X-ray fluorescence (XRF) spectrometry is an elemental analysis technique widely used in science and industry for quick and simultaneous determination of elemental composition and film thickness across solid, liquid, and thin-film samples. It operates on the principle of individual atoms emitting characteristic X-ray photons when excited by external energy, allowing identification and quantification of elements through the detection of these photons. While XRF is non-destructive, precise, and convenient, it does have limitations including relatively high limits of detection compared to other methods.