EVAL-ADuCM355QSPZ Evaluation Board

UG-1308
One Technology Way • P.O. Box 9106 • Norwood, MA 02062-9106, U.S.A. • Tel: 781.329.4700 • Fax: 781.461.3113 • www.analog.com

Evaluating the ADuCM355 Precision Analog Microcontroller

with Chemical Sensor Interface
FEATURES GENERAL DESCRIPTION
Debug and programming capability of the ADuCM355 The ADuCM355 on-chip system provides the features needed
Evaluation capability with electrochemical gas sensors to bias and to measure a range of different electrochemical
ADT7420 ±0.25°C accurate temperature sensor via I2C sensors. The EVAL-ADuCM355QSPZ allows users to evaluate
MicroUSB power option and connection to PC the performance of the ADuCM355 when implementing a
range of different electrochemical techniques, including
EQUIPMENT NEEDED
chronoamperometry, voltammetry, and electrochemical
PC running Windows® 7 or later impedance spectroscopy (EIS).
Electrochemical gas sensor or resistor star network
Complete specifications for the ADuCM355 are available in the
DOCUMENTS NEEDED ADuCM355 data sheet, which must be consulted in conjunction
ADuCM355 hardware reference manual with this user guide when using the EVAL-ADuCM355QSPZ.
ADuCM355 data sheet

SOFTWARE NEEDED
IAR Embedded Workbench or Keil μVision
ADuCM355 GitHub Repository
Terminal program such as RealTerm

EVALUATION BOARD PHOTOGRAPH

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Figure 1.

PLEASE SEE THE LAST PAGE FOR AN IMPORTANT

WARNING AND LEGAL TERMS AND CONDITIONS. Rev. A | Page 1 of 24
UG-1308 EVAL-ADuCM355QSPZ Evaluation Board

TABLE OF CONTENTS
Features .............................................................................................. 1 Running a GPIO Example in IAR Embedded Workbench ....8
Equipment Needed........................................................................... 1 Running a GPIO Example in Keil μVision............................. 11
Documents Needed .......................................................................... 1 Application Examples .................................................................... 13
Software Needed ............................................................................... 1 Cyclic Voltammetry Example .................................................. 13
General Description ......................................................................... 1 EIS Example ................................................................................ 14
Evaluation Board Photograph ........................................................ 1 Chronoamperometry Example ................................................ 14
Revision History ............................................................................... 2 DC Current Example ................................................................. 15
Power Configurations ...................................................................... 4 4-Lead Electrochemical Sensor Example ................................ 16
MicroUSB Direct Power via P4 and ADP7158 LDO Connecting an External Gain Resistor Across the High Speed
Regulator ....................................................................................... 4 TIA ............................................................................................... 17
Direct 3.3 V Power via the AVDD and DVDD Connectors .. 6 AFE Die Watchdog Timer Example ........................................ 17
Power via USB from 8-Pin DEBUG Connector (P27)............ 6 ADuCM355 System Calibration .................................................. 18
Power via External 5 V Supply to 2-Pin Connector (P37) ..... 6 High Speed TIA Gain Resistor Calibration ............................ 18
Connecting an Electrochemical Sensor ......................................... 7 Low Power TIA0/TIA1 Gain Resistor Calibration ............... 20
Getting Started with the Tool Chain ............................................. 8 Mass Erasing a Device Not Responding to SWD Commands. 22
Downloading the Integrated Development Environment Ordering Information.................................................................... 23
(IDE) .............................................................................................. 8 Bill of Materials .......................................................................... 23
Installing the ADuCM355 Support Package ............................ 8

REVISION HISTORY
4/2021—Rev. 0 to Rev. A Added Running a GPIO Example in Keil μVision Section,
Changes to Features Section, Equipment Needed Section, Figure 15, and Figure 16; Renumbered Sequentially ................ 11
Software Needed Section, and General Description Section ..... 1 Deleted Figure 19 ........................................................................... 11
Deleted MicroUSB Connector, P4 Setup Section Heading ........ 4 Added Figure 17 to Figure 19 ....................................................... 12
Changes to Power Configurations Section, MicroUSB Direct Changes to Application Examples Section, Cyclic Voltammetry
Power via P4 and ADP7158 LDO Regulator Section, and Example Section, and Figure 22 Caption .................................... 13
Figure 2 Caption ............................................................................... 4 Added Figure 21 ............................................................................. 13
Changes to Direct 3.3 V Power Via the AVDD and DVDD Changes to Figure 23 Caption, EIS Example Section, and
Connectors Section, Jumper Setup with Direct 3.3 V Connection Chronoamperometry Example Section ...................................... 14
Section, Power via USB from 8-Pin Debug Connector (P27) Replaced Figure 23 and Figure 25 ................................................ 14
Section, Jumper Setup with Power via USB Section, Figure 5 Added Figure 24 ............................................................................. 14
Caption, and Power via External 5 V Supply to 2-Pin Connector Replaced Figure 28 and Figure 29 ................................................ 15
(P37) Section ..................................................................................... 6 Changes to Figure 28 Caption and DC Current
Changes to Connecting an Electrochemical Sensor Section ...... 7 Example Section ............................................................................. 15
Deleted Figure 8; Renumbered Sequentially ................................ 7 Changes to 4-Lead Electrochemical Sensor
Changed Getting Started with the Tool Chain Section to Example Section ............................................................................. 16
Getting Started with the Tool Chain Section ............................... 8 Added Figure 30 ............................................................................. 16
Changes to Downloading the Integrated Development Moved Connecting an External Gain Resistor Across the High
Environment (IDE) Section, Installing the ADuCM355 Support Speed TIA Section, AFE Watchdog Timer Example Section,
Package Section, Running a GPIO Example in IAR Embedded and Figure 32 .................................................................................. 17
Workbench Section, and Project Folder Structure Section ........ 8 Changes to AFE Die Watchdog Timer Example Section ......... 17
Replaced Figure 9 ............................................................................. 9 Added ADuCM355 System Calibration Section ....................... 18
Changes to Compiling and Running Firmware Section and Moved High Speed TIA Gain Register Calibration Section..... 18
Figure 11 Caption ........................................................................... 10 Deleted Figure 29 ........................................................................... 18
Replaced Figure 10 and Figure 12 ................................................ 10 Changes to High Speed TIA Gain Resistor
Replaced Figure 14 ......................................................................... 11 Calibration Section......................................................................... 18
Deleted Figure 33 ........................................................................... 18
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EVAL-ADuCM355QSPZ Evaluation Board UG-1308
Changes to Figure 33 ......................................................................19 2/2019—Revision 0: Initial Version
Moved Figure 26 to Figure 28 .......................................................19
Deleted Figure 36 ............................................................................19
Moved Low Power TIA0/TIA1 Gain Resistor Calibration
Section and Figure 36 .....................................................................20
Changes to Low Power TIA0/TIA1 Gain Resistor
Calibration Section .........................................................................20
Moved Figure 37 and Figure 38 ....................................................21
Changes to Mass Erasing a Device Not Responding to
SWD Commands Section ..............................................................22

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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board

POWER CONFIGURATIONS
This section describes the four different options to power the MicroUSB DIRECT POWER VIA P4 AND ADP7158
EVAL-ADuCM355QSPZ. The different power options include LDO REGULATOR
the following:
To power the EVAL-ADuCM355QSPZ via the P4 microUSB
 Power via a microUSB connector, P4, and the on- connector, take the following steps:
board ADP7158 low dropout (LDO) regulator, which 1. Ensure that the JP40 and JP42 to JP46 jumpers are
is the default power option. inserted. These jumpers control the features shown in
 Connect 3.3 V to the AVDD and DVDD connectors. Table 1.
This setup is useful for measuring the current 2. Remove the JP37 jumper.
consumption of the EVAL-ADuCM355QSPZ via the
current meter. Table 1. Jumper Connections
 Power via the 8-pin P27 debug header (a different Jumper Description
USB connection option to the PC). JP45 and Connect the UART pins from the ADuCM355 to the
 Power via an external 5 V supply to the 2-pin JP37 JP46 UART to USB transceiver chip (U2) (see Figure 3).
connector. Optionally, an external 5 V supply can JP40 Connects the 5 V USB supply to the LDO input (U3)
(see Figure 4).
power the ADP7158 instead of the USB using this
JP42 Connects the 3.3 V LDO output to the EVAL-
setup.
ADuCM355QSPZ power supply filters (see Figure 4).
JP43 and Connect the DVDD and AVDD rails to filters for the
JP44 DVDD and AVDD analog supplies to the ADuCM355
(see Figure 4).

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Figure 2. Direct Power via MicroUSB Cable

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EVAL-ADuCM355QSPZ Evaluation Board UG-1308
3V3VOUT

5VUSB
C37
C38

0.1µF
0.1µF

DGND
3V3VOUT
1 19 U2
C40
VCCIO VCC 0.1µF
18 16 3V3VOUT
RESET 3V3OUT
26 28
TEST OSCO
27 30 1 2 P0.11_SIN
OSCI TXD DGND
P0.10_SOUT 1 2 2 31 JP46
RXD DTR
JP45 3 32
RI RTS
M20-9990245 6
DGND DSR 22
7 CBUS0
DCD 21
8 CBUS1
CTS 10
CBUS2
USBD– 15 11
USBDM CBUS3
USBD+ 14 9
USBDP CBUS4

DGND EP GND AGND NC

4
17
20

24

5
12
13
23
25
29
FT232RQ
PAD

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DGND

Figure 3. JP45 and JP46 Connect the ADuCM355 UART Pins to the USB Transceiver

JP37
1 2

U3
ADP7158ACPZ-3.3-R7
DGND JP43 E4
5VUSB JP40 JP42
1 2 9 1 1 2 1 2 1 2 R9 DVDD
VIN VOUT
10 2 DVDD_PREFILTER 2.2Ω
VIN VOUT
JP6 5 3 60Ω
1 2 C47

2
EN VOUT_SENSE C54

JP36
C46 0.1µF AT 100MHz
0 4 0.1µF
BYP 10µF

1
8
VREG
7 R17
REF DGND 560Ω
6
REF_SENSE DGND DS1
0.1µF

EP
10µF

1µF

1µF
C41

C42

C43

C44

PAD A C
C45 SML-310MTT86
DGND
1µF
JP44 E3
1 2 1 2 R8 AVDD
AVDD_PREFILTER 2.2Ω
DGND 60Ω
AT 100MHz
C55 C57
0.1µF 10µF
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AGND

Figure 4. Schematic Section with Key Jumpers Around LDO and Power Supply

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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
DIRECT 3.3 V POWER VIA THE AVDD AND DVDD
CONNECTORS
To measure the ADuCM355 current consumption (IDD), connect
3.3 V directly to the AVDD and DVDD connectors.
To power the EVAL-ADuCM355QSPZ in this case, apply a
3.3 V supply directly to Pin 1 on the AVDD connector and to
Pin 1 on the DVDD connector.
Jumper Setup with Direct 3.3 V Connection
The jumper settings required when using a 3.3 V connection
are as follows:
1. Insert JP32, JP34, JP43, and JP44.
2. Remove JP42.
For additional information, see Figure 6.

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POWER VIA USB FROM 8-PIN DEBUG
CONNECTOR (P27) Figure 5. Power via 8-Pin P27 Debug Connector
If using the older USB-SWD/UART and debug interface, the
POWER VIA EXTERNAL 5 V SUPPLY TO 2-PIN
ADuCM355 can also be powered from the USB. The UART to
CONNECTOR (P37)
USB interface is handled by the USB-SWD/UART-EMUZ board.
The last power supply option is to connect an external 5 V
Jumper Setup with Power via USB
supply to the 2-pin P37 connector. This 5 V supply is the input to
Close JP35, JP40, JP42, JP43, and JP44 when using power via the ADP7158 LDO regulator that has a 3.3 V output voltage. Do
the USB (see Figure 5). not connect the microUSB cable to P4. This option is a debug or
test option only.

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Figure 6. Power DVDD and AVDD Directly via Power Header Blocks

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EVAL-ADuCM355QSPZ Evaluation Board UG-1308

CONNECTING AN ELECTROCHEMICAL SENSOR

The ADuCM355 has two measurement channels (CH0 and CH1)
for electrochemical sensors. A 2-lead, 3-lead, or 4-lead sensor
can be connected to either CH0 or CH1. Figure 7 shows an
electrochemical sensor connected to CH1.

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Figure 7. Sensor Connector

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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board

GETTING STARTED WITH THE TOOL CHAIN

DOWNLOADING THE INTEGRATED RUNNING A GPIO EXAMPLE IN IAR EMBEDDED
DEVELOPMENT ENVIRONMENT (IDE) WORKBENCH
The ADUCM355 firmware examples use either the IAR The ADUCM355 CMSIS pack is not supported for IAR
Embedded Workbench® or Keil μVision® IDEs to run the Embedded Workbench. To use IAR Embedded Workbench,
firmware. Ensure that a full or evaluation version of either clone the repository from the GitHub directory, as described in
software is downloaded and installed to run the example the Installing the ADuCM355 Support Package section. To run
applications. IAR Embedded Workbench supports the the general-purpose input/output (GPIO) example, navigate to
ADUCM355 with Version 8.32.1 and later for ARM. Keil μVision examples > DigitalDie > M355_GPIO > iar. Double click the
supports Version 5.28 and later. M355_GPIO.eww file to open the project in the IAR Embedded
INSTALLING THE ADuCM355 SUPPORT PACKAGE Workbench (see Figure 8).

The ADUCM355 firmware examples are source controlled on

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www.GitHub.com. To clone the repository, execute the
following command of the Git command line: Figure 8. M355_GPIO.eww File Location
git clone --
Project Folder Structure
recursive https://github.com/analogdevicesin
c/aducm355-examples.git The IAR Embedded Workbench project folder structure is
This command downloads the main repository and the shown to the left of the IAR Embedded Workbench window
submodules. If the code from the web browser downloads, the (see Figure 9). The app folder contains files specific to the open
examples/ad5940lib folder does not download automatically and application. In Figure 9, M355_GPIO.c is the example shown.
compilation errors occur. Download the code manually from The common folder contains the required library files for the
GitHub in the shared library file that contains the ADUCM355 open application. For the GPIO example, the library files are
examples and the AD5940 example. Both devices have the same ad5940.c, ClkLib.c, DioLib.c, IntLib.c, and UrtLib.c. The
analog front end. startup folder contains start-up files for the microprocessor, and
the Output folder contains the files that are autogenerated by
When using Keil μVision, the ADUCM355 device family pack the IDE. All subsequent firmware examples follow this folder
can be downloaded as part of a Cortex® microcontroller structure in the IAR Embedded Workbench.
software interface standard (CMSIS) pack. Download the pack
from GitHub.
The sample firmware contains the following folders:
 The common folder contains all library files common
to all applications.
 The examples folder contains specific example
projects. This folder is divided into the following three
subfolders:
 The AnalogDie folder contains example projects that
demonstrate how to use specific blocks on the analog die.
 The DigitalDie folder contains examples that
demonstrate how to use the digital die and peripherals
such as SPI or I2C.
 The ApplicationExamples folder contains application
level examples such as M355_ECSns_DualWE, which
demonstrates how to configure a dual working electrode
sensor and calculate gas parts per million (PPM)
readings.
 The inc folder contains files included for the
microprocessor.

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EVAL-ADuCM355QSPZ Evaluation Board UG-1308

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Figure 9. IAR Embedded Workbench

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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
Compiling and Running Firmware 3. To run the firmware on the ADuCM355, ensure that the
To compile and run the ADuCM355 firmware, take the EVAL-ADuCM355QSPZ is powered on and the J-Link
following steps: debugger is connected to P3 on the EVAL-ADuCM355QSPZ,
then click Download and Debug to load the firmware to
1. In the IAR Embedded Workbench window, navigate to
the ADuCM355 and launch the debugger (see Figure 12).
Project > Rebuild All (see Figure 10).
Launching and downloading the debugger can take a few
seconds or more.

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Figure 12. Launching the Debugger

4. Open a terminal program such as RealTerm to view the

UART data from the ADuCM355 (see Figure 13). The
baud rate is 230,400 bps.

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Figure 13. UART Data in RealTerm

5. Figure 14 shows the debug interface. Click the blue arrow

(shown in the red circle) to begin code execution. The UART
prompts the user to press either the S2 or S3 button. The
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DS2 LED toggles on and off with each button press.

Figure 10. Project > Rebuild All

2. Click Rebuild All. The IDE begins building the executable

from the source files, which may take a couple of seconds.
The message shown in Figure 11 appears in the Build window
when the build is complete.
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Figure 11. Build Output Window

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EVAL-ADuCM355QSPZ Evaluation Board UG-1308

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Figure 14. Debug Interface

RUNNING A GPIO EXAMPLE IN KEIL μVISION

To download the ADuCM355 device family pack for Keil μVision,
visit the Keil website and search for MDK5 software packs. Save
the .pack file to a directory on the PC. Double click the file to
install the pack.

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Figure 16. Opening Pack Installer in Keil μVision

On the left side of the pack installer window, click the Devices
tab and select the ADuCM355, as shown in Figure 17. On the
right side of the pack installer window, click the Examples tab
(see Figure 18). All supported example projects for the
ADuCM355 display as shown in Figure 18.
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Figure 15. ADuCM355 Pack Installer

Follow the on screen instructions to unzip the contents from

the .pack file, and click Finish when complete. Open Keil μVision,
and open the pack installer, as shown in Figure 16.

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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
Find the M355_GPIO (EVAL-ADuCM355QSPZ) example, and
then click the Copy button next to the example to copy the
example project into a local directory and launch the project in
Keil μVision. To compile and build the project, click the Rebuild
icon shown in the blue circle in Figure 19. To load the code
onto the ADuCM355, ensure that the EVAL-ADuCM355QSPZ
is powered on and the mIDAS-Link debugger is connected, and
then click the load icon shown in the red circle in Figure 19.

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Figure 17. Pack Installer Devices

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Figure 19. Build and Load Project
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Figure 18. ADuCM355 Examples

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EVAL-ADuCM355QSPZ Evaluation Board UG-1308

APPLICATION EXAMPLES
This section describes how to use the ADuCM355 application contains the low level device configuration for the cyclic
examples that are part of the ADuCM355 software development voltammetry measurement.
kit (SDK). The ADuCM355 is a dual-die device that has a Figure 21 shows the AD5940RampStructInit (void) function
Cortex-M3 digital die and an analog front-end (AFE) die. The defined in the AD5940Main.c file. Modify the main parameters
AFE die and the AD5940 are the same except for some differences for the signal such as ramp start voltage, ramp peak voltage,
in which pins are bonded out, and both devices share a and ramp duration for this function within this file.
common library interface to simplify firmware development.
The main library files in the SDK are AD5940.c and AD5940.h.
All functions in this library are compatible with the
ADuCM355, AD5940, and AD5941. All AFE related function
names begin with AD5940_. Some projects in the SDK have files
labeled AD5940Main.c, which contain the upper controllers that
control the AFE die and are mostly common between the
ADuCM355, AD5940, and AD5941.
The Cyclic Voltammetry Example section outlines how to use
the following example projects:
 M355_ECSns_CycloVoltammetry
 M355_ECSns_EIS
 M355_ECSns_CappaTest
 M355_ECSns_SingleWE
 M355_ECSns_DualWE
 M355_AfeWdt

CYCLIC VOLTAMMETRY EXAMPLE

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Cyclic voltammetry is a common electrochemical measurement
in which the current on the sense electrode is measured in
Figure 21. Cyclic Voltammetry Parameters
response to a ramp like voltage applied on the reference electrode.
Figure 20 shows a typical, stepped differential voltage between To test the firmware, construct a dummy electrochemical cell
the reference and working electrodes of the sensor where V1 is using 1 kΩ resistors in a star network (see Figure 22). Connect
the initial voltage on the reference electrode and V2 is the peak each resistor network pin to the CE0, RE0, SE0, and DE0 pins
voltage on the reference electrode. on the P5 header. Ensure that the configurations are constructed
as shown in Figure 22.

V2
VOLTAGE

TIME
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Figure 22. Resistor Star Network Connected to P5 Header

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V1
To begin measuring and gathering data, open a terminal program
Figure 20. Typical Cyclic Voltammetry Waveform such as RealTerm. Configure the baud rate for 230,400 bps.
Compile and build the project in the preferred IDE and load
In the ADuCM355 firmware package, the M355_ECSns_
the code onto the ADuCM355. Run the measurement, and save
CycloVoltammetry project demonstrates how to implement a
the data to a .csv file for processing. If the definition of
cyclic voltammetry measurement on the ADuCM355. There are
OPT_RAMP_MEAS (parameter defined in the Ramp.h file) is
two main files within the project, AD5940Main.c and Ramp.c.
set to 1,the following four measurements are performed:
The AD5940Main.c file contains the upper controllers that
control the high level application parameters. The Ramp.c file
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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
 Current through SE0. In the AD5940Main.c file, there are several configurable
 Voltage on SE0. parameters that are shown in Figure 24. To couple the ac excitation
 Voltage on RE0. signal on top of a dc bias, set the SensorCH0.SensorBias parameter.
 Current through SE0 measured a second time. To apply a frequency sweep, modify the SweepCfg parameters.

To plot the current response of the test, open the saved .csv file in
Microsoft® Excel. Figure 23 shows the plotted response current.
600

500

400
300
200
CURRENT (µA)

100

0
–100

–200
–300

–400

–500
–600
1
17
33
49
65
81
97
113
129
145
161
177
193
209
225
241
257
273
289
305
321
337
353
369
385

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INDEX

Figure 23. Example SE0 Channel Current Measurement

EIS EXAMPLE

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EIS is a common electrochemical measurement in which an ac
excitation signal is applied to an electrochemical cell. The response Figure 24. EIS Parameters
current is measured, and the impedance is calculated.
To run the impedance measurement, take the following steps:
On the ADuCM355, the EIS measurement is a three-step process.
The response current in each step is measured using a high 1. Launch the debugger in the IAR Embedded Workbench.
speed transimpedance amplifier (TIA). 2. Open a terminal program with a 230,400 bps baud rate.
3. Execute the code.
The EIS measurement process is as follows: 4. A prompt to press the S2 switch is sent over the UART and
1. A signal is applied across RCAL. displays in the terminal. Press S2 to begin the impedance test.
2. A signal is applied across RLOAD. 5. When the impedance measurement completes, the results
3. A signal is applied across ZSENSOR + RLOAD. are sent to the UART (see Figure 25). Save the results in a
Microsoft Excel file for further analysis, if necessary.
In each step of the measurement processes, the measured current is
input to the discrete Fourier transform (DFT) hardware accelerator
that calculates the complex number of the current measurement
and provides the real and imaginary parts. RCAL is a precision
resistor connected to the ADuCM355 RCAL0 and RCAL1 pins,
RLOAD is the internal load resistor on the SE0 path, and ZSENSOR is
the impedance under test.
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Use the following equation to calculate the actual impedance:

Figure 25. Impedance Results
ZSENSOR = (ZSENSOR + RLOAD)− ZRLOAD
where: CHRONOAMPEROMETRY EXAMPLE
ZSENSOR + RLOAD is the impedance of RSENSOR and RLOAD measured Chronoamperometry is an electrochemical technique in which
together as a single impedance. the voltage applied to an electrochemical cell is stepped. The
ZRLOAD is the impedance of RLOAD. response current on the sense electrode is measured. Figure 26
Open the M355_ECSns_EIS example project in the preferred and Figure 27 show typical chronoamperometric measurement
IDE. For the purpose of this initial test, a dummy electrochemical and sensor responses.
cell is used. Connect three 1 kΩ resistors in a star network, and
connect the star network to the CE0, RE0, and SE0 pins on P5
of the EVAL-ADuCM355QSPZ (see Figure 22).
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EVAL-ADuCM355QSPZ Evaluation Board UG-1308
EXCITATION WAVEFORM 600
VOLTAGE

500

400

CURRENT (µA)
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300
TIME

Figure 26. Typical Chronoamperometric Voltage Stimulus Waveform 200

RESPONSE WAVEFORM
100

–100

1
115
229
343
457
571
685
799
913
1027
1141
1255
1369
1483
1597
1711

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CURRENT

INDEX

Figure 28. Output Data Using the M355_ECSns_Capatest Example with

Three 1 kΩ Resistors

DC CURRENT EXAMPLE
The dc current is a standard electrochemical measurement.
Depending on the sensor type, a bias voltage is applied between
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the reference and sense electrodes. The current output on the

TIME
sense electrode is measured.
Figure 27. Typical Chronoamperometric Current Response Waveform
In the ADuCM355 firmware package, the M355_ECSns_
In the ADuCM355 firmware development package, the M355_
SingleWE project implements a dc current measurement on
ECSns_CapaTest project implements a chronoamperometric
an electrochemical cell connected to CH0. The measurement
measurement.
parameters can be configured in the AD5940AMPStructInit()
The AD5940Main.c file contains an function in the AD5940Main.c file. For testing purposes, connect
AD5940AMPStructInit()function that modifies the main the 1 kΩ resistor star network to P5. Set the Vzero firmware
measurement parameters. parameter to 1100 mV, and set the SensorBias firmware
For the following example, only CH0 is used and all default parameter to 500 mV to apply a 500 mV bias across the 1 kΩ
values are used. The resistor star model is connected to P5, as resistor network. Ensure that the EVAL-ADuCM355QSPZ is
per the examples described in the Cyclic Voltammetry Example powered on and that the debugger is connected to the PC. Then
section and the EIS Example section. open the project in the preferred IDE, and compile and run the
example application. Open a terminal program to view the
Load the project in the preferred IDE and open a terminal
results. The output is the current measured through the SE0 pin
program. Compile and build the project and load the code onto
on P5 of the EVAL-ADuCM355QSPZ (see Figure 29).
the ADuCM355. Start the code execution and save the UART
data to a .csv file for processing.
The example code sends the following three arrays of results to
the UART at a 230,400 bps baud rate:
 The first set of values includes the current
measurement results for the SE0 channel in μA.
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 The next set of values includes the voltage

measurement results for the SE0 channel in V.
Figure 29. CH0 Output
 The final set of values includes the voltage
measurement results for the RE0 channel in V.

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UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
4-LEAD ELECTROCHEMICAL SENSOR EXAMPLE Figure 30 shows the configurable parameters located in the
Many electrochemical sensors come in 4-lead packages that have a AD5940Main.c file. Modify the value of the correct
counter, a reference, and two sensing electrodes. The ADuCM355 LpTiaRtiaSel parameter for each channel based on the
supports biasing and measuring of these sensor types. maximum expected current.

The M355_ECSns_DualWE example project configures the Figure 31 shows the connection details between the 4-lead
low power, potentiostat CH0 channel to bias the sensor. The sensor and the ADuCM355.
current flowing to and from the SE0 pin is measured via the
low power TIA Channel 0 (TIA0). The current flowing from
the SE1 electrode is measured via the low power TIA Channel 1
(TIA1).
The TIA amplifiers convert the current to a voltage that is
measured via the analog-to-digital converter (ADC), and the
source code calculates the current flowing in each electrode.
The M355_ECSns_DualWE code example project is located in
the examples folder.

16887-231
Figure 30. Dual Working Electrode Configuration

VBIAS0 VZERO0

SW12 SW13

VBIAS
CE0 SW2
PA LPDAC0
100nF
CAP_POT0 VZERO

CE0
SW3
RE0 RE0
VZERO TO LPTIA1+ INPUT
SE0 SW14
SE1
LPTIA0

SE0 RLOAD

RTIA RF

SW0

LPTIA1
VZERO ADC
MUX
SE1 RLOAD

RTIA RF

SW0
16887-136

AIN7_LPF1 AIN4_LPF0

Figure 31. Circuit Setup for 4-Lead, Dual Gas Detection Sensor

Rev. A | Page 16 of 24
EVAL-ADuCM355QSPZ Evaluation Board UG-1308
CONNECTING AN EXTERNAL GAIN RESISTOR AFE DIE WATCHDOG TIMER EXAMPLE
ACROSS THE HIGH SPEED TIA The ADuCM355 supports a watchdog timer on the AFE die.
The internal high speed TIA has a programmable gain resistor The watchdog timer clocks via an oscillator that is completely
that allows the user to either configure a high speed current independent of the clocks in the Cortex-M3 core. Therefore,
measurement channel for different input current ranges, or to the watchdog timer meets the IEC 61508 requirement of an
connect an external gain resistor instead. independent watchdog timer for a microcontroller and eliminates
The EVAL-ADuCM355QSPZ supports the connection of an the need for an external watchdog timer chip.
external transimpedance amplifier resistor (RTIA) across the The M355_AfeWdt code example project in the examples
AIN0 pin and DE0 pin, which is labeled RTIA on the top side folder shows how to configure the windowed watchdog mode.
of the printed circuit board (PCB). The WDT_INTERRUPT_EN #define parameter configures the
The current flows from the AIN0 pin into the high speed TIA project to generate either a reset or an interrupt.
inverting input with the HSTIA connected to the DE0 pin. The project uses a default timeout period of 16 sec. A minimum
The ADC selects the HPTIA_P and HPTIA_N input channels to waiting period of 4 sec is required before a watchdog refresh is
measure the voltage drop across the external RTIA resistor (see allowed. Refreshing the watchdog within 4 sec causes a reset or
Figure 32). interrupt to occur depending on the setting of Bit 1 of the
When the user populates the external gain resistor, the gain WDTCON register. If the timeout period elapses, a reset or
resistor can be used instead of the internal gain resistor. Figure 32 interrupt also occurs. To avoid a reset or interrupt generation,
shows the external resistor connected to AIN0 and DE0. Note refresh the watchdog timer within the minimum period of 4 sec
that RLOAD_03 and RTIA2_03 are set to 0 Ω so as not to effect the and the timeout period of 16 sec.
measurement. The watchdog timer refresh is triggered when the ASCII
The M355_ExternalRTIA code example project in the examples Character 1 is sent from the PC.
folder demonstrates how to set up the high speed TIA for an
external gain resistor.

1.11V REFERENCE

AIN0 T1 HSTIA HPTIA_P

EXTERNAL T10
RCAL HPTIA_N

DE0 RLOAD_03 RTIA2_03

16887-030

Figure 32. ADuCM355 External RTIA Connection to the High Speed TIA

Rev. A | Page 17 of 24
UG-1308 EVAL-ADuCM355QSPZ Evaluation Board

ADUCM355 SYSTEM CALIBRATION

Because of the complexity of the ADuCM355 and the large If the high speed TIA is uncalibrated for the selected gain resistor
number of voltage and current measurement channels on the and the ADC programmable gain amplifier (PGA) setting, an error
device, many calibration routines are implemented to ensure a is present when measuring an absolute input current.
high level of measurement accuracy. This section describes the To generate a precision calibration current, use the high speed
main calibration functions with links to further online DAC to create a differential voltage across an external precision
information. RCAL resistor that is connected to the ADuCM355 RCAL0 pin
HIGH SPEED TIA GAIN RESISTOR CALIBRATION and RCAL1 pin. The precision calibration current can be
The high speed TIA has three different programmable gain routed through any of the three high speed TIA gain resistors.
resistor options. Because the calibration current value is known and the ADC
Adjust the gain resistors to convert the current from the SE0, SE1, can measure the voltage drop across the RTIA2, RTIA2_03, and RTIA2_05
and DE0 inputs or from the DE1 input to a differential voltage resistors, the exact RTIA resistor value can be determined.
across the RTIA2 resistor, RTIA2_03 resistor, or RTIA2_05 resistor. Figure 33 to Figure 35 show the setup and switch settings that
The RTIA2, RTIA2_03, and RTIA2_05 resistors have an initial accuracy connect the high speed DAC output to the external RCAL
range and vary with temperature, as specified in the ADuCM355 resistor so that the current flows into the high speed TIA and
data sheet where RTIA2 is the HPTIA RTIA gain resistor on the RTIA2, RTIA2_03, and RTIA2_05 gain resistors, respectively.
SE0 and SE1 inputs, and RTIA_02 and RTIA_05 correspond to the The AD5940.c file has a function that calibrates each gain
HPTIA RTIA gain on the DE0 and DE1 inputs. resistor for the HSTIA. For further details on how to use this
function, visit https://wiki.analog.com/resources/eval/user-
guides/eval-ad5940/calibration_routines/hstia_cal?doc=EVAL-
ADuCM355QSPZ-UG-1308.PDF.

Rev. A | Page 18 of 24
EVAL-ADuCM355QSPZ Evaluation Board UG-1308
PR0
P_NODE

P
RCAL0 DR0
HSDAC

EXTERNAL EXCITATION N
RCAL AMPLIFIER
NR1
N_NODE P_NODE
RCAL1 N_NODE

CALIBRATION ADC
CURRENT INPUT PGA ADC
1.11V (HSTIACON[1:0] = 00b]
MUX
T9 HPTIA_P
HPTIA_P
TR1 HPTIA_N

RTIA2

16887-023
HPTIA_N

Figure 33. High Speed DAC, High Speed TIA, and Switch Matrix Settings for RTIA2 Calibration

PR0
P_NODE

P
RCAL0 DR0
HSDAC

EXTERNAL EXCITATION N
RCAL AMPLIFIER P_NODE
NR1 N_NODE
N_NODE
RCAL1
ADC
INPUT PGA ADC
CALIBRATION MUX
CURRENT
HPTIA_P
HPTIA_N
TR1
DE0 1.11V (HSTIACON[1:0] = 00b]

T6 HPTIA_P

T10

R LOAD_03 RTIA2_03
16887-024
HPTIA_N

Figure 34. High Speed DAC, High Speed TIA, and Switch Matrix Settings for RTIA2_03 Calibration

PR0
P_NODE

P
RCAL0 DR0
HSDAC

EXTERNAL EXCITATION N
RCAL AMPLIFIER P_NODE
NR1 N_NODE
N_NODE
RCAL1
ADC
INPUT PGA ADC
CALIBRATION MUX
CURRENT
HPTIA_P
HPTIA_N
TR1
DE1 1.11V (HSTIACON[1:0] = 00b]

T8 HPTIA_P

T10

R LOAD_05 RTIA2_05
16887-025

HPTIA_N

Figure 35. High Speed DAC, High Speed TIA, and Switch Matrix Settings for RTIA2_05 Calibration

Rev. A | Page 19 of 24
UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
LOW POWER TIA0/TIA1 GAIN RESISTOR RCAL resistor that is connected to the ADuCM355 RCAL0 pin
CALIBRATION and RCAL1 pin. The precision calibration current is routed
through either the low power TIA0 gain resistor or the low
The ADuCM355 contains two independent, low power
power TIA1 gain resistor.
TIA channels.
Because the calibration current value is known and the ADC
Each TIA has an independent, programmable gain resistor to
can measure the voltage drop across each RTIA resistor, the exact
scale the input current from the SE0 pin and the SE1 pin to a
RTIA resistor value can be determined.
voltage that the ADC can measure.
Figure 37 and Figure 38 show the setup and switch settings
Figure 36 shows the gain resistor for the low power TIA0. A
used to connect the low power DAC outputs to the external
similar diagram is valid to use for the low power TIA1.
RCAL resistor so that the current flows into the LPTIAx gain
Similar to the example described in the High Speed TIA Gain resistors, LPRTIAx.
Resistor Calibration section, adjust the gain resistor to convert
Several example projects in the ADuCM355 SDK implement a
the current from the SE0 input pin and the SE1 input pin to a
function to calibrate the gain resistor. For further details on
differential voltage across the RTIA resistors.
how to use this function, visit
These resistors have an initial accuracy range and vary with https://wiki.analog.com/resources/eval/user-guides/eval-
temperature, as specified in the ADuCM355 data sheet. ad5940/calibration_routines/lptia_cal?doc=EVAL-
When these resistors are uncalibrated, an error is present when ADuCM355QSPZ-UG-1308.PDF.
measuring an absolute input current.
To generate a precision calibration current, use the low power
DAC to create a differential voltage across an external precision
VBIAS0 VZERO0 VREF2V5 AIN4/LPF0

RE0 SW12 SW13 ULPBUF

SW15

CE0
PA LPDAC0
SW2
SW3
CAP_POT0 ULPREF
SW8 TO
SW14 CHANNEL 1
SW10

RE0 10kΩ 10kΩ SW6

SW4
SW11 RLPF
RLOAD LPTIA ULPTIACON0
SE0 [15:13]

LPTIACON0 SW7 SW9 LPTIA0_P_LPF0

[12:10]
ADC
MUX
PROGRAMMABLE
SW1 GAIN RESISTOR
RTIA

LPTIACON0
[9:5] FORCE/SENSE
RC0_0
SW0

SW5
RC0_1
16887-027

Figure 36. LPTIA0 Gain Calibration Resistor

Rev. A | Page 20 of 24
EVAL-ADuCM355QSPZ Evaluation Board UG-1308
VBIAS0 VZERO0

SW12 SW13

VZERO0
LPDAC0

TR1 HSTIA VBIAS0

RCAL1

T9
VZERO0
EXTERNAL
RCAL NR1
VBIAS0 N_NODE
P_NODE
PR0 N_NODE
P_NODE
RCAL0
ADC
CALIBRATION INPUT PGA ADC
DR0 CURRENT MUX
SE0
LPTIA0_P
D7 LPTIA0_N

SW5
LPTIA0

RLOAD

LPTIA0_P
LPRTIA0

16887-129
LPTIA0_N

Figure 37. High Speed TIA, Low Power TIA0, and Switch Matrix Settings for LPRTIA0 Resistor Calibration
VBIAS1 VZERO1

SW12 SW13

VZERO1
LPDAC1

TR1 HSTIA VBIAS1

RCAL1

T9
VZERO1
EXTERNAL
RCAL NR1
VBIAS1 N_NODE
P_NODE
PR0 N_NODE
P_NODE
RCAL0
ADC
CALIBRATION INPUT PGA ADC
DR0 CURRENT MUX
SE1
LPTIA1_P
D8 LPTIA1_N

SW5
LPTIA1

RLOAD

LPTIA1_P
16887-130

LPRTIA1

LPTIA1_N

Figure 38. High Speed TIA, Low Power TIA0, and Switch Matrix Settings for LPRTIA1 Resistor Calibration

Rev. A | Page 21 of 24
UG-1308 EVAL-ADuCM355QSPZ Evaluation Board

MASS ERASING A DEVICE NOT RESPONDING TO SWD COMMANDS

The SWD debug tools can only communicate with the To mass erase the user flash, take the following steps:
microcontroller when the device is in active mode. 1. Hold the S3 button down to place the device in boot mode.
Similarly, watchdog or software resets that occur when a debug 2. While holding the S3 button down, press and release the
session starts cause the debug session to end with errors. reset button (S1) to lock the device in a loop in the kernel
To recover a device that is locked in this way, mass erase the space so that the device does not execute user code.
user flash. 3. In the IAR Embedded Workbench, navigate to Project >
Download > Erase memory (see Figure 39).
4. The window shown in Figure 40 opens. Click OK.

16887-031

Figure 39. IAR Embedded Workbench Erase Flash Memory Option

16887-032

Figure 40. Erase All Flash Memory

Rev. A | Page 22 of 24
EVAL-ADuCM355QSPZ Evaluation Board UG-1308

ORDERING INFORMATION
To view the complete EVAL-ADuCM355QSPZ schematic, visit https://www.analog.com/media/en/technical-documentation/evaluation-
documentation/EVAL-ADuCM355-RevBSchematic.pdf.
To view the PCB layout, visit https://www.analog.com/media/en/technical-documentation/evaluation-documentation/EVAL-
ADuCM355-EvalBrd_Layout.pdf.
BILL OF MATERIALS
Table 2.
Name Value Part Description Manufacturer Part No.
AVDD, DVDD 25.195.0253.0 Connector PCB terminal block 3.5 mm Wieland Electric 25.195.0253.0
GMBH
C1, C2, C14, 0.1 μF Ceramic capacitor, X7R Wurth Elektronik 8.85012E+11
C34, C35, C36
C9 to C12, C17 0.1 μF Ceramic capacitor, X5R, ultrabroadband American Technical 545L104KT10C
to C21, C28, Ceramics
C29
C13 220 pF Ceramic capacitor, X7R Kemet C0402C221J5RACTU
C23, C25 to 0.47 μF Ceramic capacitor, X5R, 0402 Taiyo Yuden LMK105BJ474KV-F
C27, C30, C31
C24 4.7 μF Ceramic capacitor, X6S, general-purpose Murata GRM185C81A475KE11D
C32, C33 7 pF Ceramic capacitor NP0 (C0G), high frequency, high-Q Murata GJM1555C1H7R0CB01D
C37 to C41, 0.1 μF Ceramic chip capacitor, X8R TDK C1608X8R1E104K080AA
C47, C49, C53
to C55
C42, C46, C48, 10 μF Tanceram® chip capacitor, X5R, low equivalent series Johanson 250R18X106KV4E
C52, C57 resistance (ESR) Dielectrics
C43 to C45 1 μF Ceramic capacitor, Y5V Yageo CC0603ZRY5V6BB105
CH0, CH1 CO-A4 4-lead electrochemical sensor socket Alphasense CO-A4
C_LPF0, C_LPF1 4.7 μF Ceramic capacitor, 0805, X5R Taiyo Yuden EMK212BJ475KG-T
DS1 SML-310MTT86 LED, green surface mount ROHM SML-310MTT86
DS2 LNJ926W8CRA LED, blue surface mount Panasonic LNJ926W8CRA
E1, E2 80 Ω at 100 MHz Ferrite bead, 0.1 Ω maximum dc resistance, 1 A Murata BLM41PF800SN1L
Manufacturing
E3, E4 60 Ω at 100 MHz Inductor chip ferrite, 0.02 Ω dc resistance, 3.5 A Murata BLM21PG600SN1D
JP4, JP5, JP7 to 0 Resistance jumper Panasonic ERJ-6GEY0R00V
JP20
JP25 to JP36, M20-9990245 Connector PCB, straight male jumper, 2-position, Harwin M20-9990245
JP38 to JP46 M020779
JP6 0 Use existing E004447 Panasonic ERJ-3GSYJ0.0
P1 TSW-110-08-G-S Connector PCB, straight header 10-position Samtec TSW-110-08-G-S
P14, P26 TSW-101-07-G-D Connector PCB, dual straight header, 2-position Samtec TSW-101-07-G-D
P2 TSW-120-07-S-S Connector PCB, 20-position, unshrouded male Samtec TSW-120-07-S-S
header, 0.64 mm square post, 2.5 4 mm pitch, 5.84
mm post height, 2.54 mm solder tail
P27 TSW-104-25-F-D- Connector PCB header, 2.54 mm square post, dual Samtec TSW-104-25-F-D-RA
RA row, right angle
P3 2520-6002-UB Connector PCB header, straight male, 20-position 3M 2520-6002UB
P4 47346-0001 Connector PCB microUSB receptacle Molex 47346-0001
P5 IPS1-109-01-L-D Connector PCB, 18-position, female header, Samtec IPS1-109-01-L-D
shrouded dual row, straight, 2.54 mm solder tail, 2.54
mm pitch
Q1, Q2 MMBFJ177 Precision channel junction field effect transistor Fairchild MMBFJ177
(JFET) switch Semiconductor
R1, R2 150 kΩ Precision thick film chip resistor, R0603 Panasonic ERJ-3EKF1503V
R10, R17 560 Ω Thick film chip resistor Multicomp (SPC) MC0063W06031560R
R14 0Ω Thick film chip resistor Multicomp (SPC) MC00625W040210R
Rev. A | Page 23 of 24
UG-1308 EVAL-ADuCM355QSPZ Evaluation Board
Name Value Part Description Manufacturer Part No.
R15, R16 100 kΩ General-purpose chip resistor Yageo RC0603JR-07100KL
R3, R4 100 kΩ Precision thick film chip resistor Panasonic ERJ-6ENF1003V
R5, R6, R7 1 kΩ Precision thick film chip resistor Panasonic ERJ-6ENF1001V
R8, R9 2.2 Ω Thick film chip resistor Vishay CRCW08052R20FKEAHP
RCAL 200 Ω Precision, ultrathin film chip resistor Susumu Co, LTD RG1608N-201-W-T1
S1, S2, S3 B3S-1000 Surface-mount mechanical key switch OMRON B3S1000
TP3, TP4 31022-00-21-00- Connector PCB pin receptacle Mill-Max 3102-2-00-21-00-00-08-0
00-08-0
U1 ADUCM355BCCZ IC precision, analog and electrochemical sensor Analog Devices, Inc. ADuCM355BCCZ
microcontroller
U2 FT232RQ IC USB serial UART FTDI Chip FT232RQ
U3 ADP7158ACPZ-3.3- IC, 2 A, ultralow noise, high power supply rejection Analog Devices ADP7158ACPZ-3.3-R7
R7 ratio (PSRR), RF linear regulator, 3.3 V VOUT
U4 ADT7420UCPZ-RL7 IC, 16-bit, digital I2C temperature sensor Analog Devices ADT7420UCPZ-RL7
Y1 32 MHz IC, crystal, ultramini size, low profile, 8 pF Epson Toyocom FA-128, 32MHZ, 10PPM,
8PF

I2C refers to a communications protocol originally developed by Philips Semiconductors (now NXP Semiconductors).

ESD Caution
ESD (electrostatic discharge) sensitive device. Charged devices and circuit boards can discharge without detection. Although this product features patented or proprietary protection
circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality.

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By using the evaluation board discussed herein (together with any tools, components documentation or support materials, the “Evaluation Board”), you are agreeing to be bound by the terms and conditions set
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non-exclusive, non-sublicensable, non-transferable license to use the Evaluation Board FOR EVALUATION PURPOSES ONLY. Customer understands and agrees that the Evaluation Board is provided for the sole
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registered trademarks are the property of their respective owners.
UG16887-4/21(A)

Rev. A | Page 24 of 24