Integrated Analog/Digital Bicmos Process
Integrated Analog/Digital Bicmos Process
BICMOS=BIPOLAR+CMOS Bipolar oriented processes uses thicker epitaxial layer and deep p+-isolation suffer from poor package density n-well CMOS contains npn collector region is self isolating with the p-epitaxial acting as a isolation region
N-well CMOS process are commonly used in Analog and Digital applications
When integrating the necessary bipolar process step in to the existing CMOS process care must be taken without disturb the original CMOS parameters
(1) Types of n+-buried layer needed (2) Requirement on p-epitaxial layer thickness to support the bipolar operating voltage (3) Where to add the deep n+ collector diffusion. (4) source/drain regions as emitter and base region
The n+-buried layer process is typically the first module in the BICMOS process. The heat cycle associated with this operation does not affect any existing CMOS devices The resistivity and thickness of the epitaxial layer affect both bipolar and CMOS device characteristics Maximum epitaxial layer thickness for the given n-well depth is as shown in figure
The operating voltage for the npn bipolar transistor is limited by BVCEO BVCEO = BVCBO(plane)/[hFE] BVCBO is the collector-base breakdown voltage and the parameter n has typical value
of 3 to 6
The process starts with p-type substrate Oxidation the n+-buried layer are defined Implantation and diffusion n+-buried layer are formed Surface oxide is stripped Wafer surface is treated Hydrochloric acid(HCL)etch to remove any defect
The base region of the npn transistor is formed by implantation using boron as a dopant Nitride film is deposited over the pad oxide Phosphorus channel stop implant -increases threshold voltage of parasitic thick field oxide of PMOS device Boron channel stop implant -increases threshold voltage of parasitic thick field oxide of NMOS device