Atomic Force Microscopy
Atomic force microscopy (AFM) is a very-high-
resolution type of scanning probe microscopy(SPM),
with high resolution on the order of fractions of
a nanometer, more than 1000 times better than
the optical microscopy.
The information is gathered by "feeling" or "touching"
the surface with a mechanical probe.
Background and History
1981 – Swiss scientists Gerd Binnig
and Heinrich Rohrer- Atomic
resolution microscopy,
simple
1986 – Nobel prize
General Applications
1 2 3
Materials Used to study AFM can image
Investigated: Thin phenomena of: surface of
and thick film Abrasion,
coatings, material in
corrosion, Nano
ceramics,
etching (scratch), resolution and
composites,
glasses, synthetic friction, also measure
and biological lubricating, force at the
membranes, plating, and nano- scale.
metals, polymers, polishing.
and
semiconductors.
Further Applications
Parts of AFM
1. Laser (Illumination)– deflected
off cantilever
2. Mirror –reflects laser beam to
photo detector
3. Photo detector –dual element
photodiode that measures
differences in light intensity and
converts to voltage
4. Amplifier- amplifies the signal
5. Recorder
6. Sample
7. Probe –tip that scans sample
made of Si
8.Cantilever –moves as scanned
over sample and deflects laser beam
Principle
The AFM consists of a cantilever with a sharp tip (probe) at its end that is
used to scan the specimen surface.
The cantilever is typically silicon or silicon nitride with a tip radius of
curvature on the order of nanometers.
When the tip is brought into proximity of a sample surface, laser beam
activates the forces between the tip and the sample lead to a deflection of
the cantilever.
Depending on the situation, forces that are measured in AFM include
mechanical contact force, van der Waals forces, capillary forces, chemical
bonding, electrostatic forces.
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How Does AFM Work?
Scanners
AFM scanners are made
from piezoelectric material, which expands and
contracts proportionally to an applied voltage.
Peizo electric material- Barium titanate,
Zirconium titanate
Whether they elongate or contract depends upon
the voltage applied.
Traditionally the tip or sample is mounted on a
'tripod' of three piezo crystals, with each
responsible for scanning in
the x,y and z directions.
Because of differences in material or size, the
sensitivity varies from scanner to scanner.
Experimental Procedures
Sample preparation
Thin layer of wax on steel disk Measuring
3-D Imaging
Manipulating/Analyzing
Diagram
Measuring
-3 D
Imaging
Analysing
Scanning the Sample/measure
Tip brought within
nanometers of the sample
(Van der Waals)
Radius of tip limits the
accuracy of analysis/
resolution
Stiffer cantilevers protect
against sample damage
because they deflect less in
response to a small force
Data Analysis
Morphology Characterization/
Sub microscopic level
Surface roughness Will be
quantification analyzed
Physical properties/
Swelling, cohesiveness,
smoothness
AFMTips
FIB- Focused ion beam
THREE Modes: Contact mode,
Non-contact, mode, Tapping Mode
A.Contact Mode; hard, stable samples in air or liquid
B. Non-Contact Mode: non- invasive sampling.
C. Tapping (Intermittent contact): No shear and damaging samples
A. Contact Mode
Measures repulsion between tip and sample
Force of tip against sample remains constant
Problems: excessive tracking forces
applied by probe to sample- sample will
destroy.
B. Non-Contact Mode
Measures attractive forces between tip and sample
Tip doesn’t touch sample
Van der Waals forces between tip and sample detected
Problems: Can’t use with samples in fluid
Used to analyze semiconductors
Doesn’t degrade or interfere with sample- better for
soft samples
C. Tapping (Intermittent- Contact) Mode
Tip vertically oscillates between contacting
sample surface and lifting of at frequency of
50,000 to 500,000 cycles/sec.
Oscillation amplitude reduced as probe contacts
surface due to loss of energy caused by tip
contacting surface
Advantages: overcomes problems associated with
friction, adhesion, electrostatic forces
More effective for larger scan sizes
Advantages and Disadvanteges
of AFM
In general
The future of AFM
Sharper tips by improved micro-fabrication
processes: (tip – sample interaction tends to
distort or destroy soft biological molecules )
development of more flexible cantilever
springs and less damaging and non-sticky
probes needed
Nano-Identification on Fiber surface
Cotton
Viscos
e
Rayon
MMF
