STATISTICAL QUALITY

CONTROL AND TQM

Theory of Control Charts Sample

size and frequency of sampling
STATISTICAL PROCESS CONTROL
(SPC)

 Statistical Process Control (SPC) is a

methodology used in quality management and
industrial processes to monitor and control the
variability of a process.

 It involves using statistical tools and

techniques to ensure that a process remains
stable and within specified limits.

 The primary goal of SPC is to identify

variations and potential defects in the process,
allowing for corrective actions to be taken
before significant issues arise.
CONTROL CHARTS

 Control charts are statistical tools used in

quality control to monitor and maintain the
stability of processes over time.

 They help identify variations in the process,

detect any shifts or trends, and assist in
making data-driven decisions for process
improvement.

 The theory of control charts includes

considerations for sample size and frequency
of sampling.
TYPES OF CONTROL CHARTS

Variable Control Charts:

 Variable control charts are used when the data

being collected is in the form of numerical
measurements or continuous data.

 These measurements are taken on a

continuous scale, such as length, weight, time,
temperature, or any other measurable
quantity.

 X Chart & R chart

Attribute Control Charts:

 Attribute control charts, on the other hand,

are used when data is collected in the form
of discrete categories or attributes.

 These attributes represent the presence or

absence of specific characteristics, defects,
or events. Examples of attributes include
pass/fail, yes/no, defective/non-defective, or
the number of defects in a sample.
SAMPLE SIZE

 The sample size refers to the number of data

points collected during each sampling
interval.

 The appropriate sample size depends on

several factors, including the type of control
chart being used, the nature of the process
being monitored, and the desired level of
sensitivity to detect changes.
 Smaller sample sizes may be used when the
process is costly or time-consuming to
measure, while larger sample sizes may be
preferred for processes with a high degree of
variability.

 The sample size typically represents the

number of items inspected or the number of
defects found in a fixed sample size. The
appropriate sample size can vary based on
the characteristics of the process and the
number of defects expected.
FREQUENCY OF SAMPLING

 The frequency of sampling refers to how

often data points are collected and plotted on
the control chart.

 The choice of sampling frequency depends

on the rate at which the process generates
data and how quickly changes need to be
detected.
 For stable processes: If the process is known to be
stable and not likely to change quickly, less
frequent sampling may be sufficient.

 In some cases, periodic sampling at fixed time

intervals (e.g., every hour or every day) may be
used.

 For processes with higher variability or the need

to detect changes quickly - More frequent
sampling may be necessary to identify any
potential shifts or trends promptly.

 Continuous monitoring, where data is collected in

real-time, might be employed in critical processes.
 It's essential to strike a balance between the
frequency of sampling and the cost and effort
involved in data collection and analysis.

 Overly frequent sampling can result in unnecessary

expenses, while infrequent sampling may delay the
detection of process changes.

 Remember that the choice of sample size and

sampling frequency should be determined based on
the specific requirements and characteristics of the
process being monitored.

 Control charts are powerful tools when applied

appropriately, but their effectiveness depends on
proper design and implementation.
X - CHART
 Designing an X-bar chart involves several
steps to effectively monitor the average
(mean) of a process over time.

 X-bar charts are a type of variable control

chart used when the data being collected is
in the form of numerical measurements or
continuous data.
 Data Collection
 Determine Sample Size

 Calculate Sub Group Mean X

 Calculate Overall Mean

 Calculate Range R

 Find Control Limit

 Plot X bar chart

PROCESS CAPABILITY STUDIES
 Process Capability Studies are essential tools in
quality management and statistical process
control to assess how well a process can meet the
required specifications or customer expectations.

 The purpose of such studies is to determine the

process's ability to produce output within the
specified tolerance limits and whether it is
capable of consistently meeting those
requirements.

 It helps organizations identify and improve

process weaknesses, reduce defects, and
enhance overall quality.
KEY STEPS INVOLVED IN
CONDUCTING A PROCESS CAPABILITY
STUDY:

Define the Process and Specifications:

 Clearly define the process being studied and

establish the target or nominal value for the
product or service output.

 Determine the upper specification limit (USL)

and lower specification limit (LSL) based on
customer requirements or internal quality
standards.
Data Collection:

 Collect a representative sample of data from

the process.

 The sample size should be large enough to

provide statistically meaningful results.

 The data should be collected over a sufficient

period to capture variations in the process.
CALCULATE PROCESS CAPABILITY
INDICES:
 Cp (Process Capability Index): Cp indicates how well the
process spread fits within the specification limits. It is
calculated as the ratio of the specification width to the
process variation.
Cp = Upper Spec Limit – Lower Spec Limit
6sigma
A Cp value greater than 1 indicates that the
process spread fits within the specifications.

 Cpk (Process Capability Index with respect to the process

center): Cpk measures how well the process is centered
within the specification limits. It considers both the
process variation and the deviation from the target. A
Cpk value greater than 1 indicates that the
process is centered and capable of meeting
specifications. ( Min of Cpu , Cpl )
Cpu = USL – X / 3sigma , Cpl = X – LSL / 3 sigma)
CASE : - IMPROVING WIDGET MANUFACTURING PROCESS
USING X̄ AND R CHARTS

Introduction:

 A manufacturing company, XYZ Widgets Inc., produces

widgets used in various industries.
 The company is committed to ensuring high-quality products
for its customers.
 To maintain product consistency and minimize defects, XYZ
Widgets Inc. decides to implement Statistical Process Control
(SPC) using X̄ and R charts.
 The objective is to monitor the manufacturing process
regularly, detect any process variations, and take corrective
actions to improve product quality.
 Data Collection
 Analysis

 Conclusion
Thank You