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EE 478 Final Exam Study Guide

The EE 478 Fall 2015 Final Exam Study Guide outlines that the exam will contain 30 multiple choice questions covering various topics related to combinational and sequential logic design including MUXes, timing parameters, VHDL constructs, CMOS logic circuits, state machines, arithmetic units, and testing methodologies. Students are advised to review homework, quizzes, lecture notes, and concepts about implementing combinational logic, layers of abstraction in VHDL, uses of VHDL statements, lookup tables, and fault modeling.

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0% found this document useful (0 votes)
196 views1 page

EE 478 Final Exam Study Guide

The EE 478 Fall 2015 Final Exam Study Guide outlines that the exam will contain 30 multiple choice questions covering various topics related to combinational and sequential logic design including MUXes, timing parameters, VHDL constructs, CMOS logic circuits, state machines, arithmetic units, and testing methodologies. Students are advised to review homework, quizzes, lecture notes, and concepts about implementing combinational logic, layers of abstraction in VHDL, uses of VHDL statements, lookup tables, and fault modeling.

Uploaded by

SyedZain1993
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

EE 478 Fall 2015 Final Exam Study Guide

30 Multiple choice questions (Or for makeup exam, problems similar to HW, quiz, etc.)
No coding
Topics include:
o Using MUXes to implement Combinational Logic
o Setup time, hold time and propagation delay, etc.
o Different Layers of abstraction in VHDL
o Uses of Concurrent and Sequential statements in VHDL
o Look Up Table Implementation using ROM
o CMOS Logic Circuits
o VHDL Constructs like, case, when, for, while
o VHDL Operators
o VHDL Delay Models
o Translating State Graph to ASM
o Single-Stuck-At fault modeling in combinational and sequential circuits
o Arithmetic units (Adders, Subtractors, Multipliers and Division Circuits)
o Circuit Test Methodologies like BIST, Boundary Scan Testing, Scan Testing.
o HW, Quizzes, Lecture notes

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