VLSI Unit-5
VLSI Unit-5
• p-substrate
• n-well
• n+
• p+
• Gate oxide (thin oxide)
• Gate (polycilicon)
• Field Oxide – Insulated glass – Provide
electrical isolation
Stick Diagrams
• VLSI design aims to translate circuit concepts onto
silicon.
• Stick diagrams are a means of capturing topography
and layer information using simple diagrams.
• Stick diagrams convey layer information through
colour codes (or monochrome encoding).
• Acts as an interface between symbolic circuit and
the actual layout.
• Does show all components/vias.
• It shows relative placement of components.
• Goes one step closer to the layout
• Helps plan the layout and routing
Stick Diagrams
• Does not show
– Exact placement of components
– Transistor sizes
– Wire lengths, wire widths, tub boundaries.
– Any other low level details such as
parasitics.
Stick Diagrams – Some rules
• Rule 1
• When two or more ‘sticks’ of the same type cross or
touch each other that represents electrical contact.
• Rule 2.
• When two or more ‘sticks’ of different type cross or
touch each other there is no electrical contact. (If
electrical contact is needed we have to show the
connection explicitly).
• Rule 3.
• When a poly crosses diffusion it represents a
transistor.
buried contacts and have been included here and in the figures for the sake of
completeness.
▪ When deposition of the metal layer takes place the metal is deposited through the
contact cut areas onto the underlying area so that contact is made between the
layers.
▪ When connecting diffusion to polysilicon using the butting contact approach (see
Figure), the process is rather more complex.
▪ In effect, a 2A. x 2A. contact cut is made down to each of the layers to be joined. The
layers are butted together in such a way that these two contact cuts become
contiguous.
▪ Since the polysilicon and diffusion outlines overlap and thin oxide under polysilicon
acts as a mask in the diffusion process, the polysilicon and diffusion layers are also
butted together. The contact between the two butting layers is then made by a metal
Contacts (NMOS & CMOS)
CMOS INVERTER LAYOUT:
CMOS - INVERTER
Scaling of MOS Circuits
Microelectronic technology may be characterized in terms of several
indicators, or figures of merit. Commonly, the following are used:
• Minimum feature size
• Number of gates on one chip
• Power dissipation
• Maximum operational · frequency
• Die size
• Production cost.
Accordingly, over the past decade, much effort has been directed
toward the upgrading of process technology and the resultant scaling
down of devices and feature size.
SCALING MODELS AND SCALING FACTORS:
The most commonly used models are the constant electric field scaling model and the
constant voltage scaling model. They both present a simplified view, taking only first
degree effects into consideration, but are easily understood. Recently, a combined
voltage and dimension scaling model has been presented.
The below Figure, which indicates the device dimensions and substrate doping level
which are associated with the scaling of a transistor.
Summary of Scaling Effects: