International
Standard
ISO 11452-3
Road vehicles — Component test Fourth edition
methods for electrical disturbances 2024-05
from narrowband radiated
electromagnetic energy —
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Part 3:
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Transverse electromagnetic
(TEM) cell Document Preview
Véhicules routiers — Méthodes d'essai d'un équipement soumis
ISO 11452-3:2024
à des perturbations électriques par rayonnement d'énergie
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électromagnétique en bande étroite —
Partie 3: Cellule électromagnétique transverse (TEM)
Reference number
ISO 11452-3:2024(en) © ISO 2024
ISO 11452-3:2024(en)
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ISO 11452-3:2024
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COPYRIGHT PROTECTED DOCUMENT
© ISO 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
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Published in Switzerland
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ISO 11452-3:2024(en)
Contents Page
Foreword..................................................................................................................................................................................................................................................... iv
Introduction.............................................................................................................................................................................................................................................. v
1 Scope.............................................................................................................................................................................................................................................. 1
2 Normative references.................................................................................................................................................................................................. 1
3 Terms and definitions................................................................................................................................................................................................. 1
4 Test conditions.................................................................................................................................................................................................................... 1
5 Test apparatus..................................................................................................................................................................................................................... 2
5.1 TEM cell...................................................................................................................................................................................................................... 2
5.2 Instrumentation.................................................................................................................................................................................................. 3
5.3 Test set-up................................................................................................................................................................................................................. 4
5.3.1 General......................................................................................................................................................................................................4
5.3.2 Exposure of device under test and wiring harness (for major field coupling to
the harness).......................................................................................................................................................................................... 4
5.3.3 Exposure of device under test alone (for major field coupling to that device).........................5
6 Test procedure.................................................................................................................................................................................................................... 6
6.1 Test plan..................................................................................................................................................................................................................... 6
6.2 Test method............................................................................................................................................................................................................. 7
6.2.1 General......................................................................................................................................................................................................7
6.2.2 Test level setting...............................................................................................................................................................................7
6.2.3 DUT test....................................................................................................................................................................................................8
6.3 iTeh Standards
Test report................................................................................................................................................................................................................8
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Annex A (informative) TEM cell dimensions
Annex B (informative) Calculations and measurements of TEM-cell frequency range
.......................................................................................................................................................... 9
......................................... 11
Document
Annex C (informative) Installation Preview
of external components and low pass filter design ...................................... 13
Annex D (informative) Test setup without low pass filters................................................................................................................. 16
Annex E (informative) Function performance ISO 11452-3:2024status classification (FPSC) and test severity
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levels........................................................................................................................................................................................................................................... 20
Bibliography.......................................................................................................................................................................................................................................... 21
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ISO 11452-3:2024(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see [Link]/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
[Link]/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
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Organization (WTO) principles in the Technical Barriers to Trade (TBT), see [Link]/iso/[Link].
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This document was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 32,
Electrical and electronic components and general system aspects.
Document
This fourth edition cancels and replaces
revision. The changes are as follows:
the third edition Preview
(ISO 11452-3:2016), of which it constitutes a minor
— Formula (1) in 6.2.2 was modified. ISO 11452-3:2024
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A list of all parts in the ISO 11452 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at [Link]/[Link].
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ISO 11452-3:2024(en)
Introduction
Immunity measurements of complete road vehicles are generally able to be carried out only by the vehicle
manufacturer, owing to, for example, high costs of absorber-lined shielded enclosures, the desire to preserve
the secrecy of prototypes or a large number of different vehicle models.
For research, development and quality control, a laboratory measuring method can be used by both vehicle
manufacturers and equipment suppliers to test electronic components.
The TEM cell method has the major advantage of not radiating energy into the surrounding environment.
The method can be used for testing either the immunity of a component with the field coupling to the wiring
harness or the immunity of the component alone with minimum exposure to the wiring harness.
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ISO 11452-3:2024
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International Standard ISO 11452-3:2024(en)
Road vehicles — Component test methods for electrical
disturbances from narrowband radiated electromagnetic
energy —
Part 3:
Transverse electromagnetic (TEM) cell
1 Scope
This document specifies transverse electromagnetic (TEM) cell tests for determining the immunity
of electronic components of passenger cars and commercial vehicles to electrical disturbances from
narrowband radiated electromagnetic energy, regardless of the vehicle propulsion system (e.g. spark-
ignition engine, diesel engine, electric motor).
The electromagnetic disturbances considered are limited to continuous narrowband electromagnetic fields.
2 Normative references
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The following documents are referred to in the text in such a way that some or all of their content constitutes
([Link]
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
Document
ISO 11452-1, Road vehicles — Component test methods forPreview
electrical disturbances from narrowband radiated
electromagnetic energy — Part 1: General principles and terminology
ISO 11452-3:2024
3 Terms and definitions
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For the purposes of this document, the terms and definitions given in ISO 11452-1 apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at [Link] ww.iso.org/obp
— IEC Electropedia: available at [Link] ww.electropedia.org/
4 Test conditions
The upper frequency range limit of the TEM cell is a direct function of the TEM cell dimensions.
For testing automotive electronic systems, a 0,01 MHz to 200 MHz TEM cell should be used. See Annex A for
suggested cell dimensions. See Annex B for methods to determine TEM-cell frequency range.
The user shall specify the test severity level or levels over the frequency range. See Annex E for suggested
test severity levels.
Standard test conditions shall be those given in ISO 11452-1 for:
— test temperature;
— supply voltage;
© ISO 2024 – All rights reserved
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ISO 11452-3:2024(en)
— modulation;
— dwell time;
— frequency step sizes;
— definition of test severity levels;
— test-signal quality.
5 Test apparatus
5.1 TEM cell
The TEM cell used for this test is a rectangular coaxial line with a 50 Ω characteristic impedance (see
Figure 1). The device under test is exposed to a uniform TEM field.
The TEM cell is a laboratory measurement system which can be used to generate test fields within 2 dB of the
theoretical value if the device under test does not occupy an excessive portion of the test volume (see 5.3).
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Key
1 outer conductor (shield)
2 septum (inner conductor)
3 access door
4 connector panel (optional)
5 coaxial connectors
6 dielectric support (relative permittivity εr ≤ 1,4)
7 device under test
8 input/output leads
Figure 1 — TEM cell
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ISO 11452-3:2024(en)
5.2 Instrumentation
Figure 2 shows an example of a TEM cell test set-up. The TEM cell has high resonances in the region greater
than the recommended upper frequency limit.
A low pass filter with an attenuation of at least 60 dB at frequencies above 1,5 times the cut-off frequency
of the TEM cell may be installed (e.g. 200 MHz TEM cell: 60 dB for frequencies above 300 MHz) to avoid
resonances.
Example of installation of low pass filter is given in Annex C.
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Key
1 signal generator 9 low pass filters/connector panel
2 broadband amplifier 10 coupler
3 low pass filter (optional) 11 high power load (50 Ω)
4 dual-directional coupler (30 dB decoupling ratio 12 controller
minimum) 13 TEM cell
5 RF-power meter a Pforward (forward power).
6 peripheral b Preflected (reflected power).
7 device under test c Poutput (output power).
8 dielectric support
Figure 2 — Example TEM cell configuration
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ISO 11452-3:2024(en)
5.3 Test set-up
5.3.1 General
In order to maintain the homogeneous field in the TEM cell and obtain reproducible measurement results, the
device under test shall be no larger than one-sixth of the cell (inside) height b (see Figure 3 and Figure A.1).
The device under test should be placed in the centre of the cell on a dielectric equipment support.
The device under test and the wiring harness may be positioned in either of two arrangements, depending
on whether the exposure of the device under test and the wiring harness (see 5.3.2) or that of the device
alone (see 5.3.3) is being tested.
An alternative test set-up without low pass filter is presented in Annex D.
5.3.2 Exposure of device under test and wiring harness (for major field coupling to the harness)
The height of the dielectric support is one-sixth of cell height b (see Figure 3). In order to obtain reproducible
measurement results, the device under test, together with its wiring harness or printed circuit board, shall
be placed in the same position in the TEM cell for each measurement. In addition to the direct RF-field
coupling to the device under test, the use of an unshielded harness or printed circuit board will result in a
common mode electrical field coupling and a differential mode magnetic field coupling, depending on the
inclination and the width of the harness or circuit board.
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Key
1 device under test
2 dielectric support (relative permittivity εr ≤ 1,4)
3 printed circuit board (no ground plane) or wiring harness, unshielded
4 connector
5 coaxial connectors
6 connector panel
7 TEM cell wall
8 cables
9 septum
b TEM cell height (see Annex A)
Figure 3 — Example test set-up — Major field coupling to wiring harness (side view)
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