• Need to look for High-k dielectrics
– Larger thickness while maintaining the same
capacitance per unit area
Dielectric εr Eg (eV)
Si3N4 7 5.3
Ta2O5 22 4.4
HfO2 25 5.8
ZrO2 25 5.8
TiO2 80 3.5
SrTiO3 2000 3.2
SiO2 3.9 9
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• NA - Substrate Doping (1016-1018 cm–3)
• Gate - typically poly-Si (earlier Al was used)
– Very poor conductor
– Alloyed with W, Ti, Co, Ni, Ta, TaN, TiN to
increase conductivity - called silicides (very high
melting point)
– Also used for source/drain contacts (called self-
aligned silicide - salicide)
• Source/Drain very heavily doped to reduce
their ρ (high σ)
– Thus, produce less RS & RD
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• Field Effect (Voltage Controlled Device)
• Unipolar, i.e., a single type of carrier (holes
or electrons) contribute to current transport
• Bi-directional device: source and drain
terminals determined by their bias state
• Three modes of operation:
– Accumulation (Capacitor)
– Depletion
– Inversion: Weak, Moderate, and Strong
(Analog Application – Amplifier)
(Digital Application – Switch)
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TECHNOLOGY
• CMOS Processes
– LOCOS (Local Oxidation of Silicon)
– STI (Shallow Trench Isolation)
– SOI (Silicon-on-Insulator)
• Variants
– n-well
– p-well
– Twin-tub
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LOCOS CMOS Process
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STI CMOS Process
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SOI CMOS Process
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FINFET
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VARIOUS PROCESS TECHNOLOGIES
GAA: GATE ALL AROUND
MBC: MULTI BRIDGE CHANNEL (SAMSUNG)
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THE TWO-TERMINAL
MOS STRUCTURE
(2T-MOS or MOSCAP)
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• Introduction:
– Three-layer device:
• Substrate (S): Typically Si (Semiconductor)
• Oxide (O): Typically SiO2, of late Si3N4, HfO2,
Ta2O5 (High-k Dielectrics)
• Metal (M): Typically Al, can also be heavily doped
poly-Si (termed as poly), Cu, Ta, Ti, W, etc.
– Two-terminal device:
• Gate (G) and Body (B)
– Three-dimensional device:
• Lateral (x), Vertical (y), and Depth or Width (z)
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G
Metal (Gate)
z
Oxide (Insulator)
x
Semiconductor
(p-type)
y
Back Ohmic Contact
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