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Types of Noise

The document discusses two main types of noise that affect analog circuits: device electronic noise and environmental noise. Device electronic noise includes thermal noise and flicker noise. Thermal noise is caused by random electron motion in conductors and is modeled as a voltage or current source in series/parallel with the conductor. Its power spectral density is proportional to temperature and resistance. Flicker noise is caused by traps and defects at oxide-silicon interfaces and its power decreases with increasing frequency. Thermal noise is used to quantify the significance of flicker noise through the calculation of a corner frequency. Noise analysis involves constructing statistical noise models to predict average noise power and power spectral density.

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Sajith Chandran Reo
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86 views

Types of Noise

The document discusses two main types of noise that affect analog circuits: device electronic noise and environmental noise. Device electronic noise includes thermal noise and flicker noise. Thermal noise is caused by random electron motion in conductors and is modeled as a voltage or current source in series/parallel with the conductor. Its power spectral density is proportional to temperature and resistance. Flicker noise is caused by traps and defects at oxide-silicon interfaces and its power decreases with increasing frequency. Thermal noise is used to quantify the significance of flicker noise through the calculation of a corner frequency. Noise analysis involves constructing statistical noise models to predict average noise power and power spectral density.

Uploaded by

Sajith Chandran Reo
Copyright
© © All Rights Reserved
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
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Types of Noise

Noise
• Noise limits the minimum signal level that a circuit can process with acceptable
quality
• Noise is a random process and its value cannot be predicted
• Noise analysis is accomplished by observing for a long time and and constructing
a statistical model
• Average power of noise is predictable using the model
• Power spectral density of a noise is defined as average power carried by x(t) in
one Hertz bandwidth around f
Types of Noise
• Analog signals processed by integrated circuits are corrupted by two types of
noise
1. Device electronic noise
2. Environmental noise
• Environmental noise are random disturbances that a circuit experiences through
supply or ground lines
• Device electronic noise is again classified into two
1. Thermal Noise
2. Flicker Noise
Thermal Noise
Resistor Thermal Noise
• Random motion of electrons in a conductor introduces fluctuations in the voltage
even if average current is zero
• Modeled by series with voltage source or parallel with current source
Analysis of Thermal Noise
• One-sided power spectral density is
Sv(f)=4kTR,f>=0
• Where k=1.38× 10−23 J/K is the Boltzman constant
• T is the temperature in kelvin and R is the Resistance
• Noise voltage is
𝑉𝑛2 =4kTR
• The equation suggests thermal noise is white
• Polarity of voltage source is unimportant
• Low temperature operation decrease noise in analog circuits
MOSFET Thermal Noise
• Noise generated in the channel is significant
• For long channel MOS in saturation ,channel noise can be modeled current
source between D and S

𝐼ഥ𝑛2 =4kT𝛾𝑔𝑚

• 𝛾 is derived to be 2/3 for long channel transistors and large value for submicron
devices
• Theoretical estimation of 𝛾 is still under research
• The ohmic sections of MOS also contribute thermal noise
• For a wide transistor gate distributed resistance is more significant
• 𝑅1 -distributed gate resistance
• 𝑅1 = 𝑅𝐺 /3
Controlling Thermal noise
• Noise current of a MOS decreases if the transconductance drops
𝑉 2 = 𝐼ഥ2 𝑅2
𝑛 𝑛
2
= 4kT( 𝑔𝑚 ) 𝑅2
3
• Effect of 𝑅𝐺 can be reduced by proper layout
Flicker Noise
• At the gate oxide-silicon interface many dangling bonds appear, giving rise to
extra energy states
• As carriers move through the interface some are randomly trapped and later
released by the energy states

• Average power of flicker noise cannot predict easily


• Depends on cleanness of interface and CMOS technology
Analysis of Flicker Noise
• Modeled as a voltage source series with gate and roughly given by
2 𝐾
𝑉𝑛 =
𝐶𝑜𝑥 𝑤𝐿𝑓
• K-Process dependent on the order of 10−25 𝑉 2 F
• Spectral density is inversely proportional to frequency

• Also believed that PMOS exhibit less noise than NMOS


Corner Frequency
• In order to quantify the significance of flicker noise with thermal noise ,plot both
densities on same axes
• The intersection point serves as measure of what part of band is corrupted by
flicker noise, called as corner frequency

2 𝐾 𝐾 3
• 4kT( 𝑔𝑚 ) 𝑅2 = → 𝑓c= 𝑔𝑚
3 𝐶𝑜𝑥 𝑤𝐿𝑓𝑐 𝐶𝑜𝑥 𝑤𝐿 8𝑘𝑇
THANKS

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