted with the angle positions A0 B0. It is recommended to graphically set
up the reference probe system before calibrating other probe systems
(see chapter Set up probe system). The graphical configuration is then

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automatically adopted with the automatic calibration for all other
probe positions.

With special and disc probes it is required to set them up graphically as

certain set up data is needed for the calibration.

Select calibrate

on
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Just as with manual calibration, you should check the machine settings.
on

The same applies to the probe system settings

on
.

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 Probe Systems
Triggered

Define the reference probe system if needed.

on

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Define those positions of the probe system that you want to calibrate
by selecting the corresponding checkboxes of the A and B angles.
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 Probe Systems
Triggered
List view The list view allows checking the selected probe systems and adding a
name if needed.
on

on

After exiting the matrix with OK, the probe positions to be calibrated are
on displayed in the calibration list.

on

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 Probe Systems
Triggered
Clear probe A message to the user will appear that the probe moves automatically
(over the reference sphere).

Position the probe near to the reference sphere in order to prevent col-
lisions with parts possibly mounted on the machine during the automa-
tic travel to the reference sphere.

Click on Calibrate probe system. The probe systems are calibrated and
saved directly into the system database.
Information about the dialog
Calibrate probe system (matrix)
After the calibration, re-open the ribbon Calibrate probe system

on
and the matrix in order to calibrate automatically.
on
Probe systems calibrated outside the defined range,

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not yet calibrated probe systems,

offline calibrated probe systems,

are indicated colored in the matrix.

They can be selected fast using a click on the corresponding button

within the dialog
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 Probe Systems
Triggered
Calibrate individual positions The selection of individual positions is also possible in the list view.
Therein, individual ranges are also displayed.
on

The selected probe systems are marked in the matrix and thus can be
adopted into the calibration list.
on

The above described procedure for probe system calibration may be re-
corded into a program. More related information you find in the
WM | Quartis help Adjust probe system settings.

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The function allows you to select measuring programs and to au-
tomatically take over probe systems included into the calibration list.
More related information you find in the WM | Quartis help.
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